120results about How to "Improve test throughput" patented technology

A digital communications test system and method for testing a plurality of devices under test (DUTs) in which multiple sets of a single vector signal analyzer (VSA) and single vector signal generator (VSG) can be used together to perform error vector magnitude (EVM) measurements for one or more DUTs in parallel, including one or more of composite, switched and multiple input multiple output (MIMO) EVM measurements. This allows N pairs of a VSA and VSG to test N DUTs with N×N MIMO in substantially the sane time as a single VSA and VSG pair can test a single DUT, thereby allowing a substantial increase in testing throughput as compared to that possible with only a single VSA and VSG set.

A system and method for testing and calibrating integrated sensor devices that improves the manufacturing test throughput of the devices. The system includes a tester, a temperature controller, and at least one probe station including a thermal chuck. The chuck can be heated to specified temperatures to achieve variable heating of a wafer, PCB, or pallet disposed thereon. The temperature controller adjusts the temperature of the chuck to a first specified level. The tester performs at least one first measurement of the output offset of each integrated sensor embodied as a die on the wafer, or as a device on the PCB or pallet. Next, the temperature controller adjusts the temperature of the chuck to a second specified level, and the tester performs at least one second measurement of the output offset of each integrated sensor at the second temperature level. The offset temperature coefficient (OTC) of each sensor is calculated based upon the output offset measurements performed at the first and second temperature levels, and optimal settings for calibrating the respective sensors are determined based upon the calculated OTC values. After the temperature of the chuck is brought back down to the first specified level, the tester programs the output offset calibration settings into each sensor.

An Application Specific Distributed Test Engine (ASDTE) that provides an optimized set of test resources for a given application. The test engine resources, configuration, functionality, and even the number of test engines can be changed as different devices are tested, or as different test methodologies are used with the system. This can be done by including the test engine configuration as a part of the application files that are loaded during the system set-up. This approach differs from conventional testing systems which limit testing to a fixed, limited, or standard stimulus / response engine configuration intended to test a variety of devices. Some of the benefits of the Application Specific Distributed Test Engine Architecture include: (1) a very high test throughput, (2) the ability to adapt system functionality and capabilities to meet different and new, unforeseen device test requirements on a lot-by-lot basis on a production test floor, and (3) the ability to change the number of test engines to optimize tester channels and system utilization.

Automatic test equipment for testing non-deterministic packet data from a device-under-test is disclosed. The automatic test equipment includes a memory for storing expected packet data and a receiver for receiving the packet data from the device-under-test. A data validation circuit is coupled to the receiver for validating non-deterministic packet data based on the expected packet data from the vector memory.

A method for identifying potentially defective integrated circuit chips and excluding them from future testing as wafers move through a manufacturing line The method includes data-collecting steps, tagging the chips on wafers identified as potentially bad chips based on information collected as the wafer moves down the fabrication line, evaluating test cost savings by eliminating any further tests on the tagged chips preferably using a test cost database. Considering all the future tests to be preformed, the tagged chips are skipped if it is determined that the test cost saving is significant. Tagging bad chips is based on various criteria and models which are dynamically adjusted by performing the wafer final test on samples of the tagged chips and feeding-back the final test results. The dynamic adaptive adjustment method preferably includes a feedback loop or iterative process to evaluate financial tradeoffs when assessing the profit of salvaging chips against the additional test costs.

The invention discloses a chemiluminescence immunoassay system, as well as a method and an application thereof. The chemiluminescence immunoassay system comprises a fluid control unit as well as a three-dimensional motion sample feeding platform, a temperature control unit, a magnetic field control module and an optical detecting module, wherein the three-dimensional motion sample feeding platform, the temperature control unit, the magnetic field control module and the optical detecting module are connected with each other in sequence; and the fluid control unit is connected with the temperature control unit. The chemiluminescence immunoassay system disclosed by the invention has the advantages as follows: with a capillary tube as a reactor, reagent transportation and reaction are both carried out in a water-in-oil type liquid drop by using a capillary tube liquid drop technology, so that a stable reaction condition is kept, and crossed pollution between samples and reaction suppression caused by surface adsorption are effectively avoided. The chemiluminescence immunoassay system disclosed by the invention has the advantages of small size, high assay speed, high testing flux, automatic operation and flexibility in application and is suitable for analyzing single sample, batch samples and field rapid assay; medical demands of the masses can be preferably satisfied; meanwhile, the purchasing and operation cost of equipment is obviously reduced, and excellent social and economic benefits are obtained.

The invention discloses an integrated circuit test informatization management system based on industrial Internet, which comprises an equipment interconnection and data source fusion module subsystem,a resource management system subsystem, a big data intelligent analysis subsystem and a similar unmanned workshop industrial-grade APP application system. According to the integrated circuit test information management system based on the industrial Internet, rich and rapid online services can be provided, the test efficiency can be improved, the test capacity can be improved, and all states (including a test prober, a test machine, test data and information charting) of a cleanliness workshop can be integrated on the information system in real time.

The invention discloses a capillary bioanalysis system, and an analytical method and applications thereof, and belongs to the field of medical equipment and biological detection technologies. The capillary bioanalysis system comprises a three-dimensional movement sample injecting platform, a temperature control-optical detection module, a magnetic field control module, a fluid control unit and a capillary array. The three-dimensional movement sample injecting platform and the fluid control unit are arranged on the two sides of the capillary array, and the capillary array is provided with the temperature control-optical detection module and the magnetic field control module. According to the capillary bioanalysis system, the droplet technology and the magnetic bead technology are combined, and bioanalysis processes such as loop-mediated isothermal amplification, fluorescence quantitative PCR analysis and immunochemiluminometry are integrated in capillaries. Advantages of the capillary bioanalysis system are that: volume is small, analysis speed is fast, detecting flux is large, and automation degree of operation is high. The capillary bioanalysis system is flexible in application, is suitable for analysis of single sample, batches of samples and on-site rapid detection, is capable of reducing acquisition cost and operation cost of equipment significantly, and possesses excellent economic benefits.

Apparatus used in an automatic test equipment, comprising a plurality of system modules. Each system module comprises a Time Measurement Unit. The Time Measurement Unit comprises a Global Time Stamping Module. The Global Time Stamping Module comprises a plurality of Global Time Stamping Cores that comprising: an information receiving section for receiving at least two information, an event receiving section for receiving at a Core Input events, an event determining section for determining events of interest from said received events appearing on said Core Input, and an instructing section for instructing a Time Stamp Memory to record a current status of a Time Stamp Counter corresponding to the Clock Information, if an event of interest is determined. The Global Time Stamping Module further comprises a supplying section for supplying said plurality of Global Time Stamping Cores with a common time base.

A microfluidic exosome profiling platform integrating exosome isolation and targeted proteomic analysis is disclosed. This platform is capable of quantitative exosomal biomarker profiling directly from plasma samples with markedly enhanced sensitivity and specificity. Identification of distinct subpopulation of patient-derived exosomes is demonstrated by probing surface proteins and multiparameter analyses of intravesicular biomarkers in the selected subpopulation. The expression of IGF-1R and its phosphorylation level in non-small cell lung cancer (NSCLC) patient plasma is assessed as a non-invasive alternative to the conventional biopsy and immunohistochemistry. Detection of ovarian cancer also is assessed. The microfluidic chip, which may be fabricated of a glass substrate and a layer of poly(dimethylsiloxane), includes a serpentine microchannel to mix a fluid and a microchamber for the collection and detection of exosomes.

A sample reagent dispensing device, comprising a conveying unit (10), an accommodating unit (20), a first dispensing station (30) located on the periphery of the accommodating unit (20), a second dispensing station (201) located on the accommodating unit (20), a dispensing unit (40) and a control unit. An immunity analyzer, comprising the above-mentioned sample reagent dispensing device, a cleaning unit and an optical detection unit. In the present application, a first reaction component and a second reaction component are respectively dispensed in the first dispensing station (30) and the second dispensing station (201), thereby realizing the parallel operation of the dispensation of the first reaction component and other operation of the accommodating unit (20), and improving the test efficiency; when the second reaction component is dispensed, it is not necessary to convey a reaction vessel out of the accommodating unit (20), thereby simplifying the test steps and flow; the arrangement of the dispensing unit (40) thereof is no longer limited to the periphery of the accommodating unit (20), and the first dispensing station (30) and the second dispensing station (201) can be separately distributed, thereby avoiding the limitation and interference between dispensing units (40) in space.

The invention discloses an IC (Integrated Circuit) plastic-package body voltage withstand test clamp which comprises a fixed base, a pressing plate and a guide pillar, wherein at least one bearing body which is used for placing a whole IC plastic-package body is arranged on the fixed base; the bearing body is internally provided with a plurality of first metal gaskets which are arranged at intervals and electrically connected with the cathode of a voltage withstand tester; a second metal gasket which is connected with the anode of the voltage withstand tester is also arranged on the fixed base; and the pressing plate is arranged on the guide pillar and is capable of moving up and down relative to the guide pillar. The invention discloses two plastic-package body voltage withstand test methods. According to the clamp and the methods, a voltage withstand test can be carried out on the whole IC plastic-package body before products are subjected to trimming and forming, so that the test efficiency is improved and the voltage withstand test can be carried out on a plurality of IC plastic-package bodies at the same time.

The invention discloses a method for testing WIFI modules in parallel. The method comprises the following steps that a parallel testing system is established; to-be-tested devices, that is, the WIFI modules are calibrated; after calibration is completed, the to-be-tested devices are tested; multiple devices can be tested simultaneously when testing is conducted, the to-be-tested devices are tested in a staggered and parallel mode or tested in a freely scheduled and parallel mode, the testing time is effectively shortened, the waiting time of an operator is shortened, and the testing efficiency is improved; and after testing is completed, a testing result is obtained by printing a testing report or is stored in a controller and displayed in a display screen of the controller. According to the method, structural design is simple and reasonable, operation is convenient, the testing efficiency is improved, the device cost is reduced, time and effort are saved, multiple to-be-tested devices can be detected simultaneously, and the method is safe, stable, wide in application range and beneficial for popularization.

The invention discloses an IC feeler mechanism to do multiple paralleling particle placements simultaneously, which comprises the following parts: material supplying box, material-receiving box, input end IC transmitting mechanism, output end IC transmitting mechanism, testing part, transmitting tool and orbit transmitting mechanism, wherein the input end IC transmitting mechanism sucks the detected IC on the material supplying box to the transmitting tool to bear multiple particles of the detected IC; the transmitting tool utilizes orbit transmitting mechanism to transmit the transmitting tool into the testing part through orbit, which testes multiple particles of IC to move out the transmitting tool after testing; the output end IC transmitting mechanism classifies each tested IC in the transmitting tool to place in each receiving box. The invention reduces the exchanging, placing and depositing time of IC greatly, which improves the testing property effectively.

A system and method for testing a semiconductor integrated circuit (IC) in parallel includes a probe chuck, a test head, and a test controller. The probe chuck loads a plurality of different types of semiconductor DUTs. The test head provides a plurality of circuit sites to independently and simultaneously test the different types of semiconductor DUTs, and the test controller controls the test head and the probe chuck.

The invention relates to a semiconductor assembly pressure testing device and testing equipment. The semiconductor assembly pressure testing device comprises a plurality of pressure testing units and a rotary plate unit. Each pressure testing unit comprises a support frame, an upper test base and a lower test base. The rotary plate unit comprises a pivot shaft, a rotary plate and a plurality of floating test bases, wherein each floating test base is connected with the rotary plate through a plurality of elastic pieces. The rotary plate rotates so as to impel each floating test base to be located between an upper test base and a lower test base correspondingly. The lower test base comprises a heating device and a heat conducting plate which are fixedly arranged on the lower test base. Each pressure testing unit supplies different test pressure and temperature so as to continuously test each semiconductor assembly in different temperature and pressure environments. Therefore, the semiconductor assembly testing device can be provided for a semiconductor assembly to be tested to be continuously transported and tested among a plurality of pressure testing units, thereby significantly improving the test capacity.

A system and method for testing and calibrating integrated sensor devices that improves the manufacturing test throughput of the devices. The system includes a tester, a temperature controller, and at least one probe station including a thermal chuck. The chuck can be heated to specified temperatures to achieve variable heating of a wafer, PCB, or pallet disposed thereon. The temperature controller adjusts the temperature of the chuck to a first specified level. The tester performs at least one first measurement of the output offset of each integrated sensor embodied as a die on the wafer, or as a device on the PCB or pallet. Next, the temperature controller adjusts the temperature of the chuck to a second specified level, and the tester performs at least one second measurement of the output offset of each integrated sensor at the second temperature level. The offset temperature coefficient (OTC) of each sensor is calculated based upon the output offset measurements performed at the first and second temperature levels, and optimal settings for calibrating the respective sensors are determined based upon the calculated OTC values. After the temperature of the chuck is brought back down to the first specified level, the tester programs the output offset calibration settings into each sensor.

The present invention relates to a three-axis magnetic test socket and magnetic teat system thereof, and particularly relates to a three-axis magnetic test socket capable of providing magnetic fields in three different axes and magnetic teat system thereof. In the three-axis magnetic test socket and magnetic teat system, three sets of coils wound the magnetic test socket are applied instead of solenoid of a traditional tester, which is large and only can provide a magnetic field in single axis, to employed different magnetic fields in three different axes for a DUT. Therefore, one-axis, two-axis, and three-axis magnetic test can be performed to the DUT by the three-axis magnetic test socket and magnetic teat system.

The invention belongs to the technical field of chemical examination of cigarette smoke and particularly discloses a method for simultaneously testing specific N-nitrosamine and polycyclic aromatic hydrocarbon of tobacco in main stream smoke of a cigarette on the basis of tip-microextraction. According to the method, a smoking machine is used for smoking the cigarette, a Cambridge filter is used for capturing the main stream smoke of the cigarette, a solution containing internal labels is used for extracting the filter, and an extracting solution is detected after being subjected to tip-micro solid-phase extraction purification. Compared with a standard method, the method is used for testing two compounds simultaneously, and the testing efficiency is improved; detection can be performed after tip-micro solid-phase extraction purification of the extracting solution of the smoke, and the method has the advantages of simplicity and convenience in operation, fastness and efficiency.

A coarse-fine two-stage leak detection is carried out on sealed, filled containers loaded into container holders or “pucks”. Failure of the first, coarse leak detection stage, e.g. a pressure-course or impedance or laser-absorption based leak detection stage, causes containers to be rejected together with their corresponding container holders. These are then separated, and the container holder is cleaned and dried before being returned to the system. Any leaking product from inside a grossly leaking container is thus retained within the container holder, thus reducing contamination of subsequent containers and their container holders, preventing such contamination from reaching the fine leak detection stage, e.g. a mass-spectrometer-based leak detection stage.

Apparatus are provided for fatigue testing ferroelectric material in a wafer, including an on-chip oscillator to provide a bipolar waveform to a ferroelectric capacitor formed in the wafer, as well as a switching system to selectively provide external access to the ferroelectric capacitor. Test methods are also provided, including measuring a performance characteristic of a ferroelectric capacitor in the wafer, providing a bipolar waveform to the ferroelectric capacitor for a number of cycles using an on-chip oscillator, and again measuring the performance characteristic after an integer number of cycles of the bipolar waveform.

An assay device includes a support, test elements arranged thereover, and a diverter defining a common sample addition area of the device. The diverter conducts respective portions of a fluidic sample from the area to each of the test elements. Another assay device includes the test elements, one a dry slide element, disposed over the support at least partly in proximity to each other to define a common sample addition area. Apparatus for analyzing a sample includes an assay device having the test elements, one a dry slide element. A controller operates a metering mechanism, to apply the sample to the assay device, an incubator, and a measurement device per a timing protocol to determine a characteristic of the sample. Methods for enabling an assay device to perform multiple tests based upon a single sample metering event include are also described.

A microfluidic exosome profiling platform integrating exosome isolation and targeted proteomic analysis is disclosed. This platform is capable of quantitative exosomal biomarker profiling directly from 30 μL plasma samples within approximately 100 minutes with markedly enhanced sensitivity and specificity. Identification of distinct subpopulation of patient-derived exosomes is demonstrated by probing surface proteins and multiparameter analyses of intravesicular biomarkers in the selected subpopulation. The expression of IGF-1R and its phosphorylation level in non-small cell lung cancer (NSCLC) patient plasma is assessed, as a non-invasive alternative to the conventional biopsy and immunohistochemistry. The microfluidic chip, which may be fabricated of a glass substrate and a layer of poly(dimethylsiloxane), can include a first capture chamber, a second capture chamber, a serpentine microchannel, a first microchannel, a second microchannel, a sample inlet, a buffer inlet, a bead inlet, at least a first connector channel, and a reagent inlet.

The invention discloses a system and a method for testing multi-user parallel of a locomotive switch power supply. A first direct current power supply, a second direct current power supply, an alternating current power supply, a first direct current load, a second direction current load, third to mth direct current loads and a detecting device are connected through a control bus; and n external interfaces are connected with the first direct current power supply, the second direct current power supply, the alternating current power supply, the first direct current load, the second direction current load, the third to the mth direct current loads and the detecting device through a lead and is connected with a computer through a control bus. The value of m is determined according to a maximum value of output numbers of the power supply of the switch to be tested; and n external interfaces are connected with the power supplies of n switches to be tested through n transition harnesses. A multi-user configuration mode is adopted in the computer and the computer comprises a plurality of user configuration modules. With the adoption of the system and the method, the technical problems that resource utilization rate is not high in the prior art, only one switch power supply of the locomotive is tested at one time and only one person is allowed to use the resource of a locomotive switch power supply testing system at one moment are solved.

The invention relates to a turnover testing module and a testing system thereof. The turnover testing module comprises at least one accommodating device such as a slot used for temporarily accommodating a tested assembly and also comprises a turnover mechanism used for turning over one or more axial turnovers. The turnover testing module combines a handler and a tester to form a turnover testing system, wherein the handler is used for picking up and placing the tested assembly to the turnover testing module, and the tester is used for respectively controlling the turnover testing module and the handler. Via the modularized design, the turnover testing module can be integrated into a traditional testing system and can be elastically replaced with other motion testing modules. The inventionnot only can reduce the cost and simplify the design, but also can increase the testing elasticity and the diversity so as to be beneficial to improving the testing capacity.