41results about How to "Test impact" patented technology

The invention discloses a ground testing device for an unfolding control mechanism of a space tied rope system. The ground testing device comprises a base, a rope unwinding mechanism, the unfolding control mechanism, a tension measuring mechanism, a speed measuring device, a rope winding mechanism and a display panel are arranged on the base, the rope unwinding mechanism, the unfolding control mechanism and the tension measuring mechanism complete tensioning and releasing of a tied rope on a base station spacecraft, the unfolding speed and the unfolding tension of the tied rope are changed by changing the friction force between the tied rope and a turbine shaft to control the unfolding process of the space tied rope system, and the speed measuring device, the rope winding mechanism and the display panel achieve the functions of measuring the tied rope speed, recycling the tied rope and setting and displaying parameters. The ground testing device has the advantages of being simple in structure, low in cost and suitable for the tied rope as long as 1 Km.

The invention discloses a TFT liquid crystal display screen lightening test fixture, which comprises a fixture base, a TFT test board, a fixture platform, an adapter plate and a placement assembly forcarrying out a fixing test, wherein the fixture platform is arranged above the fixture base, the TFT test board used for testing a display screen is installed between the fixture platform and the fixture base, the TFT display screen is placed at the end of the fixture platform, an installation groove is formed in the end face, where one side of the TFT display screen is located, of the fixture platform, an installation base is arranged in the installation groove, and the adapter plate is arranged above the installation base. The test fixture is in contact with a TFT liquid crystal display screen connector through a probe for testing. The rotary buckling mode is very convenient during connection. Moreover, the probe is not liable to be damaged during testing and can be continuously used, the testing efficiency is greatly improved, and the labor cost is saved. Meanwhile, a pushing plate can be buckled along with the adapter plate to protect the product connector, so that a good dustproof effect is achieved, the testing of the display screen is not affected at the same time, and the practical effect is remarkable.

The invention belongs to a micro-biosensor and particularly relates to a manufacturing method of a silica-based integratable micro-glucose sensor. The existing glucose sensor takes a glucose oxidase electrode as a device for molecular recognition and signal conversion, thus having poor stability and restricting the application of the glucose sensor on the basis of enzyme. The manufacturing method comprises the following steps of: manufacturing a silicon micro-channel by using a P-typed single-side polishing silicon wafer through electrochemical etching; depositing the silicon micro-channel in eletroplating solution without electricity at the temperature of 80 DEG C for 30-45 minutes; and taking out and washing the silicon micro-channel with deionized water, and obtaining the silica-based integratable micro-glucose sensor. The invention has the advantages that: the electrochemical process is adopted, the cost is low, and the operation is simple; the micro-channel has even porosity, and the ratio of the specific surface area to the depth is big; the eletroplating solution without electricity has simple preparation and low price; no influence on the glucose test is generated; three-dimensional structure is beneficial to the contact between the glucose and active substances, and the improvement of the oxidation current; and the micro-biosensor is beneficial to the exchange reaction of ions and is miniaturized and integrated, thus being beneficial to large-scale production.

The invention provides a vacuum high-low temperature semiconductor device test probe station, which relates to the technical field of semiconductor devices. The vacuum high-low temperature semiconductor device test probe station comprises a workbench body, a protective cover, a probe rod and a probe head, wherein moving mechanisms are fixedly connected to the two ends of the top surface of the workbench body, each moving mechanism comprises a moving box, and micro motors are fixedly connected to the side surfaces, away from each other, of the two moving boxes. According to the vacuum high-lowtemperature semiconductor device test probe station provided by the invention, as a clamping mechanism is arranged, the advantages of convenience in replacement and use is achieved, and the problems that a probe is troublesome to replace when an existing vacuum high-low temperature semiconductor device test probe station is used for replacing the probe and the replacement efficiency is low can besolved; and as a buffer mechanism is arranged, the conditions that the surface of the wafer is easily stabbed, the testing of the wafer is further influenced, the tested result cannot be accurate andthe normal judgment of the wafer is influenced when the wafer is tested are effectively avoided.

The invention discloses control method, device and system for inquiring a test result of a submarine cable line, wherein the method comprises the following steps of: receiving an inquiry request which is sent by an inquiry device and used for inquiring the test result of the submarine cable line; and judging whether the time difference between a time point of the received inquiry request and the time point of the test result generated at the last time is smaller than or equal to a preset feedback period, if so, supplying the test result of the last feedback period for the inquiry device, and otherwise, generating a current test result and supplying the current test result for the inquiry device. In the embodiment of the invention, the test result is newly generated only when the test result is not generated for a long time through the judgment for the time point of the inquiry request, and the test result of the last time is directly fed back to the inquiry device when the time from the inquiry request of the time to the test result generated at the last time is short, thereby avoiding the influence of the frequently generated test results on normal submarine cable test.

The invention belongs to the field of pharmaceutical packaging materials, and relates to a rubber / fluoroplastic composite resealing shock insulator and a preparation method thereof. The rubber / fluoroplastic composite resealing shock insulator comprises a rubber layer, an intermediate layer and a fluoroplastic layer; intermediate layer materials comprise one or more of organosilicon, silica gel andperfluoroalkylation; fluoroplastic layer materials comprise one or more of a perfluoroethylene propylene copolymer, polytetrafluoroethylene, an ethylene-tetrafluoroethylene copolymer and polyvinylidene fluoride; a fluoroplastic layer has a sub-micron micropore structure; and rubber layer materials comprise one or more butyl rubber, natural rubber, silicone rubber, fluororubber and epdm rubber. The preparation method of the rubber / fluoroplastic composite resealing shock insulator comprises the steps of composite film forming, preparation of the rubber layer, preparation of a coated film, vulcanization, cleaning, drying and the like.

The invention provides an acceleration amplitude online calibration system of a laser vibration system in a high temperature condition. The system comprises a standard vibrating device used for generating and outputting a standard sine vibration signal and calculating an acceleration of the standard sine vibration signal, a quartz lamp array used for placing and heating a standard test piece, a ceramic rod used for transmitting the standard sine vibration signal to the standard test piece and isolating the standard vibrating device and the quartz lamp array, and a laser polarization system used for testing an acceleration signal of the standard test piece, one end of the ceramic rod is connected with the standard vibrating device, and the other end of the ceramic rod is connected with thequartz lamp array. According to the system, the problem of transmission of the acceleration amplitude output by the standard vibrating device to a high temperature environment without loss is solved,the operating environment of a standard accelerometer is guaranteed to be in a normal temperature or a controllable state, and the metering guarantee requirement of a thermal modal test of an ultrasonic velocity air defense missile flat type thermal modal test system is met.

The invention discloses a sample testbed for EBSD (Electron Back-Scattered Diffraction) testing, relating to a sample testbed and solving the problems that, when being adhered to a sample testbed with a conductive adhesive, a sample will move in a testing process, the position of an image is likely to change, a back scattering region deviates, and the testing result is inaccurate. A guide rail is obliquely and fixedly arranged on the upper end surface of a base; a dovetail groove is machined in the upper end surface of the guide rail; an included angle between the length direction and the vertical direction of the dovetail groove of the guide rail is 70 degrees; the upper part of a sliding block is of a cuboid shape, and the lower part of the sliding block is of a dovetail shape; the lower part of the sliding block is positioned in the dovetail groove of the guide rail and is in sliding connection with the dovetail groove; an included angle between the upper end surface and the vertical direction of the sliding block is 70 degrees; the lower part of a limiting plate is detachably connected with the lower part of the guide rail; a jackscrew is arranged in the middle of the limiting plate, and one end of the jackscrew is in contact with the sliding block. The sample testbed disclosed by the invention is used for EBSD testing.

The invention relates to a testable design structure based on scanning confusing and used for protecting an encryption chip against scanning attacks. Based on a conventional scanning design structure,a scanning password register and an associated logic are introduced into a secure testable design structure, and it is required that test passwords are firstly loaded from a chip input port during testing. Chip testing can be performed normally only after correct test passwords are loaded. If an attacker does not understand a correct test procedure and does not have the correct test passwords, the attacker cannot load the correct test passwords through the specific input port within the specified time, and therefore no value can be swept for a scanning chain under the 1-2-128 probability, thereal state of the scanning chain cannot be observed from the output end, and non-intrusive attacks based on scanning are virtually impossible. On the premises that the circuit performance and the testing quality are not influenced and the testing time is not added, existing non-intrusive attacks based on scanning can be resisted.

The invention discloses novel automobile seat ventilation quantity measuring equipment and a measuring method. The measuring equipment comprises a seat saddle, a test box, a gas mass flow meter, a pressure difference sensor, a fan and a controller; the seat saddle is fixedly connected with one end of the test box; the test box is of a hollow structure, the end, connected with the seat saddle, of the test box is of an open structure, so that the interior of the test box is communicated with the seat saddle, the pressure difference sensor is installed in the test box, electrically connected withthe controller and used for transmitting pressure difference information to the controller, a ventilation opening is machined in the tail end of the test box, the ventilation opening is connected with the fan through a ventilation pipeline, the gas mass flow meter is installed on the ventilation pipeline, and the gas mass flow meter is electrically connected with the controller and used for measuring the mass of gas passing through the ventilation pipeline; and the fan is electrically connected with the controller, and the controller controls the fan to supplement air into the test box or exhaust air outwards from the test box. The measuring equipment is reasonable in structural design and can realize high-precision full-automatic measurement.

The invention relates to data processing, and provides a test data acquisition method and device, electronic equipment and a medium. The method comprises the steps of determining a to-be-tested systemand obtaining a logic instruction; the method comprises the steps of determining a to-be-tested function point according to a to-be-tested system, determining a data source according to the to-be-tested function point, obtaining data suitable for testing the to-be-tested function point by determining the to-be-tested function point, obtaining a data table from the data source, determining an association table associated with the data table, obtaining a first field of the data table, and obtaining a second field of the association table; splicing the first field and the second field accordingto the logic instruction, the query instruction is generated, non-test professionals can accurately obtain the data related to the test task by generating the query instruction, the test data is obtained through the query instruction, and the test data can be obtained without manual work from numerous and numerous data, so that the obtaining efficiency of the test data can be improved. In addition, the invention also relates to a blockchain technology, and the target data is stored in the blockchain.

The invention relates to a device and a method for detecting testing environment of a circuit. The detecting device mainly comprises a testing support plate, a slot and an antenna, wherein the testing support plate is positioned at the bottom of the detecting device; the slot is arranged on the testing support plate and used for fixing an element to be detected, such as an integrated circuit, and the element to be detected is electrically connected with the testing support plate; and the antenna is arranged on the testing support plate adjacent to the slot and used for receiving wireless signals and monitoring whether the testing environment has excessive foreign signals or not to influence the testing of the circuit.

Disclosed is an automatic high-temperature testing machine for a capacitor. The automatic high-temperature testing machine comprises a machine body and a machine door, wherein the machine door is connected to the machine body, so that a closed cavity can be formed; a driving shaft and a driven shaft are arranged in the cavity; a belt is arranged between the driving shaft and the driven shaft, anda base is fixedly arranged on the belt; the base is movably connected with a test clamp of the capacitor; a positive electrode conductive piece and a negative electrode conductive piece are arranged on the test clamp; the positive electrode conductive piece on the test clamp is electrically connected with the driving shaft through a conductive strip, and the negative electrode conductive piece onthe test clamp is electrically connected with the driven shaft through a conductive strip; and a movable window is formed in one side of the machine body. According to the automatic high-temperature testing machine for the capacitor, it is very convenient to take out the capacitor without causing scalding; and the relative stability of the temperature in the machine body can be maintained when thecapacitor is taken out, so that the energy consumption is reduced.

The invention discloses a smoke alarm tester. The smoke alarm tester includes a control center and a test chamber; the test chamber is arranged on an annular channel formed by a pipeline; the test chamber is provided with at least one test bogie; the annular channel is provided with a blower with a built-in aerosol generator, an optical probe pipeline with a built-in optical probe, a first pipeline valve, a second pipeline valve and an electric wing blade valve, wherein the electric swing blade valve is arranged between the first pipeline valve and the second pipeline valve; the control center is in control connection with the blower, the aerosol generator, the first pipeline valve, the second pipeline valve and the electric wing blade valve respectively; and the optical probe is connected with the control center through an optical signal processing apparatus. The smoke alarm tester of the invention has the advantages of simple structure, convenient operation, high detection efficiency and high accuracy.

The invention discloses a chip failure positioning method and a clamp. The chip failure positioning method comprises a transfer step, a first positioning step, a first marking step, a second positioning step and a second marking step, and the chip failure positioning method can position failure points of chips with regular surfaces and without characteristic patterns.

The invention discloses a system and a method for detecting an image acquisition device arranged on an electronic device. A standard testing environment for the image acquisition device is provided via a testing fixture arranged on and covering the image acquisition device, outer environment can be prevented from influencing testing of the image acquisition device, and dual detection on resolution and color recognition can be provided, and technical effects that detection of the image acquisition device excludes influences of the outer environment and detection reliability is improved can thus be achieved.

The invention relates to a containment test system and method. The containment test system comprises at least two groups of gas supply units; at least two groups of adjusting units, wherein the air inlets of the adjusting units are communicated through a communicating pipeline; a first isolating valve is arranged on the communicating pipeline; the at least two pressurizing ports are communicated with the containment; wherein one adjusting unit corresponds to one air supply unit and one pressurizing port, the air inlet of each adjusting unit is communicated with the air outlet of the corresponding air supply unit, and the air outlet of each adjusting unit is communicated with the corresponding pressurizing port. On one hand, the gas supply section of the pressurizing opening can be increased, the pressurizing time of the containment is shortened, and therefore the containment testing efficiency is improved; and on the other hand, the plurality of sub-pressurizing systems can be mutually switched and can be mutually standby, so that the influence on the containment test caused by the damage of a single pressurizing system is avoided.

The invention relates to a comprehensive pipe gallery gas cabin explosion isolation and suppression test device, which is characterized in that a placement block is arranged in a gas cabin; wherein the top of the placement block is fixedly connected with a gas box, an adjusting assembly for adjusting the position of the gas box is arranged in the gas cabin, the top of the gas box is fixedly connected with two symmetrical first fixing blocks, and screw rods are rotatably connected in the first fixing blocks; two control assemblies used for controlling the angle between the screw and the gas tank are symmetrically arranged on the inner wall of the top of the gas cabin. Rectangular grooves are formed in the inner walls of the sides, away from each other, of the gas cabins; baffles are slidably connected into the rectangular grooves, and two sets of replacement assemblies used for replacing the corresponding baffles are symmetrically arranged at the top of the gas cabin. By means of the device, the shock waves generated by gas combustion explosion of the comprehensive pipe gallery gas cabin can be restrained and blocked according to whether the surface of the blocking plate in the gas cabin is smooth or not, the placement position of the gas pipeline and different angles of the connecting support in the gas cabin and the gas pipeline.

The invention relates to a photocatalytic performance testing device under monochromatic light irradiation, and the device comprises a base, a photocatalytic reaction area, an adjustable lamp post andLED monochromatic light sources. The adjustable lamp post is fixedly mounted at one side of the base; the photocatalytic reaction area is fixedly connected to the middle of the base, and the adjustable lamp post is composed of an adjusting lamp post main body, locking nuts and a telescopic rod at the upper part; the telescopic rod is arranged in the adjusting lamp post main body, and the telescopic rod can rotate; the locking nuts are symmetrically arranged at the two sides of the adjusting lamp post body and used for locking the telescopic rod; the top of the telescopic rod is connected withsix LED monochromatic light sources through hinges, and the six LED monochromatic light sources are evenly distributed and can be rotationally folded through the hinges. Scales are arranged on the surface of the telescopic rod. A photocatalyst of which the performance needs to be evaluated is placed in the photocatalytic reaction area, the length of the telescopic rod is adjusted to determine theillumination intensity under different distances, and the telescopic rod is rotated to determine the photocatalytic performance under different monochromatic light sources.

The invention provides a method for measuring cadmium isotopes in a cadmium-containing sample. The method comprises the steps: firstly, testing a to-be-measured cadmium-containing sample by multi-receiving plasma mass spectrometry, to obtain signals of cadmium isotopes with the mass numbers of 110, 111, 112, 113, 114 and 116, signals of tin isotopes with the mass numbers of 117 and 120, a signal of a palladium isotope with the mass number of 105 and a signal of an indium isotope with the mass number of 115; then, obtaining signals of interference elements 110Pd, 114Sn and 113In by the signal at the mass number of 105, the signal at the mass number of 120, the signal at the mass number of 117 and the signal at the mass number of 115, substituting the signals into the step 1), and carrying out signal deducting, to obtain corrected 110Cd, 113Cd and 114Cd signals. The experimental results show that the method provided by the invention can correct measurement interference of palladium, indium and tin on the cadmium isotopes when the Sn / Cd ratio is less than or equal to 0.5, the In / Cd ratio is less than or equal to 0.001 and the Pd / Cd ratio is less than or equal to 0.0001 in the to-be-measured sample, cadmium isotope measurement cannot be affected, and the precision and accuracy of cadmium isotope measurement are improved.

The invention belongs to the drill bit technical field and relates to a drill bit performance testing device. The drill bit performance testing device includes a pump, a circulation joint, a flow meter, a pipeline, a power head, a drill bit, a drill bit spindle, a drill bit conversion joint, a tester and a rock sample; the pump is connected with the flow meter through the circulation joint; and one end of the flow meter is sequentially connected with the power head, the drill bit, the drill bit spindle, the drill bit conversion joint, the tester and the rock sample through the pipeline. The drill bit performance testing device is simple in structure. With the drill bit performance testing device adopted, the impact force, rotation speed, strength and other performance of the drill bit canbe tested, and the machining quality of follow-up products can be ensured.

The invention relates to a device and a method for detecting testing environment of a circuit. The detecting device mainly comprises a testing support plate, a slot and an antenna, wherein the testingsupport plate is positioned at the bottom of the detecting device; the slot is arranged on the testing support plate and used for fixing an element to be detected, such as an integrated circuit, andthe element to be detected is electrically connected with the testing support plate; and the antenna is arranged on the testing support plate adjacent to the slot and used for receiving wireless signals and monitoring whether the testing environment has excessive foreign signals or not to influence the testing of the circuit.

The invention discloses a clothing online creative design evaluation system, which comprises a database, the database is connected with a drawing module, the drawing module is provided with a hand drawing device and a color unit module, the database is connected with a backup unit, and the database is provided with an evaluation module. The evaluation module is internally provided with a vision module, a novelty module and a comfort module, the database is connected with an updating module, the updating module is connected with a network module, the updating module is connected with a style module, a color module and a pattern module, one side of the database is provided with a comparison module, and the comparison module is connected with the network module. And a clothing model module, a clothing color module and a clothing pattern module are arranged below the comparison module. According to the invention, a designer can select and use conveniently through integration of existing garment elements, plagiarism can be avoided well, impact force of the garment to consumers can be tested well, and whether the garment can cause impulsion of the consumers or not can be known conveniently.

The invention provides a vacuum high-low temperature semiconductor device test probe station, which relates to the technical field of semiconductor devices. The vacuum high-low temperature semiconductor device test probe station comprises a workbench body, a protective cover, a probe rod and a probe head, wherein moving mechanisms are fixedly connected to the two ends of the top surface of the workbench body, each moving mechanism comprises a moving box, and micro motors are fixedly connected to the side surfaces, away from each other, of the two moving boxes. According to the vacuum high-lowtemperature semiconductor device test probe station provided by the invention, as a clamping mechanism is arranged, the advantages of convenience in replacement and use is achieved, and the problems that a probe is troublesome to replace when an existing vacuum high-low temperature semiconductor device test probe station is used for replacing the probe and the replacement efficiency is low can besolved; and as a buffer mechanism is arranged, the conditions that the surface of the wafer is easily stabbed, the testing of the wafer is further influenced, the tested result cannot be accurate andthe normal judgment of the wafer is influenced when the wafer is tested are effectively avoided.

The invention relates to the technical field of antenna structures, in particular to a configurable stacked antenna array verification device, which comprises a bracket, the bracket comprises a flat mounting surface, and a bottom material layer, a plurality of middle material layers, a simulation transition plate and a printed board are sequentially arranged above the mounting surface; the bracket is provided with a plurality of connecting and fixing structures, and the connecting and fixing structures penetrate through the bracket, the bottom material layer, the middle material layer and the simulation transition plate and are connected and fixed; the feed structures penetrate through the bracket, the bottom material layer, the middle material layer, the simulation transition plate and the printed board, the upper ends of the feed structures are conducted with the printed board, and the lower ends of the feed structures are connected with the cable assembly. According to the invention, various factors influencing the electrical performance can be flexibly configured, boundary conditions of the antenna under actual conditions can be constructed, the electrical performance of the stacked antenna array under different configuration modes can be rapidly tested at low cost, a stacked antenna array design scheme with better performance can be screened out, and the device is helpful for improving the design efficiency and obtaining a better design effect.

The invention provides a method for automatic testing. The method comprises the steps that the operation condition of each testing machine is acquired; Sorting is carried out according to the utilization rate of each test machine; and the test cases are distributed to the test machine with the lowest utilization rate. According to the method, the test cases are reasonably distributed by monitoringthe operation parameters of the machines, so that the automatic test time is balanced, the operation time of each machine is approximately equal, and the test time is reduced. And under the conditionthat the system load is ensured, each testing machine executes the testing cases in parallel as much as possible, so that the testing efficiency is improved.

The invention discloses an automatic testing system for a residual current type electrical fire monitoring detector, which belongs to the technical field of detector testing, and comprises a current generator and a cylinder installed on a support seat, the cylinder is located above the current generator, and the current generator The upper surface is provided with a support plate, the upper end of the support plate is installed with the detector body and the push plate, the side of the push plate close to the detector body is fixed with a copper rod, the lower end of the cylinder is slidingly connected with a lifting column, and the lower end of the lifting column is provided with a A probe installed on a connecting plate; the invention is used to solve the technical problem that the effect of detector testing in the existing solution is not good.

The invention provides a method for measuring cadmium isotopes in a cadmium-containing sample. The method comprises the steps: firstly, testing a to-be-measured cadmium-containing sample by multi-receiving plasma mass spectrometry, to obtain signals of cadmium isotopes with the mass numbers of 110, 111, 112, 113, 114 and 116, signals of tin isotopes with the mass numbers of 117 and 120, a signal of a palladium isotope with the mass number of 105 and a signal of an indium isotope with the mass number of 115; then, obtaining signals of interference elements 110Pd, 114Sn and 113In by the signal at the mass number of 105, the signal at the mass number of 120, the signal at the mass number of 117 and the signal at the mass number of 115, substituting the signals into the step 1), and carrying out signal deducting, to obtain corrected 110Cd, 113Cd and 114Cd signals. The experimental results show that the method provided by the invention can correct measurement interference of palladium, indium and tin on the cadmium isotopes when the Sn / Cd ratio is less than or equal to 0.5, the In / Cd ratio is less than or equal to 0.001 and the Pd / Cd ratio is less than or equal to 0.0001 in the to-be-measured sample, cadmium isotope measurement cannot be affected, and the precision and accuracy of cadmium isotope measurement are improved.