Test scene library generation method and device, equipment and storage medium

A technology for testing scenarios and scenarios, applied in software testing/debugging, error detection/correction, instruments, etc., can solve problems such as the need to improve the accuracy and efficiency of the generated solution, achieve high accuracy, ensure accuracy, and ensure high efficiency Effect

Pending Publication Date: 2021-12-28
JINGDONG KUNPENG (JIANGSU) TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] In the process of realizing the present invention, the inventor found that there are the following technical problems in the prior art: the generation scheme of the existing test scenario library needs to be improved in terms of accuracy and efficiency

Method used

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  • Test scene library generation method and device, equipment and storage medium
  • Test scene library generation method and device, equipment and storage medium
  • Test scene library generation method and device, equipment and storage medium

Examples

Experimental program
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Embodiment 1

[0032] figure 1 It is a flowchart of a method for generating a test scenario library provided in Embodiment 1 of the present invention. This embodiment is applicable to the case of generating a test scenario library, especially applicable to the case of efficiently generating a high-accuracy test scenario library through local calculation. The method can be executed by the test scenario library generation device provided by the embodiment of the present invention, the device can be implemented by software and / or hardware, the device can be integrated on the test scenario library generation device, and the device can be various user terminals or server.

[0033] see figure 1 , the method of the embodiment of the present invention specifically includes the following steps:

[0034] S110. When receiving the generation instruction of the test scenario library, obtain each candidate test scenario, criticality model and preset operating domain constructed in advance for the scena...

Embodiment 2

[0054] image 3 It is a flow chart of a method for generating a test scenario library provided in Embodiment 2 of the present invention. This embodiment is optimized on the basis of the above-mentioned technical solutions. In this embodiment, optionally, the method for generating the test scene library may further include: determining the exposure frequency according to the distance between the scene to be tested in the test scene space and the target natural scene, and according to the enhanced collision time in the scene to be tested Determine the maneuvering challenge; construct a criticality model based on exposure frequency and maneuvering challenge. Wherein, explanations of terms that are the same as or corresponding to the above embodiments are not repeated here.

[0055] see image 3 , the method of this embodiment may specifically include the following steps:

[0056] S210. Determine the exposure frequency according to the distance between the scene to be tested a...

Embodiment 3

[0075] Figure 5 It is a flowchart of a method for generating a test scenario library provided in Embodiment 3 of the present invention. This embodiment is optimized based on the technical solutions in the second embodiment above. In this embodiment, optionally, the target natural scene is a natural driving scene whose occurrence frequency satisfies a preset frequency condition in each natural driving scene, and the method for generating the test scene library may further include: performing stochastic gradient optimization on the criticality model , to obtain the auxiliary model; correspondingly, taking the criticality model as the target may include: taking the auxiliary model as the target. Wherein, explanations of terms that are the same as or corresponding to the above embodiments are not repeated here.

[0076] see Figure 5 , the method of this embodiment may specifically include the following steps:

[0077] S310. Determine the exposure frequency according to the d...

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Abstract

The embodiment of the invention discloses a test scene library generation method and device, equipment and a storage medium. The method comprises the steps: when a generation instruction of a test scene library is received, obtaining candidate test scenes, a criticality model and a preset operation domain which are constructed for a to-be-tested scene corresponding to the generation instruction in advance; taking the criticality model as a target and taking a parameter feasible set corresponding to a preset operation domain as a constraint, and obtaining a key test scene based on an initial test scene obtained by sampling in a test scene space, wherein the test scene space comprising the candidate test scenes; and searching in the test scene space by taking the key test scene as a search starting point and taking a preset search neighborhood of the key test scene in the test scene space as a search range, and generating a test scene library according to a search result. According to the technical scheme provided by the embodiment of the invention, the test scene library with relatively high accuracy can be efficiently generated.

Description

technical field [0001] Embodiments of the present invention relate to the technical field of automatic driving, and in particular to a method, device, device and storage medium for generating a test scene library. Background technique [0002] With the rapid development of computer technology, autonomous driving has received widespread attention. To improve the safety and reliability of autonomous vehicles, intelligent testing of autonomous vehicles is essential. [0003] The test scene library determines the scene of the self-driving vehicle during the test, which in turn affects its accuracy and efficiency during the test. Therefore, how to generate the test scene library is a key issue in intelligent testing. [0004] In the process of realizing the present invention, the inventors found the following technical problems in the prior art: the accuracy and efficiency of the existing test scenario database generation scheme need to be improved. Contents of the invention ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3684
Inventor 徐鑫
Owner JINGDONG KUNPENG (JIANGSU) TECH CO LTD
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