47 results about "Scanning tunnel microscopy" patented technology

The invention discloses a low-temperature scanning tunneling microscope using a closed-cycle refrigerator to achieve refrigeration. The low-temperature scanning tunneling microscope comprises a closed-cycle refrigerator system, a helium heat exchange gas refrigeration vibration isolation interface system, a low-temperature scanning tunneling microscope scanning head system, a vacuum system, a vibration reduction platform and a scanning tunnel microscope control system. According to the low-temperature scanning tunneling microscope, under the condition that no liquid helium is consumed, atomic-scale resolution low-temperature ultrahigh-vacuum scanning tunnel microscopy space imaging and high-energy resolution scanning tunnel spectrum accurate measurement can be achieved like a liquid helium refrigeration system. The technical scheme of closed-cycle refrigeration can also be used for other applications needing lower temperature and low-vibration environments like other members of scanning probe microscope families. Large-range temperature changes can also be achieved through feedback combination of heating elements and temperature measuring elements.

A method for autonomously applying a dangling bond pattern to a substrate for atom scale device fabrication includes inputting the pattern, initiating a patterning process, scanning the substrate using a scanning probe microscope (SPM) to generate an SPM image of the substrate, feeding the SPM image into a trained convolution neural network (CNN), analyzing the SPM image using the CNN to identify substrate defects, determining a defect free substrate area for pattern application; and applying the pattern to the substrate in that area. An atom scale electronic component includes functional patches on a substrate and wires electrically connecting the functional patches. Training a CNN includes recording a Scanning Tunneling Microscope (STM) image of the substrate, extracting images of defects from the STM image, labeling pixel-wise the defect images, and feeding the extracted and labeled images of defects into a CNN to train the CNN for semantic segmentation.

The invention discloses a method and device for realizing atomic-scale laser pumping detection. The method comprises the steps of triggering a first laser to emit a first laser pulse and a second laser to emit a second laser pulse based on an electric pulse, and adjusting the delay time between the first laser pulse and the second laser pulse; editing the waveform of the electric pulse to modulatethe delay time; combining and collimating the first laser pulse and the second laser pulse and irradiating an object to be detected; detecting the tunneling current signals of the irradiated object to be detected; and extracting a signal related to the delay time in the tunneling current signals. According to the invention, while signal modulation is realized, the laser average power in unit timeis ensured to be constant; therefore, the influence of the heat effect on a scanning tunneling microscope can be eliminated; the combination of the laser pumping detection technology and the scanningtunneling microscope technology is realized; and the atomic-scale spatial resolution and the nanosecond-scale time resolution can be obtained at the same time.

The invention relates to a tube-type approximation and imaging unit mechanical tandem type scanning tunneling microscope body. The tube-type approximation and imaging unit mechanical tandem type scanning tunneling microscope body comprises a base, a sliding rod, a sleeve and a spring piece, and is characterized by further comprising a first piezoelectric tube, a second piezoelectric tube and a probe bracket, wherein one end of the first piezoelectric tube is fixed on the base, and the other end is connected and fixed to the second piezoelectric tube in a tandem manner in the axial direction; the sleeve is concentrically and coaxially fixed to the deformation free end of the second piezoelectric tube; the spring piece exerts pressure in the radial direction of the sleeve to clamp the sliding rod to the inner wall of the guide rail; the sliding direction of the sliding rod is in the axial direction of the sleeve; and the probe bracket and the second piezoelectric tube are concentricallyand coaxially arranged, and one end of the probe bracket is fixed to a tandem connection position of the first piezoelectric tube and the second piezoelectric tube. The tube-type approximation and imaging unit mechanical tandem type scanning tunneling microscope body is highly compact in radial and axial structures, the second piezoelectric tube is further used for approximating low starting voltage capable of realizing a needle sample approximation step, high rigidity of the scanning unit is ensured, the main body is made of an insulating material, the cross section of the structure is free of a conductive loop, and the tube-type approximation and imaging unit mechanical tandem type scanning tunneling microscope body is particularly suitable for extreme physical conditions of extremely low temperature, strong / fast changing magnetic field and strong vibration.

The invention provides a novel scanning probe for a novel scanning tunneling microscope and a preparation method thereof. The scanning probe comprises a probe body. The probe body comprises a probe tip and a micro-cantilever bearing the probe tip, the micro-cantilever being provided with an upper surface and a lower surface corresponding to the upper surface, and the probe tip being connected to the position, close to the end, of the upper surface of the micro-cantilever; a metal conductive layer covering the upper surface of the micro-cantilever and the probe tip; an insulating layer coveringthe metal conductive layer; and a metal reflecting layer covering the lower surface of the micro-cantilever. The novel scanning probe is formed by introducing the insulating layer, feedback control over whether the scanning probe makes contact with a sample or not, the contact distance and the like can be achieved through atomic force, and the application field of the scanning tunneling microscope is widened.

A method of transferring a single metal atom from a first location to a second location on the surface of a metal oxide is disclosed. The method includes obtaining a material having a first metal atom deposited on a first oxygen atom vacancy of the metal oxide and transferring the first metal atom of the metal on the first oxygen atom vacancy to a second location on the metal oxide by applying a voltage to the first metal atom. The second location can be a second metal atom on a second oxygen atom vacancy of the metal oxide, where the first and second metal atoms form a first metal atom second metal atom species, or a metal atom of the metal oxide, where the first metal atom and the metal atom of the metal oxide forms a first metal atom metal atom of the metal oxide species.

The invention provides a needle tip transfer support of a scanning tunneling microscope; the needle tip transfer support comprises: a first unit that includes a first surface and a second surface, andthe transmission mode of the first unit comprises horizontal transmission; the base that is located on the first surface and connected with the first unit, the base comprises a first through hole anda second through hole, the diameter of the first through hole is larger than that of the second through hole, the center line of the first through hole coincides with the center line of the second through hole, and therefore a limiting step face is formed between the first through hole and the second through hole; an elastic member that comprises a top, a bottom and an elastic fixing part, wherein the top makes contact with the limiting step face, the bottom makes contact with the first surface, and the horizontal section distance of the elastic fixing part is smaller than the diameter of thesecond through hole. And the scanning tunneling microscope needle tip support is fixed through the elastic fixing part. Operations such as transmission, in-situ treatment and replacement of the needle tip in an ultrahigh vacuum combined system can be realized, and impurity pollution under the atmosphere is avoided.

The invention discloses a single-layer or several-single-layer CrTe3 film and a preparation method thereof. The thin film is of a single structure phase and is a magnetic semiconductor two-dimensional material, and the surface of the thin film shows a characteristic zigzag structure under a scanning tunneling microscope. According to the preparation method of the single-layer CrTe3 thin film, the single-layer CrTe3 thin film is prepared in a vacuum cavity by adopting a molecular beam epitaxy method. The single-layer CrTe3 thin film is easy to prepare, high in quality, uniform in component and smooth in surface. The invention further provides application of the single-layer CrTe3 thin film in a spinning electronic device, and the single-layer CrTe3 thin film has important application on miniaturization of the electronic device.