Defect inspection apparatus, and defect inspection method

A defect inspection and defect technology, applied in the direction of measuring devices, optical devices, and material analysis through optical means

Active Publication Date: 2015-04-29
SUMITOMO CHEM CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
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AI Technical Summary

Problems solved by technology

Therefore, the above-mentioned conventional defect inspection apparatus that inspects a defect of a sheet-shaped molded object using two-dimensional image data composed of a plurality of one-dimensional image data acquired by a line sensor has only a limited defect detection capability.

Method used

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  • Defect inspection apparatus, and defect inspection method
  • Defect inspection apparatus, and defect inspection method
  • Defect inspection apparatus, and defect inspection method

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Embodiment Construction

[0065] Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the drawings.

[0066] figure 1 It is a schematic diagram which shows the structure of the defect inspection apparatus 1 which concerns on one Embodiment of this invention. figure 2 It is a block diagram showing the configuration of the defect inspection device 1 . The defect inspection device 1 of the present embodiment is a device for detecting defects in a sheet-shaped molded article 2 of thermoplastic resin or the like. The defect inspection method of the present invention is executed by the defect inspection device 1 .

[0067] The sheet-shaped molded object 2 as the object to be inspected is formed by passing the thermoplastic resin extruded from the extruder through the gap between the rollers, performing treatments such as smoothing the surface or giving unevenness, and cooling on the conveying rollers. At the same time, it is pulled by the pull roller. ...

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Abstract

In a defect inspection apparatus (1), a processing image generation unit (61) calculates a feature quantity of each of pixels of two-dimensional image data, produced by an imaging device (5), by processing the two-dimensional image data with a predetermined algorithm. The processing image generation unit (61) extracts a pixel of a predetermined threshold value or more in the two-dimensional image data as a defect pixel. The processing image generation unit (61) generates processing image data such that the defect pixel is given a gradation value corresponding to the feature quantity while the remaining pixels other than the defect pixel are given zero gradation values. An analysis image generation unit (62) generates analysis image data consisting of one or a plurality of one-dimensional image data on the basis of the processing image data.

Description

technical field [0001] The present invention relates to a defect inspection device and a defect inspection method for inspecting defects of sheet-shaped molded objects such as polarizing films and retardation films. Background technique [0002] Conventionally, a defect inspection device inspects defects of sheet-shaped molded objects such as polarizing films and retardation films using a one-dimensional camera called a line sensor. The defect inspection device uses a line sensor (line sensor) to illuminate the sheet-shaped molded object with a linear light source such as a fluorescent tube, and uses a line sensor to move from one end of the long-side direction to the other along the long-side direction of the sheet-shaped molded object. One end scans the surface of the sheet-shaped formed body, and acquires a plurality of one-dimensional image data (still image data). Then, two-dimensional image data is generated by tiling a plurality of one-dimensional image data in order...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/892G01B11/00G01B11/30
Inventor 尾崎麻耶
Owner SUMITOMO CHEM CO LTD
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