The invention relates to a temperature variable spectral
measurement device, which comprises an excitation
light source, an
integrating sphere, a
temperature control sample stage, a temperature controller and a
detector. Specifically, the temperature controller is used for controlling the temperature of the
temperature control sample stage, the excitation
light source and the
integrating sphere and the
integrating sphere and the
detector are all connected through
optical fiber. The excitation light sent by the excitation
light source is introduced into an integrating sphere entrance port of the integrating sphere through
optical fiber and is incident to the
temperature control sample stage, the light sent by a sample placed on the temperature
control sample stage or the light reflected by the temperature
control sample stage when no sample is placed thereon is collected by
optical fiber through an integrating sphere exit port and is then introduced into the
detector, by comparing the difference of emission spectra detected by the detector when a sample is placed and no sample is placed, the
luminescence quantum yield can be calculated, thereby realizing measurement of sample
luminescence. By combining the excitation light source and the detector, the temperature variable spectral
measurement device provided by the invention can realize measurement of the temperature variable
emission spectrum,
quantum yield and other optical properties of a
luminescent material.