Disclosed is a
SRAM cell and a method of manufacturing the same. The
SRAM cell comprises: a pair of access devices; a pair of pull-up devices; a pair of pull-down devices; and at least one
metal plate formed on
metal interconnection lines in contact with a substrate, having a
dielectric film interposed between the
metal plate and the metal
interconnection lines, so as to increase a
cell capacitance, thereby reducing a
soft error rate. Herein, one metal plate may be included in each
cell. In this case, the metal plate overlaps with a first one of metal
interconnection lines of a node side and a node bar side, while being in contact with a second one of the metal interconnection lines of the node side and the node bar side. Also, two metal plates may be included in each
cell. In this case, the metal plates overlap, respectively, with one metal interconnection line of metal interconnection lines of a node side and a node bar side, while being in contact with another metal interconnection line of the node side or the node bar side, respectively. Therefore,
capacitance is additionally formed to increase cell
capacitance, so that variation of the electric potentials of cell nodes, which is caused by generated electrons, is prevented, and thereby
soft error can be efficiently reduced.