The invention discloses a rapid super-resolution micro-imaging method which comprises the following steps: modulating a
first light beam and a second
light beam according to corresponding modulation functions; combining the light beams into a path of light by using a
beam splitter prism; radiating to the surface of a sample; collecting
signal light emitted from different scanning points of the sample to be detected; dividing the
signal light into two bundles, wherein the
first light beam and the second
light beam are imaged simultaneously; controlling the fragrance of the
first light beam to be v, by taking the fragrance v as a reference
signal, extracting
signal light intensity I1(x, y) corresponding to the first
light beam from one bundle of the
signal light according to the reference signal, and by taking intensity of the other bundle of the
signal light as I0(x, y), calculating the signal
light intensity I2(x, y)=I0(x, y)-I1(x, y) corresponding to the second light beam, and achieving super-resolution imaging by using final effective signal
light intensity I (x, y), wherein x and y are two-dimensional coordinates of the scanning points. The invention further discloses a rapid super-resolution micro-imaging device. As conventional respective imaging of hollow spots and
solid spots is converted into simultaneous imaging, the scanning speed is accelerated while the transverse resolution is not changed.