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2038results about "Analysis by material excitation" patented technology

Solid state fluorine sensor system and method

A gaseous fluorine detection system is provided which includes a generally enclosed sample cell containing a substrate comprising a material which interacts with fluorine gas to generate radiant energy. A gas sample of fluorine, the concentration levels of which are to be evaluated is flowed through the cell. A photomultiplier tube is positioned to receive the resulting radiant energy and generate an electrical output signal related to the level of said radiant energy. Means are provided for measuring the said photomultiplier output signal and relating same to the fluorine concentration of the gas sample provided to the cell.
Owner:RADIAN INT

Sub-diffraction image resolution and other imaging techniques

The present invention generally relates to sub-diffraction image resolution and other imaging techniques. In one aspect, the invention is directed to determining and/or imaging light from two or more entities separated by a distance less than the diffraction limit of the incident light. For example, the entities may be separated by a distance of less than about 1000 nm, or less than about 300 nm for visible light. In one set of embodiments, the entities may be selectively activatable, i.e., one entity can be activated to produce light, without activating other entities. A first entity may be activated and determined (e.g., by determining light emitted by the entity), then a second entity may be activated and determined. The emitted light may be used to determine the positions of the first and second entities, for example, using Gaussian fitting or other mathematical techniques, and in some cases, with sub-diffraction resolution. The methods may thus be used, for example, to determine the locations of two or more entities immobilized relative to a common entity, for example, a surface, or a biological entity such as DNA or a protein. The entities may also be determined with respect to time, for example, to determine a time-varying reaction. Other aspects of the invention relate to systems for sub-diffraction image resolution, computer programs and techniques for sub-diffraction image resolution, methods for promoting sub-diffraction image resolution, methods for producing photoswitchable entities, and the like.
Owner:PRESIDENT & FELLOWS OF HARVARD COLLEGE

Sub-diffraction limit image resolution and other imaging techniques

The present invention generally relates to sub-diffraction limit image resolution and other imaging techniques. In one aspect, the invention is directed to determining and / or imaging light from two or more entities separated by a distance less than the diffraction limit of the incident light. For example, the entities may be separated by a distance of less than about 1000 nm, or less than about 300 nm for visible light. In one set of embodiments, the entities may be selectively activatable, i.e., one entity can be activated to produce light, without activating other entities. A first entity may be activated and determined (e.g., by determining light emitted by the entity), then a second entity may be activated and determined. The entities may be immobilized relative to each other and / or to a common entity. The emitted light may be used to determine the positions of the first and second entities, for example, using Gaussian fitting or other mathematical techniques, and in some cases, with sub-diffraction limit resolution. The methods may thus be used, for example, to determine the locations of two or more entities immobilized relative to a common entity, for example, a surface, or a biological entity such as DNA, a protein, a cell, a tissue, etc. The entities may also be determined with respect to time, for example, to determine a time-varying reaction. Other aspects of the invention relate to systems for sub-diffraction limit image resolution, computer programs and techniques for sub-diffraction limit image resolution, methods for promoting sub-diffraction limit image resolution, methods for producing photoswitchable entities, and the like.
Owner:PRESIDENT & FELLOWS OF HARVARD COLLEGE

Laser plasma spectroscopy apparatus and method for in situ depth profiling

An in-situ laser plasma spectroscopy (LPS) system for automated near real-time elemental depth profiling of a target including: an optical source configured to generate an optical beam, wherein the optical beam is pulsed; an optical probe system configured to deliver the optical beam from the optical source to a surface of a target to generate an ablation plasma; a time resolved spectral detection system configured to generate time resolved spectral data from emission signals from the ablation plasma; and a data acquisition and processing system configured to acquire the time resolved spectral data to determine, in combination with predetermined calibration data, an absolute elemental concentration as a function of depth in near real-time.
Owner:GENERAL ELECTRIC CO

Integrated laser-induced enhanced plasma spectrum acquisition system

The invention relates to an integrated laser-induced enhanced plasma spectrum acquisition system and belongs to the field of laser plasma spectrum detection. The integrated laser-induced enhanced plasma spectrum acquisition system comprises a pulse laser device, a light beam lifter, a spectrometer, a domain limiting loop, a high voltage discharge electrode, an ICCD (Intensified Charge Coupled Device) camera, a focusing lens, a sample chamber, a reflector, an adjustable optical fiber optical receiving system, a sample to be detected, a three-dimensional electric control translation platform, an imaging CCD (Charge Coupled Device), a gas flow meter and a gas pressure meter. According to the integrated laser-induced enhanced plasma spectrum acquisition system, different LIBS (Laser-induced Breakdown Spectroscopy) signals are collected by utilizing control and synchronous control of internal environments of smaller independent sealed spaces so that integration is realized; a high voltage discharge enhanced and loop limited domain synchronous enhanced LIBS system with the functions of spectrum acquisition, dynamic image analysis and the like is integrated; and more accurate measurement are realized by utilizing environment stress around the sample and control of protection gas; and the system is quick and convenient, and is favorable for industrial production and application.
Owner:刘瑞斌
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