The invention discloses a p-type NiMSnO amorphous oxide semiconductor film, the element M in the NiMSnO has low standard electrode potential and high binding energy with O, an oxide formed by the M and the O is a high-resistance oxide, the forbidden band width of the oxide is larger than 3 eV, and the M is any one of Be, Mg, Ca, Sr, Ba, B, Al, Ga, In, Sc, Y, Si, Ge, Hf, Zr, Mn, Fe, Nb, V, Sc, Rh or Co; in addition, Ni is +2 valence and is a matrix element in the p-type NiMSnO amorphous oxide, and the Ni is combined with the O to form the p-type conduction characteristic of the NiMSnO; the M is combined with the O in a matrix and is served as a control element of hole concentration; and Sn is +2 valence and combined with the O to play a role of a hole transmission channel. The invention furthermore discloses a preparation method of the p-type NiMSnO amorphous oxide semiconductor film. A NiGaSnO ceramic wafer is served as a target material, a pulse laser deposition method is adopted, the hole concentration of the prepared p-type NiMSnO amorphous oxide semiconductor film is 10<12>-10<14>m<3>, and visible light transmittance is larger than or equal to 80%. The film material provided by the invention can be used for a p-type amorphous film transistor.