70results about How to "Add measurement function" patented technology

The invention discloses a plane parallelism measurement device. The plane parallelism measurement device comprises a square or cylindrical shell (1), an A / D (analogue-to-digital) converter (8), a microcontroller (9), a power supply (10), a display screen (11) and a measurement module, wherein the measurement module comprises three grooves and three distance sensors, wherein one distance sensor is fixedly arranged in one groove correspondingly; the three grooves are all positioned on the same plane of the shell (1), and the central points of the three grooves are not arranged on the same line; the three distance sensors are respectively connected with the A / D converter (8); the A / D converter (8) is connected with the microcontroller (9), the power supply (10) and the display screen (11) in sequence; distance is measured by the three distance sensors at the same time and then is processed, and a measurement result is output through the display screen (11). By the plane parallelism measurement device, the distance between two planes are measured, the parallelism is judged directly and accurately, and the parallelism measurement of planes can be provided very well by utilizing automatic measurement.

The invention relates to a device of stimulating the multi-factor joint effect of the electrostatic dynamic potential which comprises the imitating chamber, the data collecting and processing system connected with each other. The chamber comprises the rotating friction disk, static friction disk, thermoprobe, hygrometric probe, elevating controlling device and deriving motor, wherein the friction disk is fixed relative to the static friction disk and connected with the deriving motor, the static friction disc is connected with the elevating controlling device through the force application pallet. The data collecting and processing system comprises the electrostatic dynamic potential measuring probe connected with the host machine and computer in turn.

The invention discloses an instrument for measuring rock point load strength and a structural surface frictional angle in the field. The instrument comprises a lower bottom plate and an upper bottom plate, wherein support columns are mounted between the lower bottom plate and the upper bottom plate, and a turbine reducer is mounted on the upper bottom plate and connected with a storage hand wheel and a screw; a slider is mounted on the support columns, and the screw is connected with a connecting block which is connected with the slider; a rock point load strength measuring device or a rock structural surface frictional angle measuring device is mounted between the connecting block and the lower bottom plate. By means of the instrument for measuring rock point load strength and the structural surface frictional angle in the field, the weight of an existing rock point load instrument is reduced substantially, measurement parameters of the instrument are directly stored and transmitted without manual recording, requirements of rock point load strength measurement in the field for low weight and intelligence of the instrument are met, the way of measuring the rock structural surface frictional angle through visual inspection at the site is avoided, and the function of measurement of the structural surface frictional angle is increased.

The following invention pertains to the introduction of a gas (or fluid) around a SPM probe or nanotool™ to control chemical activity e.g. oxygen to promote oxidation, argon to inhibit oxidation or clean dry air (CDA) to inhibit moisture to control static charging due to the action of the probe or nanotools and to provide vacuum at and around the tip and substrate area. The invention can also produce electrical current for use with active electronic devices on, in or near the body of the device. In addition by use of a fluid like water, certain oils, and other liquids in conjunction with specific tip structure either electric discharge machining can be used at the tip area on the tip itself (in conjunction with a form structure on the work piece) or on a work piece beneath the tip to shape, polish and remove material at very small scales (10 microns to 1 nm or less).

The invention discloses a multifunctional measuring and line drawing ruler which comprises a ruler main body, a movable ruler, an installation structure, an angle scale, a first datum line and a second datum line. The movable ruler is rotationally arranged on the ruler body, the installation structure is arranged on the movable ruler and used for installing a line drawing pen, the angle scale is arranged on the ruler main body, the circle center of the angle scale coincides with the rotation center of the movable ruler, the first datum line is arranged on the ruler main body, a drawing radiusline is formed between the rotation center of the movable ruler and the center of the line drawing pen, the drawing radius line can coincide with the first datum line, the second datum line is arranged on the ruler main body, the movable ruler is provided with an angle measuring line which can coincide with the second datum line, and the angle measuring line rotates along with the movable ruler toform an angle measuring mechanism with the second reference line. According to the measuring and line drawing ruler, the movable ruler which is rotatably arranged on the ruler main body is matched with the angle scale to carry out angle measurement, the line drawing pen is arranged on the movable ruler, a circular arc line can be drawn by rotating the movable ruler, and therefore the functions ofangle measurement and circular arc line drawing can be added through a simple structure.

The invention discloses an electronic flexible rule capable of displaying variable quantity and a measurement method thereof. The electronic flexible rule comprises a flexible rule body, wherein a circuit board is arranged in the flexible rule body and is in circuit connection with a display screen which is arranged on the surface of the flexible rule body. When the display screen is electrified and used for measuring, the current measurement value is recorded and saved; the current measurement value is compared with a target value; and the comparison result can be displayed. The electronic flexible rule is capable of obtaining the current measurement value and comparing the current measurement value with the target value to obtain the comparison result, so that the user can measure the current measurement value and know the variation change; the variable quantity measuring function is added.

The invention discloses a parallel precise measuring system for measuring the surface area and the perimeter of a tiny object. In the invention, geodesic active contour line is applied to the parallel measurement problem of irregular-shaped image multi-objective area / perimeter, a quick and precise measuring method is developed and is applied to a two-dimensional image measuring machine, so as to realize the quick and precise measurement of surface area / perimeter of multiple tiny objects. Besides, a novel centroid self-calibration technology is used, the calibration of pixel size equivalent can be finished accurately without any standard test pieces, finally, the actual surface area and perimeter of the tiny object can be obtained. A guide rail is moved during calibration, and the displacement of the guide rail is precisely measured by a double-frequency laser.

A method of region overlap control for the display of a plurality of waveforms on an instrument includes an overlap function that allows selection by a user of a vertical height on a display screen for each of the waveforms. A ground marker for each of the waveforms is adjusted on the display screen according to the selected vertical height. The result is that the plurality of waveforms are displayed on the display screen in an overlapping fashion with sufficient vertical height to enhance triggering, all measurement functions and secondary functions, such as harmonics and switching loss measurements.

The invention discloses a vernier caliper additionally provided with an improved measuring pawl. The vernier caliper comprises a main ruler, a depth indicator disposed at one end of the main ruler, a vernier scale which is attached to the main ruler and can slide, and a first inner measuring pawl and a first outer measuring pawl which are fixed on the main ruler and the vernier scale. The first inner measuring pawl is disposed above the main ruler, the first outer measuring pawl is disposed below the main ruler, the improved measuring pawl sleeves the first outer measuring pawl from the bottom to the top, the pawl foot of the improved measuring pawl is provided with a cover plate with a nut hole, and the improved measuring pawl is fixed to the first outer measuring pawl by screwing tight a nut. According to the invention, on the basis of a conventional 0-200 mm universal vernier caliper, an improved inner measuring pawl and an improved outer measuring pawl are adaptively selected and additionally arranged, so that the test requirement of a special process is satisfied, and the application scope of the 0-200 mm universal vernier caliper is enlarged. The improved inner measuring pawl and the improved outer measuring pawl employ a common measuring tool steel material and are formed through lathe processing, what is needed is only fixation on the conventional 0-200 mm universal vernier caliper through an original screw, the installation is convenient, and the installation and application can be at any time and at any place. At the same time, a large amount of cost for purchasing professional calipers is saved.