The invention provides a process method for eliminating micro
short circuit in the production of a functional sheet by using a megohmmeter. The invention relates to the technical field of functional piece micro-
short circuit elimination. The method comprises the following steps: S1, preparing a jig, S2, measuring by using a universal meter, S3, selecting a
voltage value of the megohmmeter, S4, contacting and binding two pointers of the megohmmeter with pad, S5, eliminating impurities of micro
short circuit, S6, observing by using a high-definition video
microscope, S7, performing a function test, S8, selecting the
voltage of the megohmmeter, and S9, eliminating short circuit defects. In the present invention, the micro short circuit can influence touch accuracy and
linearity, the program debugging is also an NG item; a functional sheet is a defective product when the micro short circuit occurs; if the micro short circuit cannot be repaired, the functional piece needs to be scrapped, the process can eliminate the micro short circuit, greatly improve the
first pass yield of functional piece production and reduce the
rejection rate, and compared with an old process, the impurities ofthe micro short circuit are ablated through the megohmmeter easily and quickly, the accuracy is high, and secondary badness, for example, a circuit is
cut off when a short circuit position is
cut offis not likely to be caused.