An integrated circuit test informatization management system based on the industrial Internet

Abstract

The invention discloses an integrated circuit test informatization management system based on industrial Internet, which comprises an equipment interconnection and data source fusion module subsystem,a resource management system subsystem, a big data intelligent analysis subsystem and a similar unmanned workshop industrial-grade APP application system. According to the integrated circuit test information management system based on the industrial Internet, rich and rapid online services can be provided, the test efficiency can be improved, the test capacity can be improved, and all states (including a test prober, a test machine, test data and information charting) of a cleanliness workshop can be integrated on the information system in real time.

Description

technical field [0001] The invention relates to the technical field of integrated circuit testing, and more particularly, to an information management system for integrated circuit testing based on the industrial Internet. Background technique [0002] At present, my country's integrated circuit industry is facing an important period of strategic opportunity, innovation and critical development. On the one hand, the adjustment of the global market structure is accelerating, the scale of investment is rising rapidly, and the market share is accelerating to the dominant enterprises; And chips are growing explosively, new formats such as the Internet, Internet of Things, and big data are developing rapidly, and new trends have emerged in the evolution of integrated circuit technology. [0003] Big data has been a very hot topic in recent years. When people talk about the opportunities and value brought by massive data in the Internet era, the integrated circuit industry ignores...

AI Technical Summary

Problems solved by technology

[0013] The present invention provides an integrated circuit test information management system based on the industrial Internet, which solves the problems of low efficiency of integrated circuit testing, high labor costs, and low test output in clean workshops such as 1,000, 100, and 10. , in order to solve the above technical problems, the specific technical solution adopted is:

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