402 results about "Test tests" patented technology

A system for coordinating the timing of a data strobe with data supplied by a memory module to the memory controller read data FIFO of a processor-based system, providing multiple calibration modes. A calibration PDL (programmable delay line) is used to reiteratively test the time taken for a test data strobe to traverse a portion of the memory controller circuit, and to generate a calibration value based upon the time taken. The calibration procedure may be initiated in any one of several modes, including: according to a predetermined schedule; implemented in software; in response to changes in environmental factors such as temperature or voltages sampled at one or more locations; in response to a software-driven trigger; or in response to a user-initiated trigger, communicated to a system of the invention either by input via a user interface to the processor-based system or by a software command.

An apparatus for testing semiconductor devices allows various testing processes, including a burn-in process, to be performed at the same testing stage. Test trays which contain the semiconductor devices are used throughout an in-line system so that an entire back-end process can be performed without loading / unloading the semiconductor devices between the various tests. The in-line system includes multiple test and burn-in apparatuses as well as a single sorting unit which performs a composite sorting operation after all the testing processes. A method for testing semiconductor devices in the in-line system includes testing the semiconductor devices in the test trays using the test and burn-in apparatus, transferring the test trays to a different testing apparatus for a second testing, and finally sorting the semiconductor devices after all testing processes have been performed based on a final sorting map created by combining test tray maps generated during each of the tests.

A test and burn-in apparatus for semiconductor chip package devices, an in-line system which includes the test and burn-in apparatus, and a test method which employs the in-line system are provided. A test and burn-in apparatus for testing semiconductor devices allows various testing processes, including a burn-in process, to be performed at the same testing stage. The apparatus employs test trays which contain the semiconductor devices. These test trays are used throughout the in-line system so that an entire back-end process can be performed without the need for loading / unloading the semiconductor devices into and from device trays between the various tests. The test and burn-in apparatus according to this invention can therefore occupy less space than the prior art testing apparatuses. The in-line system includes multiple test and burn-in apparatuses as well as a single sorting unit which performs a composite sorting operation after all the testing processes have been performed. Furthermore, the method for testing the semiconductor devices in the in-line system includes testing the semiconductor devices in the test trays using the test and burn-in apparatus, generating a test tray map corresponding to results of the test, transferring the test trays to a different testing apparatus for a second testing and test tray map generation process, and finally sorting the semiconductor devices in the sorting unit after all testing processes have been performed based on a final sorting map created by combining the test tray maps of each of the tests. The benefits of this invention are reduced time and space requirements because neither transferring the devices to device trays between tests nor performing multiple sorting steps are required.

A computer system for generating a diagnostic tool by applying artificial intelligence to an instrument for diagnosis of a disorder, such as autism. For autism, the instrument can be a caregiver-directed set of questions designed for an autism classification tool or an observation of the subject in a video, video conference, or in person and associated set of questions about behavior that are designed for use in a separate autism classification tool. The computer system can have one or more processors and memory to store one or more computer programs having instructions for generating a highly statistically accurate set of diagnostic items selected from the instrument, which are tested against a first test using a technique using artificial intelligence and a second test against an independent source. Also, a computer implemented method and a non-transitory computer-readable storage medium are disclosed.

A device, method and / or computer-readable medium for testing an application within a test framework includes a framework controller associated with the test framework installed on a master device and a test driver associated with the test framework installed on one or more client devices. The master device is connected to the one or more client devices and a virtual machine (VM) module is installed on each of the one or more client devices. VMs can be created on the client devices and the application is installed on at least one of the VMs. The application is executed on the VMs according to a test scenario file. The framework controller collects data to generate an output result.

The invention discloses a method and a device for preparing a silty soil triaxial-test test sample. The method comprises the following steps: adding distilled water into silty soil and stirring to enable soil samples to be in a flow plastic state, namely slurry; precipitating the slurry in a split round die under the action of self weight; applying dead loads to the upper part of the test sample, removing the dead loads at the upper part of the test sample and enabling the test sample to be further solidified by adopting a vacuum negative pressure of minus 40 kPa, wherein in the process of applying the dead loads, to guarantee that the slurry does not overflow, the loads are slowly and gradually loaded and a next-stage load is applied after the soil samples complete solidification and drainage under a current load; and finally, removing the negative pressure and the split round die and completing preparation of the test sample, so that triaxial test equipment can be assembled to carry out static triaxial or dynamic triaxial test. The method and the device are simple to operate; the technical method is easy to master; equipment required for preparing the test sample is very simple; required test sample preparation cost is low; uniformity inside the soil samples is very good; reproduction degree between the soil samples is high; a microstructure of a soil layer in the nature can be reproduced to a higher degree; the soil samples do not need to be cut; disturbance is reduced; and the test result has high credibility.

An integrated circuit chip is provided that comprises on-chip memory and test circuitry. The test circuitry is configured to perform operational testing of the on-chip memory. The test circuitry comprises a controller which is configured to perform a selection out of a plurality of test algorithms to perform the operational testing. The plurality of test algorithms includes a fault detection test algorithm to perform operational testing of the on-chip memory in order to detect whether or not there is a memory fault, without locating the memory fault. The plurality of test algorithms further includes a fault location test algorithm to perform operational testing of the on-chip memory in order to detect and locate a memory fault. Further, a method to perform a memory built-in self test and an MBIST (Memory Built-In Self Test) control circuit template are provided.

A method of testing and repairing an integrated circuit having a total number of fuses for effecting repair of the integrated circuit. The method including: testing a memory array with a set of tests and reserving a first number of the total number of fuses for use in repairing the memory array based on results of the first set of tests; and shmoo testing the memory array by incrementing, decrementing or incrementing and decrementing values of a test parameter until a minimum or maximum value of the test parameter is reached that utilizes a second number of the total number of fuses for use in repairing the memory array to operate at the minimum or maximum value of the test parameter.

The invention discloses an ERP software automated testing system. The ERP software automated testing system comprises an initialization module, a use case analysis module, a form processing module, a test scheduling module, an error monitoring module and a report integration module. The initialization module is used for reading configuration file information. The use case analysis module is used for loading test use cases according to the configuration file information and analyzing and testing test logic between an involved ERP form and various forms. The form processing module is used for loading and testing the involved ERP form and acquiring test objects and data in the form. The test scheduling module is used for scheduling the needed test objects and data for testing according to the test logic between the forms. The error monitoring module is used for monitoring and testing abnormal conditions in the scheduling execution process and determining whether to carry out processing or not, if yes, corresponding processing is carried out; and if not, the test objects and data in the last testing node is tested again. The report integration module is used for automatically generating test reports and distributing the reports to related interfaces according to the test results of the test scheduling module and combined with the abnormal conditions monitored by the error monitoring module.

An apparatus for testing electric characteristics of a test object including first connection terminals on a bottom surface and second connection terminals on a top surface, the apparatus comprises a test board comprising first pads on a predetermined surface; a socket configured to electrically connect the test object to the test board; and a handler configured to transport the test object to the socket. The socket comprises a first connection unit configured to be electrically connected to the first connection terminals of the test object and a second connection unit configured to be electrically connected to the second connection terminals of the test object.