265 results about "Scaling circuits" patented technology

A semiconductor device according to an aspect of the present invention has: a plurality of memory cells MC; a plurality of word lines WL each coupled to a corresponding one of the plurality of memory cells MC; and a control circuit that intermittently monitors accesses to the plurality of word lines WL, stores/erases some captured row-addresses in a first number of registers, and detects, by comparison with stored addresses, in response to a first number of accesses to one of the word lines WL in a first period of time. According to the present invention, access histories can be precisely analyzed by a small-scale circuit configuration, and measures against, for example, the Row Hammer problem, etc. can be taken.

Nanowire growth in situ on a planar surface, which is one of a crystalline surface having any crystal orientation, a polycrystalline surface and a non-crystalline surface, is controlled by guiding catalyzed growth of the nanowire from the planar surface in a nano-throughhole of a patterned layer formed on the planar surface, such that the nanowire grows in situ perpendicular to the planar surface. An electronic device includes first and second regions of electronic circuitry vertically spaced by the patterned layer. The nano-throughhole of the patterned layer extends perpendicularly between the regions. The first region has the planar surface. The device further includes a nanowire extending perpendicular from a catalyst location on the planar surface of the first region in the nano-throughhole. The nanowire forms a component of a nano-scale circuit that connects the regions.

An algorithmic or cyclic data converter uses an RSD stage having a switched capacitor network for efficiently scaling at least one externally supplied reference voltage. A reference voltage is scaled by using capacitor ratios that also function to provide an output voltage used as a residue output of the RSD A/D converter. The residue is used to generate a bit value corresponding to the magnitude of the residue. Two RSD stages cycle back and forth generating a logic value each half clock cycle until the desired bit resolution is achieved. In one form, the RSD stage scales the externally supplied reference voltage only by factors of less than one. In another form, the RSD stage scales the reference voltage by any scaling factor. A reference voltage scaling circuit separate from the RSD stage is avoided.

A circuit for generating drive signals (SHR, SHG and SHB) from an input image signal (SIN), a cell array (1) including a light emitting element (EL) for emitting light of a predetermined color of red (R), green (G) or blue (B) by being applied with a drive signal (SHR, SHG and SHB) supplied for each color from the circuit (2), an adjustment information retrieve means (4) for obtaining information relating light emission adjustment of the light emitting element (EL), and a level adjustment circuit (2B) provided in the circuit (2) for changing a level of an RGB signal (S22) before divided to drive signals (SHR, SHG and SHB) for the respective RGB colors based on the information obtained by the adjustment information retrieve means (4) are provided. In the present invention, color balance adjustment can be performed by the above small scale circuit.

A harmonic rejection mixer includes a first scaling circuit for scaling an RF signal to generate a plurality of scaled RF signals, a first switching stage for sampling the scaled RF signals using a first plurality of switching signals, and a second mixing stage for mixing the sampled RF signals with a second plurality of switching signals to generate a plurality of frequency translated signals having different phases. A combiner adds the frequency translated signals together to generate a first plurality of baseband versions of the RF signal. A first amplifier stage processes the first plurality of baseband versions to generate a second plurality of baseband versions. The mixer further includes a second scaling circuit for scaling the second plurality of baseband versions and a second amplifier stage to generate an in-phase baseband signal and a quadrature baseband signal from the scaled second plurality of baseband versions.

The invention discloses a method for detecting radial motion error of a high-speed principal axis by adopting a multi-circle superposition three-point method. Three laser displacement sensors are distributed around the high-speed principal axis which is provided with an angle encoder that has N lines and is connected with a scaling circuit; when the scaling circuit counts for Z times in an accumulating way and Z can not be divided exactly by N, the scaling circuit outputs sampled signals, and a trigger sensor implements sampling once; by repeating in this way, the principal axis is evenly distributed with n points for sampling by rotating the principal axis for a plurality of times to complete a sampling period; after every time of sampling, the sampling value is transmitted to an industrial computer through a USB interface and is then recorded; according to the requirements of detection accuracy, the sampling work having a plurality of sampling periods is carried out, the average sampling value of n points of every laser displacement sensor is calculated, and the deviation from circular form, the eccentric error and radial turning error of the principal axis which are obtained by separation are calculated. The method is not sensitive to the performance of the laser displacement sensor and is suitable for detecting radial motion error of the high-speed principal axis.

An epoxy resin mold plastic and its production are disclosed. The mold plastic consists of liquid-crystal epoxy resin, methyl-phenolic epoxy resin, epoxy resin containing biphenyl unit structure, melamine modified linear phenolic resin, silicone micro-powder, imidazo curing improver, toughening agent and silane coupling agent. The process is carried out by treating silicone micro-powder in mixer by coupling agent for 2-5mins, adding into other components, mixing for 3-5mins, melt milling at 95-135 degree for 3-5mins, cooling, crushing, mesh screening, pressing into material cake and storing below 6degree. Its advantages include low thermal expansion coefficient, excellent heat and fire resistances, better toughness and fluidity, no phosphor, no antimony and environmental pollution. It can be used to pack large-scale circuit and electronic devices.

According to embodiments, amplitude for a stimulation pulse delivered to electrodes implanted within a patient is controlled by a scale circuit and a digital-to-analog converter. The scale circuit selects one of a plurality of overlapping, different sized stimulation pulse amplitude ranges while the digital-to-analog converter selects an amplitude within the selected range. Stimulation pulse amplitude adjustment resolution scales automatically with the selected range, and a lowest range including the desired amplitude is automatically selected.

A TDC circuit having a small scale circuit and high resolution is disclosed, which is a time-to-digital converter that detects a phase with respect to a reference clock of a signal to be measured, comprising a first delay line in which a plurality of first delay elements with a first delay amount is connected in series, a second delay line group that is connected to a plurality of connection nodes of the first delay line or an input node in the first stage and in which at least one or more second delay elements with a second delay amount different from the first delay amount are connected in series, a plurality of judgment circuits that judge whether the changing edge of the signal to be measured is advanced or delayed with respect to the changing edges of a delayed clock output from the first delay element and the second delay element, and an operation circuit that calculates a phase with respect to the reference clock of the changing edge of the signal to be measured from the judgment results, wherein a difference between the first delay amount and the second delay amount is smaller than the first delay amount and the second delay amount.

PCT No. PCT/EP96/01143 Sec. 371 Date Sep. 5, 1997 Sec. 102(e) Date Sep. 5, 1997 PCT Filed Mar. 13, 1996 PCT Pub. No. WO96/28950 PCT Pub. Date Sep. 19, 1996A device for determining the quality of an output signal to be generated by a signal processing circuit with respect to a reference signal. The device is provided with a first series circuit for receiving the output signal and a second series circuit for receiving the reference signal. The device generates an objective quality signal through a combining circuit which is coupled to the two series circuits. Poor correlation between the objective quality and subjective quality signals, the latter which will be assessed by human observers, can be considerably improved by a differential arrangement present in the combining circuit. This arrangement determines a difference between the two series circuit signals and reduces this difference by a certain value, preferably one that is a function of a series circuit signal. Poor correlation can be improved further by disposing a scaling circuit, between the two series circuits, for scaling at least one series circuit signal. Furthermore, the quality signal can also be scaled as a function of the scaling circuit.

In a signal processing system, a set of channel signals from an array of sensors of different operating characteristics are processed in calibration circuitry that calculates individual average values of the channel signals and calculates an average of the individual average values of channel signals as a reference value. Reciprocal calculators calculate reciprocal values of the individual average values of the channel signals. Scaling circuitry scales the reciprocal values by the reference value to produce a set of amplitude calibration signals and scales the channel signals by the calibration signals respectively. As a result, the channel signals are normalized by their own average values and scaled by the reference value to produce a set of calibrated channel signals.

The invention provides a circuit level single event effect simulation platform. The simulation platform can support single event effect simulation analysis of large-scale circuits of 10,000 gate levels or above. The simulation platform comprises a circuit analysis module, a fault injection configuration module, an analysis mode module, a netlist processing module and a result analysis module, wherein the circuit analysis module extracts all sensitive nodes in circuits to generate a circuit node list file; the fault injection configuration module combines the circuit node list file and fault current source-related parameters which are input by a user and need to be injected into the circuits to write a script and randomly select circuit nodes and fault injection time to generate a fault injection file; the netlist processing module writes a script to obtain a result detection file, and combines analysis modes and the fault injection file to generate a stimulus file to be sent to a Fast-Spice simulator; the result analysis module saves and extracts simulation results, and forms different result icons according to different analysis modes.

With the object of accurately reproducing, by means of a small-scale circuit, differences in propagation delay at antennas of received signals that are received as input by way of each of a plurality of receivers, frequency data generator 6 supplies frequency data that contain a frequency component that is synchronized in common to the plurality of receivers 2-1 to 2-n. At receiver 2-n, local oscillation signal generator 3-n, which is represented by a D/A converter, generates a local oscillation signal from frequency data that have been synchronized in common. The passing phase of a received signal that is outputted from antenna 1-n by way of receiver 1-n is thus fixed, and as a result, the phase difference of received signals that are received by DSP 8 by way of the plurality of receivers 2-1 to 2-n becomes the propagation delay difference of the received signals. As frequency data, frequency data that contain a plurality of frequency components are supplied to each receiver 2-n, and the frequency data are selected inside receiver 2-n and subjected to quadrature modulation to enable generation of local oscillation signals of differing intermediate frequencies.

Carbon nanotube (CNT)-based devices and technology for their fabrication are disclosed. The discussed electronic and photonic devices and circuits rely on the nanotube arrays grown on a variety of substrates, such as glass or Si wafer. The planar, multiple layer deposition technique and simple methods of change of the nanotube conductivity type during the device processing are utilized to provide a simple and cost effective technology for a large scale circuit integration. Such devices as p-n diode, CMOS-like circuit, bipolar transistor, light emitting diode and laser are disclosed, all of them are expected to have superior performance then their semiconductor-based counterparts due to excellent CNT electrical and optical properties. When fabricated on Si-wafers, the CNT-based devices can be combined with the Si circuit elements, thus producing hybrid Si-CNT devices and circuits.

The invention relates to a circuit reliability evaluating method based on the signal probability. The method includes reading an integrated circuit gate level netlist, analyzing the netlist to acquire connection structures of gate nodes, and providing a segmentation algorithm to segment the circuit into a plurality of modules; allowing each module to be one sub circuit, utilizing the PTM method onto the sub circuits, and calculating the reliability of each module sequentially; evaluating the reliability of the entire circuit according to the principle of calculating the independent event joint probability through the module reliability product. By the aid of the segmentation algorithm, the majority of modules are guaranteed being free of redundancy on functions and overlap on structures. The problem that only small-scale circuits can be evaluated by a PTM method is optimized, and the evaluating method can be applied to large-scale circuits; in addition, the TP method, the EPP method and the optimized PTM method are integrated to develop a circuit reliability evaluating platform which can be applied to the circuit designing step to calculate the reliability, and the designed structure can be adjusted conveniently and timely.

A method for conducting a device proton signal-event test through an accelerator high-energy proton comprises the steps that test samples are processed and the requirements of a signal-event test board and the requirements for selection of high-energy proton energy, the fluence rate and the fluence are satisfied. Single event upset of a large-scale circuit tends to be sensitive along with the increase of the integration degree and the reduction of the feature size. Single event upset can be generated through the method that a nuclear reaction of the proton occurs or the proton is directly ionized. An electronic system fault probably caused by single event upset happens to an on-orbit satellite. The method is used for conducting the device proton single event upset test on the ground. According to the method, the proton single event upset sensitivity of a key device for the satellite can be evaluated, proton single event upset sensitive parameters of the device can be obtained, a basis is provided for anti-radiation reinforcing design of the satellite, and the method for conducting the device proton signal-event test through the accelerator high-energy proton has important significance in the guarantee of the reliability of the new-generation satellite.

It is configured by plurality of NAND circuits connected in series through a plurality of inverters, and a plurality of NOR circuits connected in series through the plurality of inverters. Each of a plurality of source signal lines provided in a pixel portion is connected to one input terminal of a NAND circuit and a NOR circuit, and an output of an inspection is obtained from final lines of the NAND circuit and the NOR circuit connected in series. In this manner, an inspecting circuit which is capable of determining a defect simply and accurately by using a small-scale circuit, and a method thereof are provided.