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199results about How to "High on/off ratio" patented technology
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Semiconductor device and manufacturing method thereof
ActiveUS20100025677A1Small amount of photocurrentReduce parasitic capacitanceTransistorElectroluminescent light sourcesProduction rateCharge carrier
To provide a semiconductor device including a thin film transistor having excellent electric characteristics and high reliability and a manufacturing method of the semiconductor device with high mass productivity. The summary is that an inverted-staggered (bottom-gate) thin film transistor is included in which an oxide semiconductor film containing In, Ga, and Zn is used as a semiconductor layer, a channel protective layer is provided in a region that overlaps a channel formation region of the semiconductor layer, and a buffer layer is provided between the semiconductor layer and source and drain electrodes. An ohmic contact is formed by intentionally providing the buffer layer having a higher carrier concentration than the semiconductor layer between the semiconductor layer and the source and drain electrodes.
Owner:SEMICON ENERGY LAB CO LTD
Semiconductor device
ActiveUS20100072467A1Increasing the thicknessAvoid separationTransistorElectroluminescent light sourcesDisplay deviceSemiconductor package
A display device includes a pixel portion in which a pixel is arranged in a matrix, the pixel including an inverted staggered thin film transistor having a combination of at least two kinds of oxide semiconductor layers with different amounts of oxygen and having a channel protective layer over a semiconductor layer to be a channel formation region overlapping a gate electrode layer and a pixel electrode layer electrically connected to the inverted staggered thin film transistor. In the periphery of the pixel portion in this display device, a pad portion including a conductive layer made of the same material as the pixel electrode layer is provided. In addition, the conductive layer is electrically connected to a common electrode layer formed on a counter substrate.
Owner:SEMICON ENERGY LAB CO LTD
Organic electroluminescent display device
InactiveUS20100117999A1High field-effect mobilityHigh on-off ratioElectroluminescent light sourcesSolid-state devicesOrganic electroluminescenceEngineering
An organic electroluminescent display device includes at least a driving TFT and pixels which are formed by organic electroluminescent elements and are provided on a substrate of the TFT. The driving TFT includes at least a substrate, a gate electrode, a gate insulating film, an active layer, a source electrode, and a drain electrode. The driving TFT further includes a resistive layer between the active layer and at least one of the source electrode and the drain electrode. The pixels include at least one color-modified pixel which has a color filter that modifies the emission color of the color-modified pixel, and which emits light of the modified color.
Owner:UDC IRELAND
Semiconductor device and method for manufacturing the same
ActiveUS20100025679A1Small currentHigh on-off ratioStatic indicating devicesSolid-state devicesOhmic contactCharge carrier
An embodiment is to include an inverted staggered (bottom gate structure) thin film transistor in which an oxide semiconductor film containing In, Ga, and Zn is used as a semiconductor layer and a buffer layer is provided between the semiconductor layer and a source and drain electrode layers. The buffer layer having higher carrier concentration than the semiconductor layer is provided intentionally between the source and drain electrode layers and the semiconductor layer, whereby an ohmic contact is formed.
Owner:SEMICON ENERGY LAB CO LTD
Semiconductor device and method for manufacturing the same
ActiveUS20110127522A1High on-off ratioHigh puritySolid-state devicesSemiconductor/solid-state device manufacturingSemiconductor materialsElectron donor
Objects are to provide a semiconductor device for high power application in which a novel semiconductor material having high productivity is used and to provide a semiconductor device having a novel structure in which a novel semiconductor material is used. The present invention is a vertical transistor and a vertical diode each of which has a stacked body of an oxide semiconductor in which a first oxide semiconductor film having crystallinity and a second oxide semiconductor film having crystallinity are stacked. An impurity serving as an electron donor (donor) which is contained in the stacked body of an oxide semiconductor is removed in a step of crystal growth; therefore, the stacked body of an oxide semiconductor is highly purified and is an intrinsic semiconductor or a substantially intrinsic semiconductor whose carrier density is low. The stacked body of an oxide semiconductor has a wider band gap than a silicon semiconductor.
Owner:SEMICON ENERGY LAB CO LTD
Display device
ActiveUS20100072468A1Increasing the thicknessAvoid separationTransistorStatic indicating devicesDisplay deviceSemiconductor
A display device includes a pixel portion in which a pixel electrode layer is arranged in a matrix, and an inverted staggered thin film transistor having a combination of at least two kinds of oxide semiconductor layers with different amounts of oxygen is provided corresponding to the pixel electrode layer. In the periphery of the pixel portion in this display device, a pad portion is provided to be electrically connected to a common electrode layer formed on a counter substrate through a conductive layer made of the same material as the pixel electrode layer. One objection of our invention to prevent a defect due to separation of a thin film in various kinds of display devices is realized, by providing a structure suitable for a pad portion provided in a display panel.
Owner:SEMICON ENERGY LAB CO LTD
Semiconductor device and method for manufacturing the same
ActiveUS20100065838A1Small currentHigh on-off ratioTransistorSolid-state devicesProduction rateSemiconductor package
An object is to provide a semiconductor device including a thin film transistor with excellent electrical characteristics and high reliability and a method for manufacturing the semiconductor device with high mass productivity. A main point is to form a low-resistance oxide semiconductor layer as a source or drain region after forming a drain or source electrode layer over a gate insulating layer and to form an oxide semiconductor film thereover as a semiconductor layer. It is preferable that an oxygen-excess oxide semiconductor layer be used as a semiconductor layer and an oxygen-deficient oxide semiconductor layer be used as a source region and a drain region.
Owner:SEMICON ENERGY LAB CO LTD
Tunable-frequency Terahertz metamaterials modulator
The utility model discloses a tunable-frequency Terahertz metamaterials modulator comprising unit devices arranged periodically. Each unit device comprises a substrate, a functional material layer and metal resonator units. The functional material layer is arranged on the substrate, and the metal resonator units are arranged on the functional material layer. When the functional material layer turns to a metal phase from an insulation phase, conductivity of the functional material layer is exponentially increased to increase areas of middle open capacitance of the metal resonator units, the resonator frequency of the metal resonator units is decreased with the increase of the capacitance, so that frequency tuning of the unit devices is realized. By the aid of the tunable-frequency Terahertz metamaterials modulator, the metal opening resonator units arranged periodically are produced on the substrate in the Terahertz wave band of low transmitting consumption, conductivity changes before and after phase changes of the metal insulation phase change materials are used to change areas of the open capacitance of the resonator units, and resonant frequency is tunable; and initiative control of electromagnetic transmission features at a particular frequency by the Terahertz wave band is realized, and large switch ratio or high-modulation depth genera is obtained.
Owner:HUAZHONG UNIV OF SCI & TECH
Semiconductor device and method for manufacturing the same
ActiveUS20100032667A1Small amount of photocurrentReduce parasitic capacitanceTransistorSemiconductor/solid-state device manufacturingIndiumCharge carrier
One of the objects of the present invention is to provide a thin film transistor using an oxide semiconductor film containing indium (In), gallium (Ga), and zinc (Zn), in which the contact resistance between the oxide semiconductor layer and a source and drain electrodes is reduced, and to provide a method for manufacturing the thin film transistor. An ohmic contact is formed by intentionally providing a buffer layer having a higher carrier concentration than the IGZO semiconductor layer between the IGZO semiconductor layer and the source and drain electrode layers.
Owner:SEMICON ENERGY LAB CO LTD
Semiconductor device and manufacturing method thereof
ActiveUS20100032666A1Small amount of photocurrentReduce parasitic capacitanceSolid-state devicesSemiconductor/solid-state device manufacturingProduction rateIndium
A semiconductor device including thin film transistors having high electrical properties and reliability is proposed. Further, a method for manufacturing the semiconductor devices with mass productivity is proposed. The semiconductor device includes a thin film transistor which includes a gate electrode layer, a gate insulating layer over the gate electrode layer, a source electrode layer and a drain electrode layer over the gate insulating layer, a buffer layer over the source electrode layer and the drain electrode layer, and a semiconductor layer over the buffer layer. A part of the semiconductor layer overlapping with the gate electrode layer is over and in contact with the gate insulating layer and is provided between the source electrode layer and the drain electrode layer. The semiconductor layer is an oxide semiconductor layer containing indium, gallium, and zinc. The buffer layer contains a metal oxide having n-type conductivity. The semiconductor layer and the source and drain electrode layers are electrically connected to each other through the buffer layer.
Owner:SEMICON ENERGY LAB CO LTD
p-type graphene film/n-type Ge schottky junction near-infrared photoelectric detector and preparation method thereof
InactiveCN103280484AImprove absorption rateHigh on/off ratioFinal product manufactureSemiconductor devicesPhotovoltaic detectorsOhmic contact
The invention discloses a p-type graphene film / n-type Ge schottky junction near-infrared photoelectric detector and a preparation method thereof. The p-type graphene film / n-type Ge schottky junction near-infrared photoelectric detector is characterized in that an n-type Ge substrate is used as a base region of a near-infrared photoelectric detector, and an n-type Ge substrate electrode is arranged on the lower surface of the n-type Ge substrate; the upper surface of the n-type Ge substrate is covered with an insulating layer, and the insulating layer does not go beyond the border of the n-type Ge substrate; the insulating layer is covered with a graphene contact electrode, and the graphene contact electrode does not go beyond the border of the insulating layer; and a p-type graphene film is laid on the graphene contact electrode, wherein a part of the p-type graphene film forms ohmic contact with the graphene contact electrode, the rest of the p-type graphene film forms schottky contact with the part, not covered with the insulating layer, of the upper surface of the n-type Ge substrate, and the p-type graphene film does not go beyond the border of the n-type Ge substrate electrode. The near-infrared photoelectric detector disclosed by the invention has the beneficial effects of large switch ratio, fast response speed and low dark current noise.
Owner:HEFEI UNIV OF TECH
Production method of metal oxide precursor layer, production method of metal oxide layer, and electronic device
InactiveUS20100072435A1Improve mobilityHigh on-off ratioRadiation applicationsConductive materialBoiling pointSolvent
A production method of a metal oxide precursor layer provided with a substrate, a solution containing a metal ion as a metal oxide precursor, and a process to coat the solution while the temperature of the substrate is adjusted in the temperature range of 50%-150% of the boiling point (° C.) of a main solvent of the solution.
Owner:KONICA MINOLTA INC
A double silicon nanowire wrap gate field-effect transistor and its manufacture method
InactiveCN101060135AImprove featuresLow costSemiconductor/solid-state device manufacturingSemiconductor devicesMOSFETSoi cmos technology
The provided double-silicon nano line enclose-grid FET belonged to MOSFET technique in ULSI comprises: a silicon substrate, double silicon lines as the channels, a grid anode and multicrystal silicon grid enclosing the nano lines to form the enclose-grid structure, both source and drain connecting with the substrate, and a thick SiO2 layer between the right bottom of channel and substrate. This invention is compatible to common CMOS technique, reduces cost and power consumption, and has wide application.
Owner:PEKING UNIV
Low leakage heterojunction vertical transistors and high performance devices thereof
InactiveCN1574253ALow power applicationsLower the barrierTransistorSemiconductor/solid-state device manufacturingHeterojunctionSemiconductor materials
A method for forming and the structure of a vertical channel of a field effect transistor, a field effect transistor and CMOS circuitry are described incorporating a drain, body and source region on a sidewall of a vertical single crystal semiconductor structure wherein a hetero-junction is formed between the source and body of the transistor, wherein the source region and channel are independently lattice strained with respect the body region and wherein the drain region contains a carbon doped region to prevent the diffusion of dopants (i.e., B and P) into the body. The invention reduces the problem of short channel effects such as drain induced barrier lowering and the leakage current from the source to drain regions via the hetero-junction and while independently permitting lattice strain in the channel region for increased mobility via choice of the semiconductor materials. The problem of scalability of the gate length below 100 nm is overcome by the heterojunction between the source and body regions.
Owner:IBM CORP
Thermistor Device
InactiveUS20070262408A1TemperatureHigh on-off ratioPhotovoltaicsNegative temperature coefficient thermistorsElectrical resistance and conductanceEngineering
A thermistor device having a high-speed response to temperature and a large ON / OFF ratio at the operating temperature. The thermistor device comprises a first layer of a first material having a positive temperature coefficient of resistance and a second layer of a second material having a semiconductivity and formed directly on the first layer. As the first material changes from conductive to a semiconductive or an insulative at or near the transition temperature TM-I, the interface between the first and second layer changes to a pn junction.
Owner:NEC SCHOTT COMPONENTS CORP +1
Organic semiconductor material and organic transistor using the same
InactiveUS20080230776A1Superior in controllability of threshold voltageHigh on-off ratioOrganic chemistryConductive materialArylHydrogen
The invention relates to an organic semiconductor material with a high carrier mobility, which is capable of obtaining favorable semiconductor characteristics when used in an organic semiconductor device, and an organic transistor using the same. More specifically, the present invention has a following structure including an oligothiophene part and a connecting part G;where, R1 and R2 are a hydrogen, a alkyl group, an alkoxy group, an aryl group, or an alkenyl group, R1 and R2 may be identical or different from each other, and where n is an integer. In the organic semiconductor material, the structure of the connecting part G may be any of the following:where, R3 and R4 are a hydrogen, an alkyl group, an alkoxy group, an aryl group, or a alkenyl group, R3 and R4 may be identical or different from each other, and where n is an integer of 1 to 3.
Owner:SANYO ELECTRIC CO LTD
Resistance change memory device
ActiveUS20150083987A1High on-off ratioHigh dielectric constantSolid-state devicesBulk negative resistance effect devicesPhysicsOxide
A resistance change memory device with a high ON / OFF ratio can be provided.A resistance change memory device according to an embodiment includes a first electrode containing a first element, a resistance change layer provided on the first electrode and containing an oxide of the first element, an oxygen conductive layer provided on the resistance change layer, containing a second element and oxygen, having oxygen ion conductivity, and having a relative permittivity higher than a relative permittivity of the resistance change layer, and a second electrode provided on the oxygen conductive layer. The resistance change layer undergoes dielectric breakdown earlier than the oxygen conductive layer when a voltage between the first electrode and the second electrode is continuously increased from zero.
Owner:TOKYO INST OF TECH +1
[1]benzothieno[3,2-b][1]benzothiophene compound and method for producing the same, and organic electronic device using the same
InactiveUS20110040107A1High carrier mobilityEasy to produceOrganic chemistrySolid-state devicesCarboxyl radicalBenzothiophene
A [1]benzothieno[3,2-b][1]benzothiophene compound expressed by General Formula (I): General Formula (I) where X and Y are each independently a hydrogen atom; a halogen atom; or a functional group having a straight or branched aliphatic alkyl group optionally having a halogen atom, a functional group having an alicyclic alkyl group optionally having a halogen atom, a functional group having a straight or branched aliphatic alkenyl group optionally having a halogen atom, a functional group having an alicyclic alkenyl group optionally having a halogen atom, a functional group having a carboxyl group, or a functional group having a thiol group, as a partial structure; and X and Y are the same or each independently different, provided that at least one of X and Y has a straight or branched aliphatic alkenyl group, an alicyclic alkenyl group, a carboxyl group or a thiol group, as a partial structure.
![[1]benzothieno[3,2-b][1]benzothiophene compound and method for producing the same, and organic electronic device using the same](https://images-eureka-patsnap-com.libproxy1.nus.edu.sg/patent_img/b1d0607b-c983-4631-989a-27078bbb8fb4/US20110040107A1-20110217-D00000.png "[1]benzothieno[3,2-b][1]benzothiophene compound and method for producing the same, and organic electronic device using the same")
![[1]benzothieno[3,2-b][1]benzothiophene compound and method for producing the same, and organic electronic device using the same](https://images-eureka-patsnap-com.libproxy1.nus.edu.sg/patent_img/b1d0607b-c983-4631-989a-27078bbb8fb4/US20110040107A1-20110217-D00001.png "[1]benzothieno[3,2-b][1]benzothiophene compound and method for producing the same, and organic electronic device using the same")
![[1]benzothieno[3,2-b][1]benzothiophene compound and method for producing the same, and organic electronic device using the same](https://images-eureka-patsnap-com.libproxy1.nus.edu.sg/patent_img/b1d0607b-c983-4631-989a-27078bbb8fb4/US20110040107A1-20110217-D00002.png "[1]benzothieno[3,2-b][1]benzothiophene compound and method for producing the same, and organic electronic device using the same")
Owner:RICOH KK
[1]benzothieno[3,2-b][1]benzothiophene compound and method for producing the same, and organic electronic device using the same
InactiveCN102007131AHigh carrier mobilityImprove oxidation stabilityOrganic chemistrySolid-state devicesHydrogen atomHalogen
![[1]benzothieno[3,2-b][1]benzothiophene compound and method for producing the same, and organic electronic device using the same](https://images-eureka-patsnap-com.libproxy1.nus.edu.sg/patent_img/fdda3800-e472-4960-aaac-c2d2999a894f/HPA00001245301300011.png "[1]benzothieno[3,2-b][1]benzothiophene compound and method for producing the same, and organic electronic device using the same")
![[1]benzothieno[3,2-b][1]benzothiophene compound and method for producing the same, and organic electronic device using the same](https://images-eureka-patsnap-com.libproxy1.nus.edu.sg/patent_img/fdda3800-e472-4960-aaac-c2d2999a894f/HPA00001245301300012.png "[1]benzothieno[3,2-b][1]benzothiophene compound and method for producing the same, and organic electronic device using the same")
![[1]benzothieno[3,2-b][1]benzothiophene compound and method for producing the same, and organic electronic device using the same](https://images-eureka-patsnap-com.libproxy1.nus.edu.sg/patent_img/fdda3800-e472-4960-aaac-c2d2999a894f/HPA00001245301300021.png "[1]benzothieno[3,2-b][1]benzothiophene compound and method for producing the same, and organic electronic device using the same")
Owner:RICOH KK
Preparation method for resistive random access memory
ActiveCN103441214AEfficient removalHigh on/off ratioElectrical apparatusElectrical resistance and conductanceStatic random-access memory
The invention discloses a preparation method for a resistive random access memory. The resistive random access memory comprises a bottom electrode, a resistance change dielectric layer material and a top electrode which are assembled in sequence. Preparation of the resistance change dielectric layer material includes the following steps that firstly, a first precursor, first inert gas, a second precursor and second inert gas are fed into a reactor in order, and a monolayer metallic oxide film is deposited on the bottom electrode through a cycle of hot atomic layer deposition; secondly, a plasma enhancement process is carried out on the film; finally, the steps are carried out circularly and alternately. In the preparation process of a resistance change dielectric layer, a brand new in-situ plasma enhancement hot atomic layer deposition technology is brought in, so the surface appearance and defects of the metallic oxide film can be adjusted on a large scale; the resistive random access memory obtained through the preparation method can achieve precision control over device resistance switching characteristics to enable the device switch ratio and erase / write voltage to be adjusted, and has excellent resistance change stability.
Owner:ZHEJIANG UNIV
Organic electroluminescent display device
ActiveCN101641795AIncreased current capabilityHigh Field Effect MobilityTransistorElectroluminescent light sourcesEngineeringOrganic electroluminescence
An organic electroluminescent display device includes at least a driving TFT and pixels which are formed by organic electroluminescent elements and are provided on a substrate of the TFT. The drivingTFT includes at least a substrate, a gate electrode, a gate insulating film, an active layer, a source electrode, and a drain electrode. The driving TFT further includes a resistive layer between theactive layer and at least one of the source electrode and the drain electrode. The pixels include at least one color-modified pixel which has a color filter that modifies the emission color of the color-modified pixel, and which emits light of the modified color.
Owner:UDC IRELAND
Thermal switch for conduction cooling superconducting magnet
InactiveCN1991287AStrong conduction abilityHigh switching ratioIndirect heat exchangersSuperconducting CoilsThermal conductivity
The invention relates to a thermal switch for conduction-cooled superconducting magnet, characterized in that it is the cylinder closed accommodator, comprising upper round plate [8], low round plate [10] and cylinder with thin wall [9]; the cylinder with thin wall [9] is the wall surface of cylinder closed accommodator; parallel red copper fins arranged in certain distance are set on inner surfaces of upper round plate [8] and lower round plate [10], fins on upper and lower round plates insert in cross and there is gap between adjacent fins; upper round plate [8] and lower round plate [10] are made of high thermal conductivity material and the cylinder with thin wall [9] is made of low thermal conductivity material; upper round plate [8], lower round plate [10] and cylinder with thin wall [9] are connected by positive and negative screw thread and the length of thermal switch [4] on the axial direction is controlled by the rotating depth of cylinder with thin wall [9]. The invention is provided with no need to vacuum pumping, strong conduction ability, big on-off ratio and no need to be controlled by outside. It can shorten the cooling time of prior conducting cooled magnet system.
Owner:INST OF ELECTRICAL ENG CHINESE ACAD OF SCI
Radiation imaging element
ActiveUS20090134336A1Improve performanceSubstantial electrical conductivitySolid-state devicesMaterial analysis by optical meansElectricityRadiation imaging
A radiation imaging element that includes radiation sensors disposed in a matrix so as to output signal charges corresponding to radiation transmitted through a subject, and TFTs for readout of signals from the radiation sensors, whereinthe TFT has at least a gate electrode, a gate insulating layer, an active layer, a source electrode and a drain electrode,the active layer has at least a first region and a second region which has an electric conductivity larger than an electric conductivity of the first region,the second region is in contact with the gate insulating layer, andthe first region is disposed so as to be electrically connected between the second region and at least one of the source electrode or the drain electrode.A radiation imaging element that effectively suppresses noise and also achieves a high quality image is provided.
Owner:SAMSUNG DISPLAY CO LTD
Environment-friendly Zn-Sb phase change storage thin-film material and manufacturing method thereof
InactiveCN103762309ARaise the crystallization temperatureFast and secure readElectrical apparatusRoom temperatureAlloy
The invention discloses an environment-friendly Zn-Sb phase change storage thin-film material and a manufacturing method of the environment-friendly Zn-Sb phase change storage thin-film material. The environment-friendly Zn-Sb phase change storage thin-film material is characterized in that the chemical structural formula of the material is ZnxSb(100-x), and x is larger than 0 but smaller than 60. The manufacturing method comprises the steps of installing an elemental Sb or Zn target material in a magnetic control direct current sputtering target, installing a ZnSb alloy target material in a magnetic control radio frequency sputtering target, vacuumizing a sputtering chamber until the vacuum degree is 2.0*10<-4>Pa, feeding high-purity argon of 50ml / min into the sputtering chamber until the air pressure reaches 0.35Pa, controlling the sputtering power of the ZnSb alloy target material to be 20-50W, controlling the sputtering power of the elemental Sb or Zn target material to be 0-40W, and obtaining the finished environment-friendly Zn-Sb phase change storage thin-film material after the target materials sputter for 5 minutes at the room temperature. The environment-friendly Zn-Sb phase change storage thin-film material and the manufacturing method of the environment-friendly Zn-Sb phase change storage thin-film material have the advantages that the crystallization temperature is high, the phase change speed is high, the switch ratio is large, data retentivity is good, stability is high, and power consumption is small.
Owner:NINGBO UNIV
Gate tube material, gate tube device and preparation method thereof
InactiveCN109638153AImprove stabilityFast switching speedElectrical apparatusMetallic electrodeEngineering
The invention belongs to the technical field of Wiener electronics, and particularly relates to a gate tube material, a gate tube device and a preparation method of the gate tube device. The gate tubedevice comprises a first metal electrode layer, a second metal electrode layer and a gate layer between the two electrode layers. The chemical general formula of the gate layer material can be shownas GexTeyA100-x-y, where A in the formula is one of the elements C, B, Si, Al, Sb and Bi, x and y are atomic percentages of elements, x is greater than or equal to 10 and less than 60, y is greater than 40 and less than 90, and 100-x-y is greater than 0 and less than or equal to 25. The gate tube provided by the invention has the advantages of simplicity in preparation, capability of driving ultra-high on-state current (more than 11mA), low off-state current, high switching ratio, high switching speed and low on-voltage.
Owner:HUAZHONG UNIV OF SCI & TECH
Display device and electronic device
ActiveUS20180076231A1Improve switching characteristicsHigh on-off ratioSolid-state devicesCathode-ray tube indicatorsDriver circuitDisplay device
A novel display device is provided. The display device includes a pixel portion and a driver circuit for driving the pixel portion. The driver circuit includes a first transistor having a dual-gate structure. The pixel portion includes a second transistor having a single-gate structure and a pixel electrode electrically connected to the second transistor. The first transistor and the second transistor each include a first metal oxide film functioning as a channel. The metal oxide films each include a first region and a second region. The first region contains In or Zn, and oxygen. The second region contains In or an element M, and oxygen. The first region and the second region are dispersed or distributed in a mosaic pattern.
Owner:SEMICON ENERGY LAB CO LTD
High-mobility transistor based on PMMA doped micro-molecule and preparation method thereof
ActiveCN107195781AImprove mobilityHigh on/off ratioSolid-state devicesSemiconductor/solid-state device manufacturingPower flowSpins
The invention relates to a preparation method of a high-mobility transistor based on PMMA doped micro-molecule. The preparation method comprises the following steps: S1, preparing a C8-BTBT and PMMA mixed solution; S2, cleaning a substrate: selecting a P-type heavily-doped silicon slice containing silicon dioxide, cleaning the P-type heavily-doped silicon slice after tailoring the same; S3, preparing a C8-BTBT active layer and a PMMA modification layer: overspreading the C8-BTBT and PMMA mixed solution configured through the step S1 on the substrate by using a dropper, spin-coating for 40s under the rotation speed of 2000-3000rpm; S4, thermally treating the spin-coated film; S5, preparing a molybdenum oxide buffer layer; and S6, preparing the source electrode and the drain electrode. The preparation method disclosed by the invention is simple, the prepared active layer is less in surface defect, the performance of the manufactured transistor device is improved.
Owner:SOUTH CHINA NORMAL UNIVERSITY
Silicon oxycarbide film and RRAM (resistive random access memory)
ActiveCN105977379AIncrease defect concentrationGood resistive propertiesElectrical apparatusStatic random-access memoryRandom access memory
The invention provides a silicon oxycarbide film and an RRAM (resistive random access memory). The molecular formula of a silicon oxycarbide film resistive material is SiCxOy, wherein x is from 1.21 to 0.21, y is from 1.45 to 2.01, and x and y are in negative correlation. The thickness of the film is 50nm or less. The RRAM comprises a top electrode, a resistive dielectric layer, a substrate and a back electrode, and is characterized in that the resistive dielectric layer is the silicon oxycarbide film. The top electrode is made of Ag and Al. The RRAM is prepared by a material compatible with the COMS technology, and physical deposition film equipment is mainly used in a preparation process. No high-temperature technology is employed, and the consumption of energy is reduced. Silicon oxycarbide films with different defect concentrations can be obtained through the control of gas proportion. For an SiC0.202.01 material, the switch ratio reaches 500, and can completely meet the actual demands (the switch ratio is greater than 10). Meanwhile, the RRAM based on the silicon oxycarbide material has a self-rectification effect, thereby simplifying the design of an external circuit.
Owner:ZHEJIANG NORMAL UNIVERSITY
Thin film transistor, preparation method of thin film transistor and liquid crystal display panel
InactiveCN106847927AHigh on/off ratioIncrease opening ratioTransistorSolid-state devicesInsulation layerLiquid-crystal display
Owner:TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
Light sensing circuit and driving method thereof, display panel and display device
ActiveCN109686301AFacilitate thinningSensitive to lightStatic indicating devicesElectricityLight sensing
The invention discloses a light sensing circuit and a driving method thereof, a display panel and a display device, belonging to the technical field of display. The light sensing circuit comprises that: the gate of a first transistor is electrically connected to a first control terminal, the first pole is electrically connected to a first voltage terminal, and the second pole is electrically connected to a first node; the gate of a second transistor is electrically connected to the first node, the first pole is electrically connected to a second voltage terminal, and the second pole is electrically connected to the first pole of a third transistor; the gate of the third transistor is electrically connected to a second control terminal, and the second pole is electrically connected to a data line; the gate of a fourth transistor is electrically connected to a third control terminal, the first pole is coupled to the first node, and the second pole is electrically connected to a third voltage terminal; the first transistor and the fourth transistor comprise active layers formed of metal oxide, and the fourth transistor is multiplexed into a light sensing element; and the second transistor and the third transistor comprise active layers formed of polysilicon. Compared with the prior art, the invention is advantageous to reduce the process steps and thin the display panel.
Owner:XIAMEN TIANMA MICRO ELECTRONICS
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