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73results about How to "Improve epitaxy quality" patented technology

Multiple quantum well structure and method for manufacturing the same

A multiple quantum well structure includes a plurality of well-barrier sets arranged along a direction. Each of the well-barrier sets includes a barrier layer, at least one intermediate level layer, and a well layer. A bandgap of the barrier layer is greater than an average bandgap of the intermediate level layer, and the average bandgap of the intermediate level layer is greater than a bandgap of the well layer. The barrier layers, the intermediate level layers, and the well layers of the well-barrier sets are stacked by turns. Thicknesses of at least parts of the well layers in the direction gradually decrease along the direction, and thicknesses of at least parts of the intermediate level layers in the direction gradually increase along the direction. A method for manufacturing a multiple quantum well structure is also provided.
Owner:GENESIS PHOTONICS

Porous-DBR-based InGaN-based resonant cavity enhanced detector chip

InactiveCN107046071AImprove epitaxy qualityThe epitaxy process is simple and controllableSemiconductor devicesPhysicsResonant cavity
The invention relates to a porous-DBR-based InGaN-based resonant cavity enhanced detector chip comprising a substrate, a buffer layer formed on the substrate, a bottom porous DBR layer formed on the buffer layer, an n type GaN layer formed on the bottom porous DBR layer, an active region formed on the n type GaN layer, a p type GaN layer formed in the active region, a side wall passivation layer, a transparent conductive layer, an n electrode, a p electrode, and a top dielectric DBR layer. The one side of the n type GaN layer is formed downwardly to form a table board and a protrusion is formed at the other side of the n type GaN layer. The side wall passivation layer is formed at the upper surface of the p type GaN layer and the side walls of the protruding n type GaN layer, the active region, and the p type GaN layer; and a window is formed in the middle of the side wall passivation layer formed at the upper surface of the p type GaN layer. The transparent conductive layer is formed at the upper surfaces of the side wall passivation layer and the p type GaN layer at the window. The n electrode is formed on the table board of the n type GaN layer. The p electrode is manufactured around the upper surface of the side wall passivation layer. And the top dielectric DBR layer is formed on the transparent conductive layer and the p electrode.
Owner:INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI

Polishing method for lithium tantalate substrate

The invention discloses a polishing method for a lithium tantalate substrate. The method includes the steps of 1, grinding a cut tantalate lithium wafer with an abrasive material with the particle size of 5-20 microns, and obtaining a lithium tantalate grinding sheet with the surface of a rough structure; 2, directly conducting chemical corrosion on the lithium tantalate grinding sheet in a sealed container filled with the mixed acid of nitric acid and hydrofluoric acid, wherein the roughness of the tantalate lithium wafer is smaller than 200 nm, and the flatness is smaller than 5 microns; obtaining a lithium tantalate corrosion sheet with the surface of a random disordered pit structure; 3, conducting single-side polishing on the lithium tantalate corrosion sheet with a single-polishing machine and a polishing liquid, wherein the polishing pressure is 0.005-1 MPa, the roughness of the tantalate lithium wafer is smaller than 0.5 nm, and the flatness is smaller than 3 microns; obtaining a lithium tantalite polishing sheet. The polishing method has the advantages of one-time polishing, batch production and high polishing efficiency, and the produced lithium tantalate substrate has high surface flatness which determines that the lithium tantalate substrate is not easily broken in the application of devices; the material utilization is high, and the processing yield is high.
Owner:TDG HLDG CO LTD

Gallium nitride-based light emitting device with roughened surface and fabricating method thereof

InactiveUS20090321780A1Improve epitaxy qualityOperating characteristics of the device will not be affectedSemiconductor/solid-state device manufacturingSemiconductor devicesGallium nitrideRough surface
A gallium nitride-based light emitting device with a roughened surface is described. The light emitting device comprises a substrate, a buffer layer grown on the substrate, an n-type III-nitride semiconductor layer grown on the buffer layer, a III-nitride semiconductor active layer grown on the n-type III-nitride semiconductor layer, a first p-type III-nitride semiconductor layer grown on the III-nitride semiconductor active layer, a heavily doped p-type III semiconductor layer grown on the first p-type III-nitride semiconductor, and a roughened second p-type III-nitride semiconductor layer grown on the heavily doped p-type III semiconductor layer.
Owner:ADVANCED OPTOELECTRONICS TECH

Light-emitting diode device and method for manufacturing the same

InactiveCN102683529ASolve the problem of uneven current distributionAvoid the efficiency dip effectSolid-state devicesSemiconductor devicesActive layerLight-emitting diode
The invention discloses a light-emitting diode device and a method for manufacturing the same. An undoped semiconductor layer and a current blocking structure of the light-emitting diode device are disposed on a substrate in sequence. Light-emitting structures of the light-emitting diode device are separately disposed on the current blocking structure. Each of the light-emitting structures has a first conductivity type semiconductor layer, an active layer and a second conductivity type semiconductor layer arranged on the first conductivity type semiconductor layer in sequence, and a first electrode and a second electrode, respectively located on the other part of the first conductivity type semiconductor layer and the second conductivity type semiconductor layer. The first conductivity type semiconductor layer and the second conductivity type semiconductor layer have different conductivity types. Insulating spacers of the light-emitting diode device are respectively located between the adjacent light-emitting structures. Conductive wires of the light-emitting diode device respectively connect the first electrode of one of the adjacent light-emitting structures and the second electrode of the other light-emitting structure in sequence.
Owner:CHI MEI LIGHTING TECH +1

Ultraviolet light-emitting diode

The present invention relates to an ultraviolet light-emitting diode (LED), which includes a gradual superlattice layer. The gradual superlattice layer comprises a first superlattice layer and a second superlattice layer. The first superlattice layer includes a multi-layer structure having repetitive stacks of a unit formed by a first layer and a second layer. The second superlattice layer includes a multi-layer structure having repetitive stacks of a unit formed by a third layer and a fourth layer. The concentrations of aluminum in the first, second, third, and fourth layers decrease sequentially. By disposing the gradual superlattice layer, the quality of the epitaxial structure may be improved apparently.
Owner:LEXTAR ELECTRONICS CORP

Light-emitting semiconductor device

The present invention provides a light-emitting semiconductor device, which comprises a substrate having a surface formed with a plane and a plurality of protrusions out of the plane. The plane is on a crystalline orientation. The protrusion is provided with an outer surface consisting of a plurality of sidewall surfaces. The sidewall surfaces are substantially not on the crystalline orientation. The protrusion is formed with an outline edge extended from the bottom to the top of the protrusion from a side view. The outline edge comprises at least one turning point. A first conductive type semiconductor layer is above the surface of the substrate, an active layer is above the first conductive type semiconductor layer, and a second conductive type semiconductor layer is above the active layer.
Owner:EPISTAR CORP

Manufacturing method of embedded epitaxial layer

The invention discloses a manufacturing method of an embedded epitaxial layer. The method comprises the steps of 1, forming a U-shaped groove in a silicon substrate by adopting a dry etching process;and 2, filling an embedded epitaxial layer in the groove, wherein the step 2 comprises the sub-steps of 21, carrying out epitaxial growth to form a buffer layer; 22, carrying out epitaxial growth to form a main body layer, and forming particle defects in the growth process of the main body layer; 23, introducing an etching gas into the same epitaxial growth cavity to perform back etching so as toremove particle defects; and 24, carrying out epitaxial growth to form a cap layer. According to the invention, the particle defects generated in the epitaxial growth process of the embedded epitaxiallayer can be eliminated, so that the yield of products can be improved.
Owner:SHANGHAI HUALI INTEGRATED CIRCUTE MFG CO LTD

Light-emitting diode (LED) structure

The invention discloses a light-emitting diode (LED) structure which comprises a substrate, a first doped semiconductor layer, a first electrode, a light-emitting layer, a second doped semiconductor layer and a second electrode, wherein the substrate is provided with a surface and a plurality of cylindrical photon crystals positioned on the surface; the first doped semiconductor layer is arranged on the substrate to cover the photon crystals; the light-emitting layer, the second doped semiconductor layer and the second electrode are sequentially arranged on part of the first doped semiconductor layer; and the first electrode is arranged on part of the first doped semiconductor layer on which the light-emitting layer is not covered. Because the substrate provided with the photon crystals can improve the epitaxial quality of the first doped semiconductor layer and increase the light energy of the forward ejected LED structure, the light-emitting efficiency of the LED structure can be effectively improved.
Owner:江苏璨扬光电有限公司
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