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169 results about "Reflectron" patented technology

A reflectron (mass reflectron) is a type of time-of-flight mass spectrometer (TOF MS) that comprises a pulsed ion source, field-free region, ion mirror, and ion detector and uses a static or time dependent electric field in the ion mirror to reverse the direction of travel of the ions entering it. Using the reflectron, one can substantially diminish a spread of flight times of the ions with the same mass-to-charge ratio (m/z) caused by spread in kinetic energy of these ions measured at the exit from the ion source.

Raman-based utility optical amplifier

An optical amplifier with a flattened wideband response is obtained by coupling counter-propagating pumping energy into an optical waveguide to cause Raman amplification in the optical waveguide, and by reflecting an amplified signal received from the optical waveguide into an output waveguide using a reflector having a spectral characteristic that is complementary to the spectral gain characteristic of the Raman amplification.
Owner:JDS UNIPHASE CORP

Time-of-flight mass spectrometers with orthogonal ion injection

The invention relates to time-of-flight mass spectrometers, equipped with ion reflector and ion detector, with orthogonal ion injection and outpulsing of a segment of the ion beam perpendicular to the direction of injection in a pulser. The invention is directed to a time-of-flight mass spectrometer in which a reflector and an ion detector each have an angular offset about an axis that is perpendicular to the respective directions of injection and deflection. This allows a large distance to be used between the pulser and detector with the highest possible utilization of ions.
Owner:BRUKER DALTONIK GMBH & CO KG

Protein profiles with atmospheric pressure ionization

The invention relates to the acquisition of mass spectra of complex protein mixtures, often called protein profiles, for example to search for biomarkers which indicate stress situations, or to identify microbes. Up to now protein profiles have been acquired using ionization by matrix-assisted laser desorption with high detection sensitivity in linear time-of-flight mass spectrometers, but these display very poor mass resolution and a very poor reproducibility of the mass values. The invention provides methods which produce surprisingly similar mass spectra, but with far higher mass resolution and mass accuracy. Ionization takes place outside the vacuum at ambient pressure, preferably by means of laser desorption and CI post-ionization. Analysis of the ions takes place in a high-resolution mass spectrometer, for example a reflector time-of-flight mass spectrometer with orthogonal ion injection.
Owner:BRUKER DALTONIK GMBH & CO KG

Interferometer system and method to generate an interference signal of a surface of a sample

An interferometer system to generate an interference signal of a surface of a sample includes a broadband illuminator to provide a broadband illumination beam, a beam splitter to split the broadband illumination beam in a reference beam for reflection on a reference reflector and a measurement beam for reflection on the surface of the sample, and a detector to receive an interference radiation intensity created between the reference beam reflected from the reference reflector and the reflected measurement beam from the surface of the sample to generate an interference signal. The interferometer system having a continuous variable broadband reflector in the beam splitter and / or the reference reflector to adjust the broadband radiation intensity balance between the measurement beam and the reference beam.
Owner:MITUTOYO CORP
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