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225 results about "Critical regions" patented technology

Critical Region. Critical Region refers to a set of values that will cause a researcher to conclude that the treatment or intervention she applied has a significant effect on the variable being investigated. Values that fall in the Critical Region signify that the results obtained represent a real difference, and could not have occurred by chance.

Methods and systems for inspecting reticles using aerial imaging and die-to-database detection

Methods and systems for inspecting a reticle are provided. In an embodiment, a method may include forming an aerial image of the reticle using a set of exposure conditions. The reticle may include optical proximity correction (OPC) features. The method may also include detecting defects on the reticle by comparing the aerial image to a reference image stored in a database. The reference image may be substantially optically equivalent to an image of the reticle that would be printed on a specimen by an exposure system under the set of exposure conditions. The reference image may not include images of the OPC features. Therefore, a substantial portion of the defects include defects that would be printed onto the specimen by the exposure system using the reticle under the set of exposure conditions. The method may also include indicating the defects that are detected in critical regions of the reticle.
Owner:KLA TENCOR CORP

Medical image reporting system and method

This invention relates generally to medical imaging and, in particular, to a method and system for reconstructing a model path through a branched tubular organ. Novel methodologies and systems segment and define accurate endoluminal surfaces in airway trees, including small peripheral bronchi. An automatic algorithm is described that searches the entire lung volume for airway branches and poses airway-tree segmentation as a global graph-theoretic optimization problem. A suite of interactive segmentation tools for cleaning and extending critical areas of the automatically segmented result is disclosed. A model path is reconstructed through the airway tree.
Owner:PENN STATE RES FOUND

Incremental method for critical area and critical region computation of via blocks

An efficient computer implemented method computes critical area for via blocks in Very Large Scale Integrated (VLSI) circuits. The method is incremental and takes advantage of the hierarchy in the design. In order to increase the efficiency further we use the Linfin or the L1 metric instead of the Euclidean geometry.
Owner:GLOBALFOUNDRIES INC

Vehicle attitude controller

A vehicle attitude controller capable of improving turning operability, steering stability, and ride quality of a vehicle. In a normal-operation region, a pitch control unit for calculating a target pitch rate in accordance with a roll rate performs control in priority to a roll suppression section. In this case, a target damping force calculated in the pitch control unit is weighed to control a damping-force characteristic of the dampers so that a pitch rate becomes equal to the target pitch rate. In a critical region in which a road-surface gripping state of the vehicle tires is bad, the roll suppression section performs control in priority to the pitch control unit so as to weigh a target damping force calculated in the roll suppression section. As a result, the damping-force characteristic of the dampers is controlled so as to increase the amount of roll suppression control.
Owner:HITACHI ASTEMO LTD

Apparatus and methods for determining critical area of semiconductor design data

Disclosed are mechanisms for efficiently and accurately calculating critical area. In general terms, a method for determining a critical area for a semiconductor design layout is disclosed. The critical area is utilizable to predict yield of a semiconductor device fabricated from such layout. A semiconductor design layout having a plurality of features is first provided. The features have a plurality of polygon shapes which include nonrectangular polygon shapes. Each feature shape has at least one attribute or artifact, such as a vertex or edge. A probability of fail function is calculated based on at least a distance between two feature shape attributes or artifacts. By way of example implementations, a distance between two neighboring feature edges (or vertices) or a distance between two feature edges (or vertices) of the same feature is first determined and then used to calculate the probability of fail function. In a specific aspect, the distances are first used to determine midlines between neighboring features or midlines within a same feature shape, and the midlines are then used to determine the probability of fail function. A critical area of the design layout is then determined based on the determined probability of fail function. In specific implementations, the defect type is a short type defect or an open type defect. In a preferred implementation, the features may have any suitable polygonal shape, as is typical in a design layout.
Owner:KLA TENCOR TECH CORP

Image type automatic analysis method for mesh adhesion rice corn

InactiveCN101281112AOvercoming problems that are difficult to analyze automaticallyRemove the restriction of non-stick placementImage analysisMaterial analysis by optical meansAutomatic segmentationSplit lines
The invention discloses an image automatic analysis method for reticulate adhesion rice. The method firstly images rice under the grade of a reference backlight, and enables the reticulate adhesion rice to belong to the different local regions separately through an automatic segmentation. Secondly, the automatic segmentation includes that fat circular rice is carried on a distance transformation and a watershed transformation to be divided, as well as to use a circular template to get the concave angle point of long rice after the long rice is carried out watershed transformation, and the separation line can be determined and the wrong separation line can be removed according to the concave angle point. Different colors is using to color complete polished rice, broken rice and the rice whose length is in the critical region and to color background and chalkiness so as to figure out the grain number, the length, the width and the length to width ratio of each grain, finally, and the entire polished rice rate, the broken rice rate, the chalkiness degree and the chalkiness grain rate, and to form an analysis report. The invention overcomes the problem that the reticulate adhesion rice is difficult to be carried on automated analysis, and removes the limit of the request analysis sample is not in adhesion placing.
Owner:ZHEJIANG SCI-TECH UNIV

Golf club head with improved aerodynamic characteristics

Designs and methods of improving aerodynamic performance of golf club heads are disclosed herein. In particular, the designs and methods of the present invention address airflow behavior modification at or immediately adjacent to the counter or edge of the striking face to reduce club head drag while minimizing any adverse effect on the impact performance of the face. The present invention also provides a face with visually distinct and apparent treatments and improved visibility at address. The approaches to contouring a golf club face disclosed herein are new because they are confined to a relatively narrow band along the inside of the face boundary curve. The dimensions of the modification zone are kept small and subtle contour changes are made to influence airflow in a highly critical region with minimal effect on the impact performance of the striking surface.
Owner:CALLAWAY GOLF CO
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