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Shape-controllable Scanning Tunneling Microscope Tip Preparation System

A scanning tunneling and preparation system technology, applied in the field of shape-controllable scanning tunneling microscope needle tip preparation system, can solve the problems of uncontrollable needle tip shape and blunt needle tip during corrosion process, achieve friendly software interface, convenient operation, and avoid corrosion The effect of too fast a process

Active Publication Date: 2020-01-21
XIAMEN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The biggest disadvantage of this method is that the corrosion process and the shape of the needle tip are uncontrollable; in addition, if the circuit cannot be cut off in time when the wire breaks, the needle tip will continue to react and become blunt

Method used

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  • Shape-controllable Scanning Tunneling Microscope Tip Preparation System
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  • Shape-controllable Scanning Tunneling Microscope Tip Preparation System

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Embodiment Construction

[0035] The present invention will be further described below in conjunction with drawings and embodiments.

[0036] see figure 1 , the embodiment of the present invention is provided with a stepper motor 1, a three-dimensional translation stage 2, a probe clamping device 3, an annular structure electrolytic cell 4, a stainless steel ring 5, a programmable DC power supply 6, a computer 7, a data acquisition control card 8, and a CCD Camera 9 and display screen 10 . The stepper motor 1 is supported by a column, installed on the top of the three-dimensional translation platform 2, and connected with the probe clamping device 3, and is used for the positioning of the wire. The entire probe positioning mechanism is placed on the shock-absorbing platform; the ring-shaped electrolytic cell Corrosion solution is housed in 4, its cathode is a stainless steel ring 5, and its anode is a metal wire 11 to be corroded. , control its on, off and current output modes, and simultaneously con...

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Abstract

The invention relates to a scanning tunnel microscope, in particular to a morphology controllable scanning tunnel microscope needle point preparation system. The system comprises a corrosion platform,a working circuit, and control software, and can be used for preparing various needle points for STM tests. The corrosion platform comprises an electrolytic tank filled with corrosive liquid, a probepositioning mechanism used for fixing and adjusting the position of a metal wire and a monitoring platform capable of observing the change of the shape of the needle point in the corrosion process inreal time; the working circuit supplies power to the electrolytic tank, and meanwhile, acquires the voltage signals of the needle point, and feeds back to the computer control software, and a stepping motor is controlled by a motor driving circuit to complete feeding and lifting motions of the probe; the control software controls a programmable power supply to output currents in different changemodes and timely cuts off the power supply when the needle point is pulled off according to the voltage signal fed back by an acquisition card, so that the stepping motor is triggered to extract the needle point. The controllable operation of the dynamic corrosion process is realized based on real-time control, real-time observation and feedback, so that a needed needle point for the STM with different morphologies can be prepared.

Description

technical field [0001] The invention relates to a scanning tunneling microscope, in particular to a shape-controllable scanning tunneling microscope tip preparation system. Background technique [0002] Since the advent of the scanning tunneling microscope (STM) in 1986, as a new type of detection tool, it has atomic-level resolution and is widely used in the fields of chemistry, physics, materials science, biology and microelectronics science. The impressive scientific results obtained in the following scientific fields show its importance. [0003] STM has extremely high resolution, but whether it can achieve high resolution in actual operation is affected by many factors. As the basic detection element of STM, the shape, size and chemical identity of the scanning probe will affect the surface electronic state of the measured sample and the stability of the resulting tunneling current, thereby affecting the resolution and authenticity of the STM image (1 2 . L. Jurczysz...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01Q60/16G01Q70/16
CPCG01Q60/16G01Q70/16
Inventor 孔丽晶吴志明许飞雅陈婷吴雅苹康俊勇
Owner XIAMEN UNIV
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