52results about How to "Good resolution" patented technology

The invention provides a refractive index sensing device based on tilted fiber grating surface plasmon resonance. The device consists of a broadband light source, a polarizer, a polarization controller, an optical isolator, a sensing probe formed by excessively tilted long period fiber grating and a metal film, and a spectrum analyzer. The broadband light source produces broadband incident light,after the incident light passes through the polarizer, the polarization controller and the optical isolator, single polarized light is output and is introduced into the parameter optimized sensing probe, the polarized light is coupled to a low order or high order polarization cladding mode in the sensing probe and produces a corresponding resonance peak at the output end. Specifically, the s polarized light is only coupled to an s polarization low order or high order cladding mode, the p polarized light is coupled to a low order or high order p polarization cladding mode and excites plasma resonance wave in the metal film. The spectrum analyzer records the variation situation of the output spectrum's resonant wavelength along with the refractive index of a to-be-tested sample, thus realizing detection of the to-be-tested sample. The sensing device provided by the invention effectively enhances the degree of interaction between the to-be-tested sample and the surface plasma resonance wave, and improves the sensing sensitivity and resolution.

The invention provides a group of SSR molecular markers for identifying corn varieties and application of the molecular marker. The number of the SSR molecular markers is two. An SSR molecular markerdetection method suitable for a polyacrylamide gel electrophoresis platform is provided. The two SSR molecular markers can be used for rapidly distinguishing Heyu187 and Denghai18 varieties of corn, the SSR markers are combined with efficient and high-sensitivity technologies, the cost is reduced, the test efficiency is fully improved in the aspect of time, and the method has the advantages of being quick, convenient to operate, short in time, accurate and reliable in result and the like. The primers can be used for corn fingerprint spectrum construction, variety identification, genetic diversity analysis and the like, and have very wide application prospects.

The invention discloses a micro-nano movement system posture control device adopting an optical balancing method and belongs to the technical field of precision measurement of geometric quantities. The device mainly comprises a control system module, an optical measurement module, a photoelectric demodulation module and an execution mechanism module. Accurate information of a position is determined with light energy and local interference modulated frequency information, wherein the position information is used for posture control in the movement of a micro-nano movement system. Light energy in a measurement signal is used for guaranteeing determination of an effective area of the measured signal, the interference modulated frequency information is used for judging the position of a balance point in the measurement area, and finally, operation and driving of the execution mechanism are performed in the control system module to guarantee that the movement posture of the micro-nano movement system is stable and controllable. The problems that posture measurement sensitivity of common movement systems is low, measurement drifting exists and the like can be solved, the device is relatively simple in structure, integration and portable performance of the movement system are favorably improved, the device is high in measurement efficiency and good in resolving power, and the instantaneity and the accuracy of posture control are favorably improved.

A correction method of the wafer conveyer of a grinder includes three steps: (a) a correction plate (4) with an outer diameter larger than or equal to the outer diameter of a wafer (3) waiting to be processed is arranged on the conveyer (5), which is provided with a supporting part (51) used to bear the wafer, and the center of the correction plate is aligned with the center of the supporting part; (b) the supporting part is extended into the bottom of a wafer-bearing box and bears the wafer waiting to be processed, which is placed on the upper side of the correction plate; (c) the position relation between the edge of the wafer and the correction plate is compared in order to accurately regulate the grinder. Utilizing the comparison between the edge of the wafer and the correction plate, the present invention not only is simple and convenient for observation but also can improve the accuracy of correction and easily obtain the offset distance of the center of the supporting part, so that the wafer conveyer can be accurately and rapidly regulated.