65results about How to "Improve defect detection performance" patented technology

The invention provides a defect detection method and device for a display panel. The detection method comprises the following steps: using various light of different colors to sequentially irradiate the display panel; acquiring a plurality of corresponding gray-scale pictures when the display panel is irradiated by the various light of different colors; and judging whether the display panel has defects or not, and the result is yes when the plurality of gray-scale pictures have gray-scale differences. Through the method, the defect detection capability of an optical defect detector to the display panel is improved and undetected errors are avoided.

The invention provides an image annotation method, device and system and a host, and relates to the technical field of image processing, and the method comprises the steps: obtaining a plurality of to-be-annotated two-dimensional images of a target object at different angles through a first camera; calculating pose parameters of the three-dimensional model of the target object corresponding to each two-dimensional image according to a pose transformation relationship between the three-dimensional model of the target object and the first camera; wherein the three-dimensional model is a model during modeling of the target object or a model constructed based on three-dimensional point cloud data of the target object; acquiring defect labeling information of the three-dimensional model; and projecting defect labeling information of the three-dimensional model to the two-dimensional images according to the pose parameters of the three-dimensional model corresponding to the two-dimensional images to obtain labeling results of the two-dimensional images. The labeling efficiency can be effectively improved, the labeling cost is reduced, and the quality of labeling results can be well unified, so that the defect detection effect of parts can be improved.

The invention discloses an air-coupled ultrasonic imaging method based on wavelet analysis and related algorithms. Imaging is carried out by using wavelet coefficients of a sub-band and related coefficients of a reference signal as characteristic quantities, enabling effective elimination measurement-induced white Gaussian noise and strength fluctuation noise of air-coupled ultrasonic transmitting signals and improving signal to noise ratio of an image. Meanwhile, whether small size defects exist or not is judged through minimum values of related coefficients, thus adaptively adjusting a smooth filter window, the size of the smooth window is enlarged upon a large defect size, thereby reducing background noise, the size of the window is reduced upon a small defect size, highlighting signal details and thereby implementing 'adaptive focusing' and improving the ability to detect small defects. The imaging method has a promising application prospect in the field of air-coupled ultrasonic detection.

An imaging system for inspection of a sample includes an illumination module, which irradiates a surface of the sample with pulsed optical radiation. A mechanical scanner translates at least one of the sample and part of the imaging system so as to scan an area irradiated by the pulsed optical radiation over the surface in order to irradiate successive, partially overlapping frames on the surface by respective successive pulses of the pulsed radiation. A collection module collects the optical radiation scattered from the surface so as to capture a sequence of images of the irradiated frames. A system controller varies a configuration of the imaging system in alternation between at least first and second different optical configurations in synchronization with the pulsed optical radiation.

Methods and systems for inspection of a specimen using different parameters are provided. One computer-implemented method includes determining optimal parameters for inspection based on selected defects. This method also includes setting parameters of an inspection system at the optimal parameters prior to inspection. Another method for inspecting a specimen includes illuminating the specimen with light having a wavelength below about 350 nm and with light having a wavelength above about 350 nm. The method also includes processing signals representative of light collected from the specimen to detect defects or process variations on the specimen. One system configured to inspect a specimen includes a first optical subsystem coupled to a broadband light source and a second optical subsystem coupled to a laser. The system also includes a third optical subsystem configured to couple light from the first and second optical subsystems to an objective, which focuses the light onto the specimen.

The present invention provides a method of correcting coordinates so as to quickly and properly arrange a sample in a field of view in a review apparatus for moving a sample stage onto the specified coordinates to review the sample. A review apparatus according to the present invention, which is a review apparatus for moving a sample stage onto coordinates previously calculated by a checking apparatus to review the sample, has a function of retaining a plurality of coordinate correction tables to correct a deviation between a coordinate value previously calculated by a checking apparatus and an actual sample position detected by the review apparatus. The review apparatus evaluates correction accuracy of the plurality of coordinate correction tables and applies one of the coordinate correction tables with the maximum evaluation value.

There is presented a system and method for detecting mobile device fault conditions, including detecting fault conditions by software operating on the mobile device. In one embodiment, the present invention provides for systems and methods for using a neural network to detect, from an image of the device, that the mobile device has a defect, for instance a cracked or scratched screen. Systems and methods also provide for, reporting the defect status of the device, working or not, so that appropriate action may be taken by a third party.

There is presented a system and method for detecting mobile device fault conditions, including detecting fault conditions by software operating on the mobile device. In one embodiment, the present invention provides for systems and methods for using a neural network to detect, from an image of the device, that the mobile device has a defect, for instance a cracked or scratched screen. Systems and methods also provide for, reporting the defect status of the device, working or not, so that appropriate action may be taken by a third party.

The invention relates to an unsupervised defect detection and positioning method based on multilevel feature reconstruction. The method comprises the following steps: acquiring a non-abnormal image of a product and abnormal images of different types of defects; extracting a multi-scale feature group by using a non-abnormal image input feature extraction network; inputting the feature of the highest dimension into a reconstruction network to reconstruct new feature groups corresponding to different scales layer by layer; constructing a loss function training reconstruction network for the two feature groups; and in the test stage, an anomaly graph and an anomaly score are calculated according to the difference condition of the two feature groups and used for judging anomaly and positioning a defect area. According to the method, the feature information difference of the non-abnormal image and the abnormal image in different dimensions is effectively utilized, and the defect area of the product can be detected, so that manual labeling is avoided, and the product quality detection efficiency is improved.

The invention relates to a method for detecting the welding quality of a hot-melt even joint of a polyethylene pipeline and a detection device thereof. The aim of the invention is that the provided detection method and the detection device have the characteristics of high sensitivity, high detection precision, high reliability, high detection efficiency and low misoperation rate. The technical proposal is a method for the coupling focusing ultrasonic detection of the hot-melt even joint of the polyethylene pipeline, which comprises the following steps: (1) a coupling agent liquid is positioned on the outer surface of a pipeline joint fusion region; (2) an ultrasonic probe adopting a spherical curved wafer is immersed into the coupling agent liquid in order that the focus is positioned in the centerline of the pipeline joint fusion region; and (3) the ultrasonic probe does linear scanning motion along the diameter direction of the pipeline and does uniform scanning motion along the circumferential direction of the pipeline; and obtained signal data is processed by a computer to form a C scanning picture. The ultrasonic detection device comprises a coupling receiving device, the ultrasonic probe adopting the spherical curved wafer, a mechanical scanning device, a signal processing and controlling system, and the computer.