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49results about How to "High depth resolution" patented technology

Full-field three-dimensional measurement method

A method and system for full-field fringe-projection for 3-D surface-geometry measurement, referred to as “triangular-pattern phase-shifting” is disclosed. A triangular grey-scale-level-coded fringe pattern is computer generated, projected along a first direction onto an object or scene surface and distorted according to the surface geometry. The 3-D coordinates of points on the surface are calculated by triangulation from distorted triangular fringe-pattern images acquired by a CCD camera along a second direction and a triangular-shape intensity-ratio distribution is obtained from calculation of the captured distorted triangular fringe-pattern images. Removal of the triangular shape of the intensity ratio over each pattern pitch generates a wrapped intensity-ratio distribution obtained by removing the discontinuity of the wrapped image with a modified unwrapping method. Intensity ratio-to-height conversion is used to reconstruct the 3-D surface coordinates of the object. Intensity-ratio error compensation involves estimating intensity-ratio error in a simulation of the measurement process with both real and ideal captured triangular-pattern images obtained from real and ideal gamma non-linearity functions. A look-up table relating the measure intensity-ratio to the corresponding intensity-ratio error is constructed and used for intensity-ratio error compensation. The inventive system is based on two-step phase-shifting but can be extended for multiple-step phase-shifting.
Owner:UNIVERSITY OF WATERLOO

Full-field three-dimensional measurement method

A method and system for full-field fringe-projection for 3-D surface-geometry measurement, referred to as “triangular-pattern phase-shifting” is disclosed. A triangular grey-scale-level-coded fringe pattern is computer generated, projected along a first direction onto an object or scene surface and distorted according to the surface geometry. The 3-D coordinates of points on the surface are calculated by triangulation from distorted triangular fringe-pattern images acquired by a CCD camera along a second direction and a triangular-shape intensity-ratio distribution is obtained from calculation of the captured distorted triangular fringe-pattern images. Removal of the triangular shape of the intensity ratio over each pattern pitch generates a wrapped intensity-ratio distribution obtained by removing the discontinuity of the wrapped image with a modified unwrapping method. Intensity ratio-to-height conversion is used to reconstruct the 3-D surface coordinates of the object. Intensity-ratio error compensation involves estimating intensity-ratio error in a simulation of the measurement process with both real and ideal captured triangular-pattern images obtained from real and ideal gamma non-linearity functions. A look-up table relating the measure intensity-ratio to the corresponding intensity-ratio error is constructed and used for intensity-ratio error compensation. The inventive system is based on two-step phase-shifting but can be extended for multiple-step phase-shifting.
Owner:UNIVERSITY OF WATERLOO

Three-dimensional display using variable focal length micromirror array lens

A three-dimensional display device includes a two-dimensional display displaying a depthwise image, and a variable focal length micromirror array lens receiving light from the two-dimensional display and forming a corresponding image in the required location in space. Each depthwise image represents a portion of an object or scene having the same image depth, and the two-dimensional display displays one depthwise image at a time. The focal length of the variable focal length micromirror array lens changes according to the depth of the depthwise image being displayed. The variable focal length micromirror array lens has enough speed and focusing depth range for the realistic three-dimensional display.
Owner:STEREO DISPLAY

Method and apparatus for three-dimensional compositional mapping of heterogeneous materials

InactiveUS6873419B2Rapid and accurate three-dimensional compositionalRapid and accurate depth profileAnalysis by thermal excitationUsing optical meansCoherence lengthLaser ablation
Laser ablation combined with spectrometric analysis is a good tool for determining the composition of heterogeneous materials. By measuring the depth of an ablation crater at a target of a heterogeneous material, it is possible to generate a compositional profile as a function of the depth. It is also possible to generate a 3 dimensional profile by depth profiling of a plurality of craters. The depth measurement is conducted in situ and in real time so that the evolution of composition as a function of the depth can be measured. An interferometric technique with a short coherence length light is one of the preferred embodiments for measuring the depth in situ and in real time.
Owner:NAT RES COUNCIL OF CANADA

Adjustable frequency domain optical coherence chromatography imaging method and system thereof

The invention relates to a frequency domain optical coherence chromatography imaging method and a system thereof with adjustable detection depth range and depth resolution ratio; a variable cycle grating is used for frequency domain optical coherence chromatography imaging, and the light spectrum detection depth and the light spectrum detection resolution ratio of a frequency domain interference signal are changed by adjusting the grating period and the lateral position of the detector, so as to realize the frequency domain optical coherence chromatography imaging with adjustable frequency domain optical coherence chromatography imaging. The invention can be matched with the usage of a wide spectral width light source, the problem that the pixel array length of the detector is limited when the spectral width is wider, and different imaging requirements of uses for obtaining large detection depth range or / and deeper depth resolution ratio can be met.
Owner:SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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