80 results about "Small-angle scattering" patented technology

Apparatus for inspection of a sample includes a radiation source and an array of detector elements arranged to receive radiation from the surface due to irradiation of an area of the surface by the radiation source. The array has a first operative configuration for resolving the received radiation along a first axis perpendicular to the surface, and a second operative configuration for resolving the received radiation along a second axis parallel to the surface. A signal processor processes the signal from the detector array in the two configurations so as to determine a reflectance of the surface as a function of elevation angle relative to the surface and a scattering profile of the surface as a function of azimuthal angle in a plane of the surface.

The present invention relates to a test chamber that can be used to perform a variety of X-ray and neutron spectroscopy experiments including powder diffraction, small-angle scattering, X-ray absorption spectroscopy, and pair distribution functions, such chamber comprising a first electrode with an X-ray transparent window; a second electrode with an X-ray transparent window; a plurality of insulating gaskets providing a hermetic seal around the sample and preventing contact between said first and second electrodes; and an insulating housing into which the first electrode is secured.

A medical imaging system includes an X-ray imaging apparatus and an image processor. The X-ray imaging apparatus is provided with a Talbot or Talbot-Lau interferometer and includes an X-ray source, an X-ray detector, and a subject table. The image processor generates a differential phase image, and optionally, one or both of an X-ray absorption image and a small-angle scattering image of the subject on the basis of the image signal of the subject. The image processor specifies a location of an edge of a bone in the joint on the basis of at least one of the generated images; and detects an edge of a cartilage in the joint in the differential phase image on the basis of the specified location of the bone edge to quantitatively measure a feature of the cartilage.

A two-dimensional x-ray scattering camera includes a source, an optic, a detector, and a pair of collimating blocks. The source emits x-ray beams that are reflected by the optic towards a sample. The detector detects scattering from the sample, the pair of collimating blocks is positioned between the optic and the detector to collimate the beam. A bottom surface of one block is substantially parallel a top surface of the other block, and the blocks are rotatable relative to the beam about a pivot. The system forms a two-dimensional beam that is symmetric about the primary beam axis at the detector position, regardless how the beam is collimated by the collimating blocks. The system therefore eliminates smearing and can be used for anisotropic small angle scattering at high resolution and low Q_min.

An X-ray imaging system includes an X-ray Talbot; imaging apparatus and an image processing apparatus. The image processing apparatus generates reconstruction images from the moire image taken by the X-ray Talbot imaging apparatus. The reconstruction images include a differential phase image, an absorption image and a small-angle scattering image. The X-ray imaging system performs X-ray Talbot imaging and normal X-ray imaging. X-ray Talbot imaging includes setting an exposure energy of the X-ray Talbot imaging apparatus to a first exposure energy and taking the moire image with the X-ray detector. Normal X-ray imaging includes setting the exposure energy of the X-ray Talbot imaging apparatus to a second exposure energy and taking an absorption contrast image with the X-ray detector by normal X-ray imaging.

An optical system suited to high sensitivity measurement of small particles as they travel through a point of detection in a flow cell. The system consists of components along two optical axes, preferably but not necessarily, at approximately the Brewster angle to one another. The first axis incorporates a flow cell, high numerical aperture light collection lens, spatial filtering and optical detectors. The second axis incorporates a radiation source (typically a laser or arc-lamp) and beam shaping optics. The two axes are positioned at an angle sufficient to enable collection of small angle light scatter near the edge of the collection lens and to allow collection of medium and large angle light scatter through the centre and opposite side of the collection lens. The invention enables spatial filtering in the image plane of the collection lens to exclude radiation from the dominating sources of unwanted scattering in the flow cell, and also allows the use of a high numerical aperture lens to collect radiation scattered and fluoresced by the sample particles.

A small angle x-ray diffraction scattering system has a vertical orientation, allowing for simplified analysis of liquid samples. The system may function in a beam-up or a beam-down configuration. An x-ray source provides an initial x-ray beam that is directed vertically along a primary beampath to a sample located on a sample support. The small angle scattered x-ray energy travels through a secondary beampath to a detector. The primary and secondary beampaths may be evacuated and separated from a sample chamber by fluid seals. Beam conditioning optics and a collimator may be used in the primary beampath, and a beamstop used in the secondary beampath. The sample chamber may have a microscope or camera, which may be movable, for observing the sample, and a translation stage for moving the sample in at least two dimensions.

Disclosed herein is a method of evaluating the performance of an ion-exchange film. In the method, small-angle scattering curves for the ion-exchange film are obtained by an X-ray measuring apparatus that can detect X-rays scattered at small angles with respect to the axis of an X-ray applied to film. From the positions of the peaks on the small-angle scattering curves and the X-ray intensities at these peaks, the molecular structure of the ion-exchange film is determined, thereby to evaluate the performance of the ion-exchange film.

The invention provides an in situ pressure loading device for neutron small-angle scattering. The in situ pressure loading device can conduct pressure loading for tested samples in the neutron beam direction and control stress and strain of the samples. The in situ pressure loading device comprises a power drive assembly, a transmission gear assembly, a ball screw assembly, a high-accuracy measurement assembly, a clamp assembly, a fixed machine frame base assembly and a shielding layer. The in situ pressure loading device is characterized in that a plurality of assemblies, which are of hollow structures, on a neutron beam line allow direct passing of neutrons, and a clamp is made of sapphire materials with high neutron transmittance, so as to achieve the pressure loading of the samples in the neutron beam direction. The in situ pressure loading device is matched with a neutron small-angle scattering spectrometer for use, conducts in situ detection on the microscopic deformation, damage and break processes of the tested samples in the mechanical use environment, and provides an effective and reliable means for study on further disclosure of the mechanical property and the damage and break mechanism of materials.

An X-ray optical system for small angle scattering has a parabolic multilayer mirror and, so that switching to other X-ray incident optical systems for X-ray analysis can be easily performed. A parabolic multilayer mirror, an optical-path selecting slit device, a small-angle selecting slit device and a Soller slit are arranged between an X-ray source and a specimen-side slit. An X-ray beam having passed through the first aperture of an aperture slit plate is interrupted by the optical-path selecting slit. An X-ray beam having passed through the second aperture of the aperture slit plate is reflected at the reflecting surface of the multilayer mirror to become a parallel beam. This parallel beam passes through an aperture of the optical-path selecting slit device. The beam width is restricted by a narrow slit of the small-angle selecting slit device.

A medical instrument is provided for use with a phase contrast imaging. The medical instrument includes at least one component, which has a strong small angle scattering of x-rays. Furthermore, a corresponding x-ray recording system with phase contrast imaging for recording an examination object may include such a medical instrument.

A high strength polyethylene filament, wherein said filament has a fineness of 1.5 dtex or less as a monofilament, a tensile strength of 15 cN/dtex or more and a tensile elastic modulus of 300 cN/dtex or more, and, the rate of dispersion-defective fibers cut from the filament is 2% or less, is disclosed, and a high strength polyethylene filament, wherein said filament has a tensile strength of 15 cN/dtex or more and a tensile elastic modulus of 300 cN/dtex or more, and, a long period structure of 100 Å or less is observed in an X-ray small angle scattering pattern is disclosed.

The invention relates to a microstructure analysis method of asphalt and a modifier thereof, and belongs to the technical field of microstructure analysis of modified asphalt. The problem that the microstructures of asphalt and the modifier thereof cannot be comprehensively, stereoscopically and clearly analyzed by using only one characterization method at present is solved. According to the microstructure analysis method provided by the invention, neutron small-angle scattering samples of an SBS modifier, matrix asphalt and SBS modified asphalt are prepared at first, a neutron small-angle scattering test is performed on the samples to obtain initial experimental data, and the initial experimental data are processed to obtain an absolute intensity scattering curve, and then different models are fitted through the absolute intensity scattering curves of the samples to quantitatively analyze the microstructures of the SBS modifier, the matrix asphalt and the SBS modified asphalt. Throughthe analysis of the microstructures of the asphalt and the modifier thereof, the modification mechanism of the SBS modified asphalt can be better revealed, and a relationship between the microstructure of the modified asphalt and the macroscopic properties thereof can be established, so that the performance of the SBS modified asphalt, and the service level and the service life of asphalt pavements can be better improved.

A light source device includes a LED light source or a wavelength conversion material having a near Lambertian light emitting surface. The light source device includes a light recycling system to reflect small-angle lights (lights closer to the normal direction of the light emitting surface) back to the light source, and a collection system for collecting and outputting large-angle lights (lights farther away from the normal direction). The lights reflected by the light recycling system is scattered by the emitting surface in all directions, where the large-angle scattered lights are collected by the light collection system and the small-angle scattered light is reflected by the light recycling system again. A second excitation light source without wavelength conversion material or a second light source with its own wavelength conversion material may be provided, and the second light is directed to the light emitting surface by appropriate optical components.

The invention belongs to the field of neutron scattering experiments and especially relates to a dedicated clamp for a neutron small-angle scattering high-temperature in-site tensile test. The clamp comprises a clamp head bolt, a clamp head body and a sample fixing assembly, wherein the clamping head bolt is connected with a tensile testing machine pull rod, the clamping head bolt is fixedly connected to the clamping head body, and the clamping head body can provide axial tension for the sample fixing assembly. Therefore, the dedicated clamp for the neutron small-angle scattering high-temperature in-site tensile test disclosed by the invention has the advantages of convenience in assembling and disassembling and firmness in clamping.

The invention discloses a method for removing blurring effect in X-ray scattering and diffraction experiments. The method comprises the steps of measuring the distribution of straight spots on a two-dimensional detector to obtain h (x, y), measuring the scattering data of an experimental sample to obtain g (x, y), performing Fourier transform on h (x, y) and g (x, y), respectively, thereby obtaining the distribution H (u, v) of the straight spots in the reciprocal space and the distribution G (u, v) of the scattering data in the reciprocal space, performing deconvolution processing on the experimental data H (u, v) and G (u, v) by use of a Wiener filtering algorithm to obtain the Fourier transform F (u, v) of blurring effect-removed data f (x, y), performing inverse fast Fourier transform on F (u, v) to obtain the blurring effect-removed data f (x, y), and adjusting the parameter alpha according to the results of f (x, y) until the desired deconvolution result is obtained. The method for removing the blurring effect in the X-ray scattering and diffraction experiments is used for performing the deconvolution processing on the experimental data. Due to the adoption of the method, the angle resolution of the X-ray small-angle scattering data can be increased and the experimental accuracy can be improved.