The invention relates to a
magnetism measuring method in the field of optical technology measurement. A method for measuring
magnetism of a surface
nanostructure adopts a measuring device comprising alaser, a delayer, a quarter wave plate, a concave lens, a convex lens I, a
plane mirror, a
polarizer, a
beam splitter, a convex lens II, a lens table, an atomic force
microscope I, a probe I, a lensholder, an objective lens, a sample, a Hall plate, a sample table, a
signal generator, an
oscilloscope, a
detector, a
magnet, a
preamplifier, a
differential amplifier, a compensator, an analog-digitalconverter, a computer, an atomic force
microscope II and a probe II, wherein the
magnet is formed by connecting four identical sub-
magnet cables. A high-precision positioning device is used to obtainmagnetization information of a surface of a nanometer sample, so that the single
nanostructure can be measured; the measurement on
magnetization dynamics of the surface of the sample can achieve a spatial resolution at a sub-micron level; nanoscale
magnetization dynamic characteristics can be obtained without extracting information of micro-
magnetization fluctuation of the surface of the sample by depending on a phase sensitivity detection technology.