50results about How to "Realize in situ observation" patented technology

The invention discloses a method for realizing three-dimensional imaging of a symmetrical micro / nano sample through single X-ray measurement. The method comprises the following steps: by taking a coherent X-ray diffraction microscope as imaging equipment and utilizing the characteristics of free electron laser all-coherence, high flux and short pulse of X ray, acquiring two-dimensional diffraction data of the symmetrical micro / nano sample under single pulse irradiation, calculating an equivalent line of the diffraction data of the sample according to crystallographic symmetry characteristics of the symmetrical sample to determine spatial orientation of the sample, performing symmetry operation of a crystallographic point group of the sample on the two-dimensional diffraction data by utilizing the spatial symmetry of the sample to obtain three-dimensional diffraction data of the sample, and performing phase retrieval and image reconstruction on the three-dimensional recombinant diffraction data according to an oversampling and iterative algorithm to finally obtain a three-dimensional structure of the symmetrical sample. According to the method, three-dimensional reconstruction of the sample can be realized through single measurement only, the experiment efficiency of three-dimensional imaging is effectively improved, and a new thought is provided for enriching a three-dimensional imaging method.

The invention provides a seabed lateral deformation and sliding observation device and method. The seabed lateral deformation and sliding observation device comprises an auxiliary ship and a seabed observation system, wherein the auxiliary ship is provided with an offshore drilling rig and a lifting device, and the seabed observation system is provided with a displacement measurement device, a data acquisition sealing cabin and a subsidence prevention frame. The displacement measurement device is of a rod joint combination structure with a cable, each joint point is provided with a three-axis acceleration sensor, and the displacement deviation of each joint point can be calculated according to the posture change of the corresponding three-axis acceleration sensor. The method includes the steps that the auxiliary ship is utilized for drilling a target point position so that the seabed observation system can be arranged, the seabed lateral deformation and sliding are observed and recorded through the displacement measurement device in the seabed observation system, fishing and recycling are conducted after the in-situ observation cycle is ended, and the deformation amount and the deformation process of seabed soil can be obtained by analyzing data. The seabed lateral deformation and sliding observation device and method provide a new thought and a new method for seabed lateral deformation and sliding observation and have the advantages of being long in observation cycle, capable of being repeatedly used, wide in observation range, high in accuracy and the like.

The invention relates to a microdomain controllable nanometer functional material synthetic heating device, which solves the problems of enormous volume, dissipation energy, consuming and single synthetic method of the existing nanometer functional material synthetic device. The heating device comprises a rectangle box body and a box cover. Two side walls which are corresponding to the box body are respectively provided with an entering air port connector and an outgoing gas connector. The other two side walls are respectively provided with an electric wire connector. The interior of the box body is sequentially provided with a cooling water pipe, a heat dissipation foundation bed, a workbench, a junction board, a lower panel and an upper panel from bottom to top. The middle of the workbench is provided with a stepped hole which is big at the upper part and small at the lower part. The junction board is provided with a connector lug and a probe. The heating device has small volume; the volume is 240dm3, thereby the heating device is convenient to be moved; the consuming time of vacuumizing is shortened to 5-15 minutes; the heating up and cooling time and the height are controllable; the whole temperature increasing and decreasing course can be finished in 2-10 minutes; the nanometer structure can be prepared on a silicon base with an external circuit; a plurality of nanometer structures can be integrated on the same under layer. The consumption of water, electric and gas reduced to 5-10% of the former.

The invention relates to a method of preparing an in-situ tensile sample of a transmission electron microscope. The method comprises the steps of preparing a block sample and feeding the block sampleto an FIB sample cabin, and focusing an ion beam onto the block sample; preparing an I-shaped rough blank with two thick ends and a thin middle crossbeam by using an ion beam; preparing a substrate, digging an I-shaped hole with two big ends and a thin middle crossbeam on the substrate, and cutting at two sides of the thin crossbeam of the I-shaped hole to form slopes, wherein the thin crossbeam is at the highest position of the slopes; connecting the rough blank with the substrate so as to form a sample; thinning the middle of the rough blank, and drilling a hole in the axis of the rough blank; and thinning the thin crossbeam of the rough blank in the thickness direction till the bottom end of the rough blank is damaged. The in-situ tensile sample of the transmission electron microscope comprises the substrate and the rough blank, wherein the rough blank is cut from a to-be-observed test sample, the substrate is made of a plastic material, and the rough blank is fixed in the substrate. Both plastic material and brittle material can be prepared into samples suitable for existing transmission electron microscope sample rods, and the yield of finished products is high.