The invention discloses a method for enhancing the antistatic ability of GaN-based light-emitting
diode. The epitaxial
wafer structure of the light-emitting
diode sequentially comprises an
underlay, alow-temperature buffer layer, an unadulterated GaN high-temperature buffer layer, an
aluminum gallium nitride / GaN
superlattice structure, the unadulterated GaN high-temperature buffer layer, an N type
contact layer, an N type GaN conductive layer, a light-emitting layer
multiple quantum well structure MQW, a P type
aluminum gallium nitride electric
barrier layer, a P type GaN conductive layer and a P type
contact layer in a sequence from down to up. In the invention, the
aluminum gallium nitride / GaN
superlattice periodic structure is inserted in the unalloyed GaN high temperature buffer layer. The
insertion of the aluminum
gallium nitride / GaN
superlattice periodic structure can effectively improve
crystal quality of materials, thereby enhancing the antistatic ability of the GaN-based light-emitting
diode and improving the reliability and the stability of devices.