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78results about How to "Guaranteed Signal Integrity" patented technology

Novel microwave three-dimensional integrated system-in-package interconnection structure

The invention discloses a novel microwave three-dimensional integrated system-in-package interconnection structure. The microwave three-dimensional integrated system-in-package interconnection structure comprises a substratum medium substrate, a microstrip line, a grounded metallization hole array, a millimeter wave monolithic integrated circuit and a silicon substrate, and the grounded metallization hole array, the millimeter wave monolithic integrated circuit and the silicon substrate are arranged on substratum medium substrate; grounded planar metal is arranged on the grounded metallizationhole array, and the millimeter wave monolithic integrated circuit is arranged between a silicon substrate and grounded planar metal; a cavity is formed in the silicon substrate above a sensitive position of the millimeter wave monolithic integrated circuit; the microstrip line is connected with the millimeter wave monolithic integrated circuit through a planar transmission line. Compared with traditional golden wire bonding, the interconnection size among chips is obviously reduced, which is beneficial to maintenance of signal integrity during transmission of radio frequency and high-speed digital signals.
Owner:NO 55 INST CHINA ELECTRONIC SCI & TECHNOLOGYGROUP CO LTD

Substrate based bumped flip chip CSP (Chip Scale Package) package part, substrate and manufacturing method

The invention discloses a substrate based bumped flip chip CSP (Chip Scale Package) package part, a substrate and a manufacturing method. The package part comprises the substrate and an IC (Integrated Circuit) chip which is inversely installed on the substrate; padding is filled between the substrate and the IC chip; the substrate comprises a substrate middle layer with an upper surface and a lower surface provided with printing lines; the substrate middle layer is provided with a plurality of cylindrical lateral walls which are connected with the printing lines; the upper face and the lower face of the substrate middle layer are provided with substrate bonding pads which are connected with the printing lines. The substrate is manufactured by procedures such as drilling, electrofacing, paving a dry film, exposing and developing with an FR-4 copper-clad plate or a BT substrate serving as substrate raw materials. The CSP package part is obtained by passivating a wafer; forming a UBM layer on the chip bonding pad; coating photoresist; duplicating patterns on a photoresist layer; forming into a stannum / plumbum metal layer; obtaining welding bumped points through backflow; inversely install the chip; melting the welding bumped points; downward filling and obtaining a CSP package part. The package part solves the problems that lead bonding package high-frequency electrical performance is poor and thermal expansion between the ceramic substrate and the PCB is large in mismatch during the existing IC package circuit connection.
Owner:TIANSHUI HUATIAN TECH

A single pulse generation circuit and a bidirectional level conversion circuit

The invention provides a single pulse generation circuit and a bidirectional level conversion circuit. The single pulse generation circuit comprises a first signal input end, a second signal input end, a port detection module and a single pulse generation module, The port detection module is used for outputting a high level when at least one of the first signal input end and the second signal input end is at a low level, and outputting a low level when both the first signal input end and the second signal input end are at a high level, so that the output of the single pulse generation module is accelerated to turn to a high level; The single pulse generation module is used for generating a single pulse when any one of the first signal input end and the second signal input end is overturnedfrom a low level to a high level; When the first signal input end and the second signal input end are both turned over to high levels, transmission power consumption is reduced, and impedance matching performance and signal integrity of the output port are guaranteed at the same time.
Owner:SHANGHAI AWINIC TECH CO LTD

Simulation method and system and wiring structure of DDR circuit

The invention is applicable to the field of DDR SDRAM technology and provides a simulation method and system and a wiring structure of a DDR circuit. The simulation method comprises the steps that layout wiring design is performed on the DDR circuit to obtain the wiring structure of the DDR circuit, wherein the wiring structure comprises a signal wiring layer and a reference plane; a wiring location with an impedance value lower than a preset impedance threshold in the signal wiring layer and the impedance value of the wiring location are determined; according to the impedance value of the wiring location, a hollow-out area at the wiring location of the reference plane is determined; and layout wiring design is performed on the DDR circuit again, and the wiring location of the reference plane is hollowed out according to the hollow-out area. Through the embodiment, target impedance of a signal link on the signal wiring layer can be continuous, so that the signal integrity of the DDR circuit is guaranteed, and the signal quality of the DDR circuit is improved.
Owner:OPPO CHONGQING INTELLIGENT TECH CO LTD

Test method achieving USB 2.0 High Speed controlled packet sending

The invention discloses a test method achieving USB 2.0 High Speed controlled packet sending. The method comprises the following steps that 1, a control script sends an api call instruction to a controller in PCH; 2, the controller enters a test mode after receiving the instruction, and a to-be-tested port code pattern is sent automatically; 3, an USB2.0 test fixture is connected to a server to test a to-be-tested port; 4, a differential probe is connected to the USB 2.0 test texture, and a waveform document is obtained; 5, a high-speed oscilloscope captures and analyzes the waveform document; 6, according to corresponding template comparison, whether the port meets the standard or not is judged. Accordingly, the process that a server motherboard is connected with a network card, and the system is controlled remotely through a computer to send a packet is omitted, the labor, resources and time are saved, and the test efficiency is improved.
Owner:ZHENGZHOU YUNHAI INFORMATION TECH CO LTD

Signal testing device

The invention discloses a signal testing device. The device comprises a main board and a testing clamp, wherein the testing clamp is connected with the main board; the testing clamp comprises an interlayer connector and a PCIE slot, the interlayer connector is connected with the main board, and the interlayer connector is further connected with the PCIE slot. According to the device, the interlayer connector is connected with the PCIE slot so that various testing of non-standard PCIE interface signals of the interlayer connector can be achieved through the designed testing clamp, and the signal integrity of a communication link can be effectively ensured.
Owner:中科曙光信息产业成都有限公司 +1

Precise depth-controlled groove milling-based manufacture method of microwave printed circuit board

The invention discloses a precise depth-controlled groove milling-based manufacture method of a microwave printed circuit board. The method includes the following steps that: a stepped groove is formed in a production board by means of depth-controlled groove milling, and the groove bottom of the stepped groove is located in a dielectric layer at the upper part of a copper layer at the inner sideof a Rogers high-frequency board; electroless copper plating and full-board electroplating treatment are performed on the production board, so that the groove bottom and groove wall of the stepped groove are plated with a copper layer; the production board is coated with a film, and an outer layer pattern is formed on the production board by means of explosion and development, pattern plating is performed on the production board; a plated layer at the bottom of the stepped groove is removed by means of milling, so that the dielectric layer at the bottom of the stepped groove is exposed; the dielectric layer at the bottom of the stepped groove is burned through laser, so that the copper layer at the inner side of the Rogers high-frequency board is exposed; and adhesive removing treatment isperformed on the production board, and the copper layer exposed at the bottom of the stepped groove is removed by means of alkaline etching. With the method of the invention adopted, the zero damageof the Rogers high-frequency board is realized, and the signal integrity of a high-frequency and high-speed printed circuit board during signal transmission can be ensured.
Owner:SHENZHEN SUNTAK MULTILAYER PCB

Spiral resonant ring ultra-wideband simultaneous switching noise suppression power distribution network

The invention discloses a spiral resonant ring ultra-wideband simultaneous switching noise suppression power distribution network, and aims to provide a power distribution network having the advantages of simple structure, high engineering realizability, no need of slotting a power supply plane, no need of any periodical electromagnetic band gap structure and large simultaneous switching noise suppression depth. The technical scheme for realizing the power distribution network is characterized in that a printed circuit board (PCB) structure is adopted for the power distribution network; local isolating structures are positioned in areas where a noise source input circuit and a noise sensitive circuit on a power supply plane structure are positioned respectively, and etched with spiral resonant rings; the spiral resonant rings are etched on the power supply plane according to a power supply plane distribution structure in order to isolate simultaneous switching noise between a power supply and a ground plane; and an attenuation band is formed in a band frequency band through the resonant effects of the spiral resonant rings in conjunction with coupling resonance among the power supply plane, a ground plane metal layer and a dielectric layer, so that a transmission path of the simultaneous switching noise is blocked; surface waves are suppressed; and the simultaneous switching noise is suppressed.
Owner:10TH RES INST OF CETC

Signal testing system

The invention discloses a signal testing system. According to the system, all signals in a to-be-tested MXM interface can be smoothly connected to a connector in a one-to-one correspondence manner through a switching MXM interface and a connecting line, and a signal obtaining device can obtain a to-be-tested PCIe signal outputted by the to-be-tested MXM interface through the connector through theconnection with the connector, so that the signal quality of the PCIe signal to be tested can be tested, the signal quality problem of the PCIe signal can be discovered in time, the signal integrity of a PCIe link of a system to be tested is ensured, and the normal use of a graphics processor is ensured.
Owner:LANGCHAO ELECTRONIC INFORMATION IND CO LTD

Method for reducing impedance mismatching degree under condition of discontinuous returning path

The invention provides a method for reducing an impedance mismatching degree under the condition of a discontinuous returning path. A grooving line is arranged on a reference plane of a bottom layer; a top layer is a signal layer with transmission lines; distances among the transmission lines on a portion above the grooving line are smaller than distances among the transmission lines of the rest portion; distances among differential signal lines of which the widths are 40 micrometers and the distances are 40 micrometers on a portion above the grooving line are changed into 32 micrometers from 40 micrometers; and specific numerical values of the distances among the transmission lines on the portion above the grooving line are handled through simulating software so as to obtain data in which impedance performance is improved optimally. The distances among the transmission lines on the portion above the grooving line, namely the transmission lines with discontinuous impedance, are reduced, so that differential mode impedance of the portion can be reduced and is close to differential mode impedance of lines at a position without the grooving line as much as possible. Specific reduced numerical values of the specific distances among the transmission lines need to be determined through simulation. Suitable parameters are selected through simulation so as to guarantee impedance continuity of the transmission lines, and signal integrity is guaranteed.
Owner:FUZHOU ROCKCHIP SEMICON

Cable connector and connector assembly

The invention discloses a cable connector. The cable connector comprises a shell, a conductive terminal set arranged in the shell and a cable electrically connected with the conductive terminal set. The front end of the shell is provided with a plug-in groove, the conductive terminal group comprises a first terminal strip and a second terminal strip which are symmetrically arranged on the upper side and the lower side of the plug-in groove, and the first terminal strip and the second terminal strip are both composed of a plurality of conductive terminals. Each conductive terminal comprises a main body part, a contact part formed by bending from the front end of the main body part, and a welding part formed by extending backwards from the rear end of the main body part; and the welding part of the first terminal row and the welding part of the second terminal row are arranged in parallel. And the distance between the welding part of the first terminal strip and the welding part of the second terminal strip is 1-2.5 times of the minimum distance between the contact part of the first terminal strip and the contact part of the second terminal strip. The cable connector provided by the invention can avoid signal interference between the terminal strips to the greatest extent while meeting the requirement of low size, thereby ensuring the signal integrity of a product.
Owner:AMPHENOL ELECTRONICS ASSEMBLY XIAMEN CO LTD

Unique identification device for object carrying trolley of logistics sorting machine and identification method thereof

PendingCN111112096AGuaranteed Signal IntegrityReduce the increase in failure rateSortingComputer visionEngineering
The invention discloses an unique identification device for an object carrying trolley of a logistics sorting machine and an identification method thereof. The device comprises an object carrying trolley unique identity ID device, an object carrying trolley unique identity ID detection device and a signal identification device; the object carrying trolley unique identity ID device is installed onthe object carrying trolley, and a plurality of long strip-shaped through holes are formed in the lower portion of the rectangular flat plate structure, the object carrying trolley unique identity IDdetection device is installed at a sorting port position of the sorting machine, the object carrying trolley unique identity ID detection device comprises an optical coupling infrared transceiving sensor, and when the object carrying trolley unique identity ID device passes from the optical coupling infrared transceiving sensor, an infrared receiver can receive infrared light signals emitted by the infrared transmitter at intervals; the signal identification device judges the unique identity ID of the object carrying trolley by identifying a plurality of time data of a plurality of different intervals of signals of the optical coupling infrared transceiving sensor, any electric device does not need to be installed on the object carrying trolley, and namely, whether the object carrying trolley needs to be sorted or not can be judged by actively identifying and detecting the unique identity of the object carrying trolley through the sorting port.
Owner:辽宁黑北健科技有限公司

Chip architecture and signal integrity test method

The invention discloses a chip architecture and a signal integrity test method.The chip architecture comprises a plurality of modules to be tested and a test module, the test module comprises a function register, a data register and a state register, and when the test module receives a test instruction of a communication link of any one module to be tested, the function register is connected with the data register; and configuring the function register and the data register corresponding to the test instruction according to the test instruction, so that the state register and / or the pin of the to-be-tested module output a test result. The chip does not need to be installed on a mainboard, the signal test result of the communication link of each to-be-tested module can be obtained directly according to the test module in the chip architecture, the process is simple and rapid, the test cost is low, the test range is clear, the test effects of different to-be-tested modules can be accurately and rapidly determined, and the test efficiency is improved. And the signal integrity of the chip is ensured.
Owner:山东云海国创云计算装备产业创新中心有限公司
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