The invention discloses a method that is used for quickly measuring the content of stibium, barium, arsenic, zinc, strontium and zirconium in a TFT substrate glass, realizes measurement on the basis of the inductively coupled plasma atomic emission spectrometry, comprises the steps of experimental condition preparation, sample processing, working curve plotting, interfering and eliminating, and building of the linear relation condition, the detection limit condition and the accuracy condition of the method, wherein, the experimental condition preparation comprises instrument selection, acidity selection and analyzing spectral line selection; the sample processing comprises test sample processing, blank test fluid processing and the measurement, the working curve plotting comprises configuration of a solution in the standard series and the plotting of the working curve; the interfering and eliminating comprises chemical, physical and spectral interfering, background removing and building of the related coefficient between each measured element and the linear relation between the working curves; the blank sample is continuously measured for 10 times, the detection limit of the method is obtained according to a formula, the sample of the same TFT substrate glass is repeatedly measured for 10 times, the precision experiment is implemented, and finally the labeled recovery experiment of the sample is implemented.