Process method for eliminating micro short circuit in production of functional sheet by using megohmmeter

Abstract

The invention provides a process method for eliminating micro short circuit in the production of a functional sheet by using a megohmmeter. The invention relates to the technical field of functional piece micro-short circuit elimination. The method comprises the following steps: S1, preparing a jig, S2, measuring by using a universal meter, S3, selecting a voltage value of the megohmmeter, S4, contacting and binding two pointers of the megohmmeter with pad, S5, eliminating impurities of micro short circuit, S6, observing by using a high-definition video microscope, S7, performing a function test, S8, selecting the voltage of the megohmmeter, and S9, eliminating short circuit defects. In the present invention, the micro short circuit can influence touch accuracy and linearity, the program debugging is also an NG item; a functional sheet is a defective product when the micro short circuit occurs; if the micro short circuit cannot be repaired, the functional piece needs to be scrapped, the process can eliminate the micro short circuit, greatly improve the first pass yield of functional piece production and reduce the rejection rate, and compared with an old process, the impurities ofthe micro short circuit are ablated through the megohmmeter easily and quickly, the accuracy is high, and secondary badness, for example, a circuit is cut off when a short circuit position is cut offis not likely to be caused.

Description

technical field [0001] The invention relates to the technical field of eliminating micro-short circuits of functional chips, in particular to a process method for eliminating micro-short circuits in the production of functional chips by using a megohmmeter. Background technique [0002] For micro-short circuits in the production of functional sheets, first use a high-definition video microscope to check and confirm the location of the short-circuit, and then use a sharp blade to cut off the short-circuit under the high-definition video microscope. Because the line spacing and width of the silver paste line are relatively large, the cutting is not bad. easy. [0003] The difficulty of this process is to find the location of the short circuit, because the micro-short circuit is generally caused by dust and debris in the air, silver paste debris, fiber debris that appears during production, employee hair and dandruff, etc. Due to the connection, micro-short circuit is difficul...

AI Technical Summary

Problems solved by technology

[0004] The purpose of the invention provided by the present invention is to provide a process method for eliminating micro-short circuits in the production of functional chips by using a megohmmeter. position, and can solve the problem that the micro-short circuit with a width of silver paste line below 130um cannot be cut with a sharp blade

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