56 results about "Microscanning" patented technology

The micro-scanning multislit confocal image acquisition apparatus of the present invention is a confocal image acquisition apparatus that comprises a nonscanning multislit confocal image acquisition system using a slit array instead of a pinhole array and a multislit-image microscanning mechanism for moving the image of the slit array in a small back and forth motion with respect to the object during each exposure of the two-dimensional arrayed photodetector in one complete measurement. Microscanning the image of the slit array with an amplitude equal to half the distance between adjacent slits increase the aperture ratio of the pixels to 100 percent, reducing blind regions to zero. As a result, this apparatus can measure a small object that cannot be measured by a conventional nonscanning confocal image acquisition apparatus because of blind regions. Microscanning the image of the slit array can also reduce the effect of speckles, another problem of a conventional nonscanning confocal image acquisition apparatus, by averaging the reflected light passing through each aperture of the slit array.

The invention discloses a micro-scanning platform, a shooting method and a work area flatness calibration method. Continuous scanning on a low precision platform can be achieved. The method mainly comprises the steps that a scanning coordinate system is set up in a work area; through a plane formula A1X+B1Y+C1Z+D1=0 and a standard slide, the calibration values En of the flatnesses of all scanning points in the work area of an objective table are determined; then, in actual sample slide shooting, the actual focusing position of each scanning point is determined according to the corresponding En. In this way, all scanning points can be adjusted to be in place before a camera shoots all the scanning points. The continuous scanning on the low precision platform can be achieved. Moreover, the scanning precision is high, scanning efficiency is high, and shot photos are clear. Due to the fact that high-precision continuous scanning is achieved on the low precision platform, the manufacturing cost of a high-precision scanning device is remarkably reduced.

The invention belongs to technical field of microscan, and discloses a double beam light sheet lighting microscan imaging method. The method comprises the steps: dividing scanning laser output by an identical light source into first directional scanning laser and second directional scanning laser; ensuring that the two paths of scanning laser are vertically projected onto a sample to motivate sample fluorescent light, and the projection directions are opposite; detecting and collecting fluorescent light motivated by the sample and performing exposure imaging; shifting the sample, and repeating the process till a complete sample image is obtained through scanning, wherein the two paths of scanning laser are synchronous, a light sheet laser sample is produced, and the projection direction is in the x-axis direction; the scanning direction is in the y-axis direction; the fluorescent light collected direction of the sample is in the z-axis direction; scanning initial positions of the two paths of scanning laser are in the center line of a scanning array plane; scanning directions of the two paths of scanning laser are opposite. The method performs light sheet lighting imaging on the transparent sample through double beam scanning laser, so as to obtain higher imaging speed, and enhances the imaging quality through image frequency domain weighted superposition.

A fully automatic microscopic scanner, comprising an image acquisition mechanism (IAM) with a line array camera. The IAM and the microscopic scanning mechanism can move along X/Y/Z axis under the action of a power control mechanism and the stage mechanism and the light source mechanism are fixed and not moved. The light source mechanism comprises a flat light source with a condenser and the flat light source area is greater than or equal to the total area of the tray. The light source mechanism comprises a cooling fan and a water cooling unit. It also comprises a general control mechanism and a laser pre-focus system connected to it. The invention also discloses a fully automatic microscopic scanner which links the microscopic scanning mechanism and the IAM with the light source mechanism. According to the present invention, flexible adjustment of lens can be achieved to make the lens move forwards and backwards, leftwards and rightwards and up and down. In addition, with the unique light source mechanism and laser pre-focus system, the stage and the light source are fixed and not moved during the scanning process so that real-time accurate and fast focusing might be fulfilled. In such a way, unlimitedly extended microscopic scanning range, improved scanning efficiency and improved quality of scanning can be accomplished.

The invention provides a blood cell component analysis instrument and a method. The instrument comprises a sample absorbing and transfer unit, a dyeing liquid adding unit, a stirring and smearing unit, a cleaning unit, a microscanning unit, an image processing unit and a control unit. The sample absorbing and transfer unit is used for absorbing a quantitative blood sample to a glass slide; the dyeing liquid adding unit is used for adding the dyeing liquid to dye cells and dilute the blood sample; a reverse T-shaped stirring and smearing unit is used for mixing the blood sample and the dyeing liquid uniformly and smearing the mixed blood sample; the microscanning unit is used for performing microscopic examination on the smear; the instrument automatically and continuously performs axial scanning on the unclear targets for many times; the image processing unit processes the scanning image and selecting the images with clearest cells or granules in the multi-focus images into a whole image; and the analysis instrument is simple to operate, low in failure rate, accurate in result and few in consumed material reagent, and can perform quantitative analysis on the blood cells conveniently and accurately.

The invention discloses a microscopic scanning imaging acquisition device for vertical optical element surface damage and a method thereof. The device comprises a two-dimensional scanning motion platform, a one-dimensional focusing shaft, a automatic zoom microscope, a area array color CCD, a coaxial light source, a ring light source, a dispersion confocal displacement sensor, a system controller, an industrial control computer, a seismic isolation platform and a display. The device of the invention can automatically acquire and store images, can automatically complete image splicing, has image analysis capability, and can count quantity and dimension of damage spots in an image. According to the invention, online rapid high-precision microscopic scanning imaging acquisition and damage detection of vertical optical element surface in an optical path can be realized. The device of the invention has a wide application prospect and considerable social and economic benefits.

The invention relates to a frequency domain imaging method of an ultrasonic scanning microscope, being applicable to the field of ultrasonic scanning microscope detection and ultrasonic C-scanning detection and capable of improving the C-scanning imaging precision in ultrasonic micro-scanning and revealing details which are difficultly discovered in time-domain imaging. The frequency domain imaging method comprises the following steps of: firstly, carrying out full-wave acquisition on an A-scanning signal generated in the C-scanning process; secondly, carrying out fast Fourier transform on signals in data gates of each A-scanning waveform, finding out the maximum amplitudes in the signals, normalizing the maximum amplitudes and expressing the intensities by using corresponding color gray levels; and finally, drawing pixel points on a screen so as to accomplish the frequency domain imaging in ultrasonic micro-scanning.

The invention discloses a large visual field non-diffracting Bessel light sheet microscopic scanning imaging method and system. The method comprises following steps: generating two collimated Gauss laser beams with same intensity by a laser source; converting two Gauss laser beams into two Bessel beams by a Bessel light generating element respectively; aligning two Bessel beams, projecting the Bessel beams on two sides of a scanned sample to excite the sample to generate fluorescence; collecting the fluorescence by a detector with an electron slit, using the fluorescence to carry out exposureimaging to obtain the image of the sample, and adopting a detection object lens with a low value aperture to carry out large visual field imaging by the detector. Two Bessel beams are used to enhancethe transmission depth in a same visual field, the position of the electron slit is opposite to the center of two Bessel beams, under a condition of large depth of field, the side lobe effect is eliminated, and the depth of the electron slit is matched with the diameter of the center of two Bessel beams. The provided method and system can realize large visual filed and large depth of field imagingand improves the imaging quality of sample images.

Disclosed are systems and methods for assessing images in applications such as microscopic scanning of a slide having light emitting objects. In certain embodiments, such scanning can involve objects such as sequencing beads disposed on the slide to facilitate biological analysis such as nucleic acid sequencing. Also disclosed are certain embodiments where images of light emitting objects are assessed for image quality so as to facilitate a feedback response such as a corrective action. In certain embodiments, such assessment and correction can be performed in real-time during the scanning process, and can include re-acquisition of the assessed image. Also disclosed are certain embodiments where such assessment and correction can be triggered dynamically during the scan, or before start of the scan, so as to enhance the scanning performance, including scanning time and throughput.

The invention discloses a confocal laser microscope based on self-mixing interference. The confocal laser microscope based on self-mixing interference comprises a helium-neon laser, an expanding collimating lens group composed of a concave lens and a convex lens, a variable neutral-density filter, an objective lens, a bidimensional moving platform, an one dimensional moving platform, a high-precision moving platform controller, a photoelectric detector, an electric current/ voltage switching circuit, a filter, an amplifier, an analogue-to-digital conversion circuit and a computer unit. According to the confocal laser microscope based on self-mixing interference, a method of conducting microscanning with laser self-mixing interference and the confocal principle is adopted, the advantages of the laser self-mixing technology that the structure is simple, the collimation is easy and the characteristics of the confocal microscope that the axial resolving power is high and the antijamming capability is strong are combined, the automatic focusing problems and the measuring vision enlarging problem of the confocal laser microscope are solved, the structure of a traditional confocal microscope is simplified, the adjusting difficulty of reflected light path in a confocal measuring system is lowered, the defects of the traditional confocal microscope that the number of the needed optical element is large, the requirement on the optical element is high, the light path is complicated and adjusting is difficult are overcome.

The invention relates to a design method of a high-precision controllable microscanning mechanism based on piezoelectric ceramics and a sliding guide rail, which belongs to the field of the design of high-performance photoelectronic imaging systems. By utilizing the relation that the expansion amounts of the piezoelectric ceramics are in proportion to driving voltages of the piezoelectric ceramics, the invention provides the high-precision controllable microscanning mechanism which uses the piezoelectric ceramics as driving devices and uses the sliding guide rail as a translation element to control the marching direction. The mechanism comprises two piezoelectric ceramics, a vertical movable framework, a horizontal movable framework, four pairs of dovetail grooves, a microscanning mechanism framework and four groups of balls. The piezoelectric ceramic for realizing displacement driving in the vertical direction is connected with a two-dimensional translation element and is arranged atthe inner part of a vertical sliding guide rail component. The piezoelectric ceramic for realizing displacement driving in the horizontal direction is connected with the outer wall of the microscanning mechanism and the vertical sliding guide rail component to realize horizontal displacement driving. The displacement amounts of the piezoelectric ceramics can be controlled in a high-precision manner through the amplitude values of the driving voltages.

The invention relates to a confocal microscopic scanning method and discloses an alpha-beta scanning method for a confocal microscopic system to solve the problems that a confocal scanning method in the prior art can not fully utilize an effective field of view of an optical system, the measuring efficiency is low, and reliability is hard to improve.A signal alpha and a signal beta are constructed through upper computer software and sent into a streaming detection type galvanometer system through two channels of a data collecting card respectively to be taken as control signals of the streaming detection type galvanometer system; the streaming detection type galvanometer system conducts scanning according to the signal alpha and the signal beta, and two-dimensional scanning is finished for a scanning light spot according to a concentric circle track; scanning light spot track information is acquired through calculation; the streaming detection type galvanometer system and an axial micropositioner are controlled to achieve three-dimensional scanning measurement of a sample to be detected; the collected data is processed, and by combining the scanning light spot track, the three-dimensional shape of the sample to be detected is reconstructed.According to the method, the effective field of view of the optical system can be fully utilized, and the scanning field of view of the confocal microscopic system is enlarged to the maximum extent.

The invention provides a panoramic stitching system and method for microscopic images. The panoramic stitching system comprises a view sub-block matching module, a view position fitting module and a block extraction module, the view sub-block matching module is used for identifying an overlapping region between the images and judging an adjacent position relationship between the sub-images, so that the sub-images acquired by the microscopic scanning device are automatically arranged according to a splicing sequence of the images; the visual field position fitting module is used for finely adjusting the position according to the overlapping area between the sub-images so as to accurately splice the cell positions; and the block extraction module is used for automatically extracting a completely spliced image. By the adoption of the scheme, automatic splicing can be achieved, high-definition images can be obtained, in the splicing process, the method can adapt to disorderly-arranged images without clearly scanning the sequencing problem of the images, high compatibility is achieved, and labor intensity is greatly reduced. The splicing process of the method can be completed in a second-level range so as to adapt to the data processing intensity of large-scale diagnosis on the cloud.

The invention relates to the technical field of microscope scanning, especially, to a microscanning platform comprising a scanning platform being a workbench. An XY coordinate system is arranged on the surface of the workbench, and zero points of an X axis and a Y axis are connected to a corner of the scanning platform, so that an area formed by the X axis and the Y axis is located in a first quadrant of the coordinate system, and coordinate values of the X axis and the Y axis are positive values. Besides, the invention also provides a working area flatness calibration method of a microscanning platform. According to the invention, the X axis and the Y axis are adopted to carry out rapid and comprehensive scanning on the scanning platform; the defect position of the scanning platform is determined through the coordinate system; the defect position is marked and recorded, workers can conveniently adjust the scanning platform and correct the defect; and problems that the existing microscopic scanning platform and the existing working area flatness calibration method cannot quickly scan the scanning platform and cannot determine and adjust the specific position of the defect are solved at the same time.

The invention provides a cell detection and identification system and method. The invention relates to the field of intelligent cell identification by using a computer, and discloses a cell identification system, which comprises a microscopic scanning device used for acquiring microscopic images. In a computer, multiple images of each sample are spliced in the computer, and extraction is made inspliced images according to cell nucleus characteristics to obtain a single cell nucleus microscopic image, According to marked cells, the single cell nucleus microscopic images are classified by using an artificial intelligence program after model training; and obtaining classified cell data based on the target. According to the invention, the identification accuracy and the identification efficiency can be greatly improved, especially the judgment time of doctors can be reduced, and the working efficiency is improved.

The present invention relates to a microscanning platform. It is formed from base, X-axis slide block and its bidirectional movement traction mechanism and Y-axis slide block and its bidirectional movement traction mechanism. Said invented microscanning platform can be mounted on the existent microscope.

The invention provides a microscopic scanning automatic focusing compensation system and method so that focusing time can be shortened and the microscopic scanning efficiency can be enhanced. The focusing compensation system comprises an object table, an object lens, a quick focusing module and a position detection device used for detecting the position of the object table in real time. The quick focusing module comprises z-axis compensation piezoelectric ceramic which is capable of extending or shortening in the z-axis direction and a z-axis compensation voltage module which supplies power to the z-axis compensation piezoelectric ceramic. The upper end of the object lens is connected with the z-axis compensation piezoelectric ceramic. The output of the position detection device is connected with a controller which is connected with the z-axis compensation voltage module. According to the focusing compensation method, firstly the distance t from any point a (x, y) on the object table to the focal plane of the object lens is measured; and the external electric field voltage of the z-axis compensation piezoelectric ceramic is controlled through the controller in use so that the object lens is enabled to move along the z-axis under driving of the z-axis compensation piezoelectric ceramic, the focal plane and any point a (x, y) are enabled to be overlapped and thus automatic quick compensation of focus z-axis deviation can be realized.