Method for removing blurring effect in X-ray scattering and diffraction experiments

Abstract

The invention discloses a method for removing blurring effect in X-ray scattering and diffraction experiments. The method comprises the steps of measuring the distribution of straight spots on a two-dimensional detector to obtain h (x, y), measuring the scattering data of an experimental sample to obtain g (x, y), performing Fourier transform on h (x, y) and g (x, y), respectively, thereby obtaining the distribution H (u, v) of the straight spots in the reciprocal space and the distribution G (u, v) of the scattering data in the reciprocal space, performing deconvolution processing on the experimental data H (u, v) and G (u, v) by use of a Wiener filtering algorithm to obtain the Fourier transform F (u, v) of blurring effect-removed data f (x, y), performing inverse fast Fourier transform on F (u, v) to obtain the blurring effect-removed data f (x, y), and adjusting the parameter alpha according to the results of f (x, y) until the desired deconvolution result is obtained. The method for removing the blurring effect in the X-ray scattering and diffraction experiments is used for performing the deconvolution processing on the experimental data. Due to the adoption of the method, the angle resolution of the X-ray small-angle scattering data can be increased and the experimental accuracy can be improved.

Description

technical field [0001] The invention relates to the field of X-ray scattering and diffraction experiments, in particular to a method for removing blur effects in X-ray scattering and diffraction experiments. Background technique [0002] In X-ray scattering and diffraction experiments, the distribution of the beam and the point spread function of the detector will cause the experimental data to deviate from the ideal curve of the point light source, resulting in blurring effects. In order to combat this effect, it is proposed to deconvolute the data by means of Wiener filtering, so as to restore the ideal scattering diffraction data of point light sources. [0003] It is known from the X-ray scattering theory that a lot of structural information is contained in the angle data, and poor angular resolution will affect the accuracy of the experiment, and even get completely wrong results. There are two main factors that affect the angular resolution of two-dimensional data: on...

AI Technical Summary

Problems solved by technology

However, conventional direct deconvolution methods have certain limitations.

Mainly manifested in two aspects: 1. When the stretching function has a zero value in the entire detection interval, direct deconvolution is not available; 2. The direct deconvolution method is more sensitive to noise, and the noise of real data will affect the deconvolution. Convolution results have a big impact

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