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289 results about "Zone plate" patented technology

A zone plate is a device used to focus light or other things exhibiting wave character. Unlike lenses or curved mirrors however, zone plates use diffraction instead of refraction or reflection. Based on analysis by Augustin-Jean Fresnel, they are sometimes called Fresnel zone plates in his honor. The zone plate's focusing ability is an extension of the Arago spot phenomenon caused by diffraction from an opaque disc.

Element-specific X-ray fluorescence microscope and method of operation

An element-specific imaging technique utilizes the element-specific fluorescence X-rays that are induced by primary ionizing radiation. The fluorescence X-rays from an element of interest are then preferentially imaged onto a detector using an optical train. The preferential imaging of the optical train is achieved using a chromatic lens in a suitably configured imaging system. A zone plate is an example of such a chromatic lens; its focal length is inversely proportional to the X-ray wavelength. Enhancement of preferential imaging of a given element in the test sample can be obtained if the zone plate lens itself is made of a compound containing substantially the same element. For example, when imaging copper using the Cu La spectral line, a copper zone plate lens is used. This enhances the preferential imaging of the zone plate lens because its diffraction efficiency (percent of incident energy diffracted into the focus) changes rapidly near an absorption line and can be made to peak at the X-ray fluorescence line of the element from which it is fabricated. In another embodiment, a spectral filter, such as a multilayer optic or crystal, is used in the optical train to achieve preferential imaging in a fluorescence microscope employing either a chromatic or an achromatic lens.
Owner:CARL ZEISS X RAY MICROSCOPY

Pattern generating systems

A pattern generating system for generating two-dimensional images on a surface includes a light source and one or more Zone Plate Modulator (ZPM) arrays. The ZPM arrays comprise diffractive zone plate modulating elements that are capable of either diffracting or reflecting an incident light according to the image data. In a high-resolution pattern generating system, ZPM arrays are used as spot array generators. A complete high-resolution image is formed by scanning individual light spots in the spot array using a subfield scanning means.
Owner:BI BAOKANG

X-ray microscope capillary condenser system

A radiation condenser system for an X-ray microscope allows for the efficient collection and relay of radiation from a source to the sample. It generates a converging hollow cone of radiation that can be used in the imaging of a sample or target using a zone plate lens. This system comprises a capillary tube for receiving and focusing radiation onto a sample. A center stop is provided for blocking radiation being transmitted along an axis of the capillary tube.
Owner:CARL ZEISS X RAY MICROSCOPY

Achromatic fresnel optics based lithography for short wavelength electromagnetic radiations

A lithography apparatus having achromatic Fresnel objective (AFO) that combines a Fresnel zone plate and a refractive Fresnel lens. The zone plate provides high resolution for imaging and focusing, while the refractive lens takes advantage of the refraction index change properties of appropriate elements near absorption edges to recombine the electromagnetic radiation of different energies dispersed by the zone plate. This compound lens effectively solves the high chromatic aberration problem of zone plates. The lithography apparatus allows the use of short wavelength radiation in the 1-15 nm spectral range to print high resolution features as small as 20 nm.
Owner:XRADIA

Method of making and structure of Multilayer Laue Lens for focusing hard x-rays

A zone plate multilayer structure includes a substrate carrying a plurality of alternating layers respectively formed of tungsten silicide (WSi2) and silicon (Si). The alternating layers are sequentially deposited precisely controlling a thickness of each layer from a minimum thickness of a first deposited layer adjacent the substrate to a maximum thickness of a last deposited layer. The first minimum thickness layer has a selected thickness of less than or equal to 5 nm with the thickness of the alternating layers monotonically increasing to provide a zone plate multilayer structure having a thickness of greater than 12 μm (microns). The x-rays are diffracted in Laue transmission geometry by the specific arrangement of silicon and tungsten silicide.
Owner:UCHICAGO ARGONNE LLC

Zone Plate and Method for Fabricating Same Using Conformal Coating

A system and method for improving efficiency of zone plates fabricated by conformal layer coatings is disclosed. In embodiments, the inventive conformal layer coating zone plates provide increased zone widths from one times a deposited conformal layer coating thickness up to and including two times the conformal layer coating thickness. By designing a template that increases a mark-to-space ratio of the annular rings of the template, coating sidewalls of the annular rings with an conformal layer coating to form the zones, and then substantially filling annular channels defined by the annular rings with the conformal layer coating to form wider zones, significant efficiency increases can be achieved over conventional conformal layer coating zone plates, especially for innermost zones.
Owner:CARL ZEISS X RAY MICROSCOPY

Vacuum laser dam deformation measuring method

InactiveCN1546942ARequirements for reduced reception rangeSmall diameterUsing optical meansLight spotOptoelectronics
The invention is a measuring method for vacuum laser dam deformation, which belongs to optical, photo-sensing and geometric position measurement field. The character lies in: there sets a two-dimension position adjusting mechanism between the measuring base and the wave zone plate, when measuring, the invention adjusts the position of wave zone board relative to the measuring base through the adjusting mechanism, makes the laser focus around the centre of the laser receiver, the invention calculates the shift of the measuring point according to the shift of the wave zone plate relative to the measuring point base and the bias of the light-spot on the laser receiver. The invention reduces the diameter of the vacuum channel on the receiving end, at the same time; it also reduces the demands of the receiving range of the laser receiver, thus reduces the vacuum channel diameter, and reduces the system cost.
Owner:DALIAN UNIV OF TECH
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