58results about How to "Avoid charge accumulation" patented technology

The disclosure relates to waveforms, circuits and methods for driving bistable displays.

An electronic device includes a plurality of first wiring lines, a plurality of second wiring lines that intersect the plurality of first wiring lines, a plurality of unit circuits that are disposed so as to correspond to intersections between the plurality of first wiring lines and the plurality of second wiring lines, and a plurality of reference signal lines that supply reference signals to the plurality of unit circuits. Each of the plurality of unit circuits has a driven element that is driven by a driving voltage or a driving current, a driving unit that supplies the driving voltage or the driving current to the driven element, a switching element that controls electrical connection between an input terminal provided in the driving unit and one of the plurality of second wiring lines, and a capacitor element that has a first electrode connected to the input terminal and a second electrode connected to one of the plurality of reference signal lines, and accumulates a charge between the first electrode and the second electrode.

A cleaning system comprises a chamber and a particle-removing device. The particle-removing device, arranged outside the chamber, including an ionizer ionizing surrounding gas and spouting the ionized gas and a vacuum unit. Whereby, before an substrate is sent into the chamber, the ionized gas spouted from the ionizer neutralizes electrostatic charges and blowing up particles accumulate on the substrate and the particles are drawn away by the vacuum unit so that the object can be transmitted into the chamber much cleaner.

A conductive monofilament and static dissipative fabric having the same wherein the monofilament includes electrically conductive material and binder and has static dissipation properties.

The invention provides an analytical system having a separating system and a liquid chromatography chip. The liquid chromatography chip has an emitter that includes a material that prevents charge buildup on the emitter surface. Methods of using the analytical system, chip and emitter are also disclosed.

A method for treating a surface layer (3) of a device (1) consisting of alumina and a corresponding device (1) are proposed. The method comprises providing the device (1) with the surface layer (3) to be treated being exposed and heating the surface layer (3) of the device (1) in an oxygen-depleted atmosphere comprising e.g. one of an inert gas, nitrogen, hydrogen, argon and a combination thereof to a temperature higher than 1000° C., preferably higher than 1700° C. for a duration of preferably more than 2 hours. Due to such treatment, a superficial layer region (7) comprised in the surface layer (3) may obtain a significantly reduced electrical resistivity which is assumed to be the result of chemically reducing this superficial layer region (7). Such reduced superficial electrical resistivity may advantageously serve for example in components of electron beam devices such as x-ray tube components for preventing any charge build-up.

A total ionizing dose suppression architecture for a transistor and a transistor circuit uses an “end cap” metal structure that is connected to the lowest potential voltage to overcome the tendency of negative charge buildup during exposure to ionizing radiation. The suppression architecture uses the field established by coupling the metal structure to the lowest potential voltage to steer the charge away from the critical field (inter-device) and keeps non-local charge from migrating to the “birds-beak” region of the transistor, preventing further charge buildup. The “end cap” structure seals off the “birds-beak” region and isolates the critical area. The critical area charge is source starved of an outside charge. Outside charge migrating close to the induced field is repelled away from the critical region. The architecture is further extended to suppress leakage current between adjacent wells biased to differential potentials.

A method of manufacturing a semiconductor device is disclosed. The method provides a semiconductor substrate with at least a PMOS device and at least an NMOS device thereon. A first insulating layer is formed overlying the NMOS and PMOS devices. A second insulating layer is formed overlying the first insulating layer. The second insulating layer overlying the PMOS device is thinned to leave portion of the second insulating layer. A first thermal treatment is performed on the NMOS and PMOS devices. The second insulating layer overlying the NMOS device and the remaining portion of the second insulating layer overlying the PMOS device are removed and the first insulating layer overlying the NMOS and PMOS devices is thinned to leave a remaining portion thereof.

A SAW device comprises a single crystal piezo-electric strate (made, for example, of LiTaO₃ or LiNbO₃), and an interdigital transducer (IDT) formed of a material mainly containing Al and disposed on the piezo-electric substrate. The piezo-electric strate contains an additive (for example, Fe, Mn, Cu, Ti), and an orientation rotated by an angle in a range of 42° to 48°re preferably 46°±0.3°) from a Y-axis toward a Z-axis about an axis. The IDT presents a normalized thickness h/λ (h: thickness electrode, and λ: spacing between digits of the IDT) of 7% to 11%. A more appropriate substrate cut angle can be shown for the device which employs a piezo-electric substrate containing an additive, to improve the electric characteristics thereof.

An optical instrument includes a controller and a field head arranged for measuring the refractive index of a medium, or a derivable quantity therefrom. The field head includes a measurement prism having a medium-boundary surface, a first wave guide for providing broad-band light from a broad band light source, a dispersive element for dispersing the broad-band light into at least one component light beam of plural component light beams, so that each incident component light beam has a differently directed propagation path and at least one different wave length, and a condenser for collecting at least one component light beam reflected at the medium-boundary surface into a second wave guide. The dispersive element is arranged to direct at least one component light beam into a critical angle of total reflection from the boundary surface, and at least other light beam component into an angle leading into the condenser arranged to collect at least one other component light beam to be passed to a spectrometer. The controller of a field head includes a light source for providing poly-chromatic light into a first wave guide for forming a plurality of component light beams to propagate in the field head and a spectrometer for spectrum analysis of light inputted via at least one input wave guide from the field head.