33 results about "Transmission microscopy" patented technology

The magnetic tape includes a magnetic layer containing ferromagnetic hexagonal ferrite powder, abrasive, and binder on a nonmagnetic support, wherein the ferromagnetic hexagonal ferrite powder exhibits an activation volume of less than or equal to 1,800 nm3, and inclination, cos θ, of the ferromagnetic hexagonal ferrite powder relative to a surface of the magnetic layer as determined by sectional observation by a scanning electron transmission microscope is greater than or equal to 0.85 but less than or equal to 1.00.

The invention discloses a method for in situ generating a nano cellulose microfibril reinforced polymer composite material, comprising the following steps: using ionic liquid as a primary solvent, dissolving cellulose, or mixing cellulose with other polymers via solution mixing, and controlling the solubility of the cellulosic material in the solvent to maintain naturally occurring nano cellulose microfibril in the cellulosic material, so as to in situ obtain the nano cellulose microfibril reinforced polymer composite material. The nano microfibril can be observed under a transmission microscope obviously, which is different from the completely dissolved cellulose solution. In the preparing process, the dissolving temperature is controlled within 30-150 DEG C, and stirring and vacuum deaeration are used as auxiliary. By controlling the dissolving time, solution concentration and ratio of mixing, a polymer solution containing cellulose microfibril with dimension of 5-300 nanometers can be obtained. The polymer solution can be used for preparing composite material fiber, hollow fibrous membrane, diaphragm, film, gel, porous material and other known applications of enhanced material.

The present invention is a microscope slide apparatus and method of use thereof, wherein the slide has an integrated color calibration array of filter elements, each element having a given dimension, each element also having a known transmission spectrum. The complete filter array is observable in the field of view of a microscope under at least one magnification setting of a microscope. The invention further characterized with a secondary integrated filter array that is completely observable at a second magnification setting.

The present invention provides a method and apparatus for improving the signal to noise ratio, the contrast and the resolution in images recorded using an optical imaging system which produces a spatially resolved image. The method is based on the incorporation of a polarimeter into the setup and polarization calculations to produce better images. After calculating the spatially resolved Mueller matrix of a sample, images for incident light with different states of polarization were reconstructed. In a shorter method, only a polarization generator is used and the first row of the Mueller matrix is calculated. In each method, both the best and the worst images were computed. In both reflection and transmission microscope and Macroscope and ophthalmoscope modes, the best images are better than any of the original images recorded. In contrast, the worst images are poorer. This technique is useful in different fields such as confocal microscopy, Macroscopy and retinal imaging.

The invention relates to a transmission electron microscope with a near-field optical scanning function. The transmission electron microscope comprises a transmission electron microscope body. A sample rod is inserted on the transmission electron microscope body, a sample clamp for loading samples is arranged at one end of the sample rod which is hollow, a locating unit stretching to a sample is arranged in a rod body, an optical fiber probe for acquiring and leading in near-end signals is arranged on the locating unit, and the optical fiber probe is close to or attached to the sample by controlling the locating unit and in optical fiber connection with an exciting light source and / or an optical signal analyzer to achieve two-way transmission of the near-end signals. By means of the transmission electron microscope, conventional structure observation and representation is performed on samples through the transmission electron microscope, and near-field spectroscopy representation can be performed on the samples through the optical fiber probe simultaneously, accordingly, sample microstructures and optical properties are related one by one, the optical fiber probe with a metal coating can be further used for measuring sample electrical transport properties simultaneously, and the transmission electron microscope is an enormous expansion of transmission electron microscope functions.

The present invention concerns a system and method for calibration and adjustment of the pixel color values represented within a digital image of a sample by a transmission microscope. Furthermore the present invention is directed to providing sufficient color information in order to generate a color mapping matrix that allows for the creation of a synthetic image to depict the sample under a desired illumination. The system and method provides a solution that generates a destination-device independent image that is configurable to any calibrated display device.

It is possible to reliably and efficiently determine whether a specimen contains viruses, bacteria, etc. and, if it does, identify their types, regardless of the observer. Furthermore, even a newly-discovered bacterium can be quickly identified by utilizing a database at a remote location. A transmission microscope system has a microscope for observing a specimen and a database which stores, for each microscopic thing (such as a virus), a name, a specimen pretreatment method and an imaging condition used when the microscopic thing is observed, captured image data, etc. An image of the specimen is captured according to a specimen pretreatment method and an imaging condition retrieved from the database using the name of a target microscopic thing as a key, and the captured image is compared with images stored in the database to identify microscopic things present in the specimen.

The invention is concerned with the method that can locate the focusing ion beam to repair the location accurately, it is: locates the aiming area by the optics transmission microscope coordinating with the laser mark, the optics transmission microscope can show the circuitry structure directly by penetrating passive layer, the traditional method uses focusing ion beam imaging that can only show the outer layer situation of the sample, so the invention can locate the repair position of the focusing ion beam. The invention is: the laser energy of mark on the dope is lower that cannot damage the material of the sample. Moreover, the dope can be chemical reagent, such as acetone, that can be easy to scour off and daub times without number, and cannot affect the following steps.

The invention discloses a method for preparing a planar sample for a transmission electron microscope at a specific failure point. The method comprises the following steps: intercepting a piece of the sample close to the failure point on the sample by a focused ion beam, sucking the intercepted sample by a Pick-Up system and vertically placing the intercepted sample on the surface of a silicon slice, and fixing the sample on the surface of the silicon slice by means of focused ion beam gold-plating to prepare the planar sample for the transmission electron microscope. According to the method disclosed by the invention, by accurately intercepting the sample by the focused ion beam, a process of manually grinding is omitted, the success rate of sample preparation and the quality of the sample are greatly improved, and great assistance is provided for the subsequent failure analysis and structure analysis.

It is possible to reliably and efficiently determine whether a specimen contains viruses, bacteria, etc. and, if it does, identify their types, regardless of the observer. Furthermore, even a newly-discovered bacterium can be quickly identified by utilizing a database at a remote location. A transmission microscope system has a microscope for observing a specimen and a database which stores, for each microscopic thing (such as a virus), a name, a specimen pretreatment method and an imaging condition used when the microscopic thing is observed, captured image data, etc. An image of the specimen is captured according to a specimen pretreatment method and an imaging condition retrieved from the database using the name of a target microscopic thing as a key, and the captured image is compared with images stored in the database to identify microscopic things present in the specimen.

An object of the invention is to provide an azo pigment having extremely good dispersibility and dispersion stability and having excellent hue and tinctorial strength and, preferably, having a long axis observed with a transmission microscope of from 0.01 μm to 30 μm. An azo pigment which is represented by the following formula (1) and having characteristic peaks at Bragg angles (2θ±0.2°) of (i) 7.6° and 25.6°, (ii) 7.0°, 26.4°, and 27.3°, or (iii) 6.4°, 26.4°, and 27.2° in X-ray diffraction with characteristic Cu Kα line, or a tautomer thereof:

The invention discloses a method for in situ generating a nano cellulose microfibril reinforced polymer composite material, comprising the following steps: using ionic liquid as a primary solvent, dissolving cellulose, or mixing cellulose with other polymers via solution mixing, and controlling the solubility of the cellulosic material in the solvent to maintain naturally occurring nano cellulose microfibril in the cellulosic material, so as to in situ obtain the nano cellulose microfibril reinforced polymer composite material. The nano microfibril can be observed under a transmission microscope obviously, which is different from the completely dissolved cellulose solution. In the preparing process, the dissolving temperature is controlled within 30-150 DEG C, and stirring and vacuum deaeration are used as auxiliary. By controlling the dissolving time, solution concentration and ratio of mixing, a polymer solution containing cellulose microfibril with dimension of 5-300 nanometers can be obtained. The polymer solution can be used for preparing composite material fiber, hollow fibrous membrane, diaphragm, film, gel, porous material and other known applications of enhanced material.

Transmission microscopy imaging systems include a mask and / or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and / or sensor. The beam is modulated / masked either before or after transmission through a sample to induce a spatially and / or temporally encoded signal by modifying any of the beam / image components including the phase / coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed / translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.

An object of the invention is to provide an azo pigment having extremely good dispersibility and dispersion stability and having excellent hue and tinctorial strength and, preferably, having a long axis observed with a transmission microscope of from 0.01 μm to 30 μM.An azo pigment which is represented by the following formula (1) and having characteristic peaks at Bragg angles) (2θ±0.2°) of (i) 7.6° and 25.6°, (ii) 7.0°, 26.4°, and 27.3°, or (iii) 6.4°, 26.4°, and 27.2° in X-ray diffraction with characteristic Cu Kα line, or a tautomer thereof:

The invention provides an aluminum foil mesh for a transmission microscope and a scanning microscope. The thickness of the aluminum foil mesh is from 0.01 mm to 0.05 mm and the number of mesh holes is from 1 mesh to 600 meshes. A production method of the aluminum foil mesh comprises drawing, aluminum foil processing, performing photoresist, pre-baking, performing exposure, developing, rinsing, post-baking, etching and removing of photoresist. The production method of the aluminum foil mesh for the transmission microscope and the scanning microscope has the advantage of enabling obtained mesh holes of electron microscope aluminum foil meshes to be clear and hole walls of the electron microscope aluminum foil meshes to be smooth.

The invention provides a tungsten foil mesh for a transmission microscope and a scanning microscope. The thickness of the tungsten foil mesh is from 0.01 mm to 0.05 mm and the number of mesh holes is from 1 mesh to 600 meshes. A production method of the tungsten foil mesh comprises drawing, tungsten foil processing, performing photoresist, pre-baking, performing exposure, developing, rinsing, post-baking, etching and removing of photoresist. The production method of the tungsten foil mesh for the transmission microscope and the scanning microscope has the advantage of enabling obtained mesh holes of electron microscope tungsten foil meshes to be clear and hole walls of the electron microscope tungsten foil meshes to be smooth.

The invention discloses a color digital transmission microscope color correction method. A micro transmission color card is used for correcting colors of microscopic images collected by a color digital transmission microscope, since an illumination light source of the digital microscope is usually fixed, chroma characterization of a digital camera under fixed conditions is particularly suitable for color correction of the digital microscope, therefore, the color blocks in the micro transmission color card are used as training samples to establish a positive chroma characterization model of thecolor digital transmission microscope, and the model can be used for realizing accurate color correction of a shooting target; and the color accuracy of the color digital transmission microscope is improved, the method is consistent with the color perception of human eyes, the effect that what you see is what you get is achieved, the recognition degree of a target object in microscopic inspectionis significantly improved, and the accurate identification and positioning of the target object are realized.

The invention provides a di(polyoxometallate)-organic chain-cage silsesquioxane hybrid cluster compound and a preparation method thereof. The hybrid cluster compound is formed by covalent bonding of two polyoxometallates and one cage silsesquioxane through an organic chain. According to the preparation method, two polyoxometallates (Bu4N)6[H3P2W15V3O62] and one cage silsesquioxane (POSS-NH2) are connected through a six-step reaction to obtain the organic-inorganic hybrid material. The hybrid cluster compound is formed through connection via the organic chain by the means of covalent bonds andhas a precisely fixed molecular weight and molecular shape; and in solution self-assembly studies, the hybrid cluster compound is dissolved in acetone, n-decane is added, and volatilization at 25 DEGC is performed. During the volatilization of acetone, di(polyoxometallate)-organic chain-cage silsesquioxane molecules undergo self-assembling; and with a high-power transmission microscope, a stripedsheet structure is observed in a high-angle annular dark field image-scanning transmission mode.

The invention discloses a fixing device for a transmission electron microscope sample. The fixing device comprises a metal sheet, an elastic piece and a fastening piece, wherein the metal sheet consists of a thin sheet part and a hollow annular fixing part which are connected with each other; the end part of a thin sheet is used for fixing a metal net; the inner wall of the annular fixing part is provided with an annular step; the elastic piece is arranged on the annular step; the fastening piece comprises a first fixing element and a second fixing element; the first fixing element is used for fixing the annular fixing part on the second fixing element through the elastic piece. According to the fixing device disclosed by the invention, direct contact of the first fixing element of the fastening piece and the metal sheet is avoided, so that the problem of stressed deformation of the metal sheet is solved.

A proton microscope, a wavelength dispersive spectrometer, an energy dispersive spectrometer, and a micro-nano processing platform, which can achieve a proton transmission microscopy function; a proton scanning microscopy function; a proton energy spectrum analysis function; a proton diffraction spectrum function; a proton-to-atomic nucleus impact energy spectrum analysis function: bombarding a sample atomic nucleus by using a proton beam so that the atomic nucleus generates a Mossbauer spectral line, measuring the wavelength of the Mossbauer spectral line and energy of reflected and transmitted protons, and analyzing ingredients and content of the atomic nucleus as well as ingredients and content of an isotopic element; directionally combining the proton with a sample molecule so that hydrogen atoms can be added to the epitaxy or in the sample molecule: obtaining an electron by using the proton and then converting the electron into a hydrogen atom, and adding the hydrogen atom to the epitaxy or in the sample molecule to generate a new material; a micro-nano processing function of the proton beam on the sample: the proton has high mass and the sample is continuously bombarded by the proton beam under the control of a proton beam focusing system to perform micro-nano processing on the sample; and a proton beam photoetching function.

The invention provides a molybdenum foil mesh for a transmission microscope and a scanning microscope. The thickness of the molybdenum foil mesh is from 0.01 mm to 0.05 mm and the number of mesh holes is from 1 mesh to 600 meshes. A production method of the molybdenum foil mesh comprises drawing, molybdenum foil processing, performing photoresist, pre-baking, performing exposure, developing, rinsing, post-baking, etching and removing of photoresist. The production method of the molybdenum foil mesh for the transmission microscope and the scanning microscope has the advantage of enabling obtained mesh holes of electron microscope molybdenum foil meshes to be clear and hole walls of the electron microscope molybdenum foil meshes to be smooth.

The invention provides a nickel foil mesh for a transmission microscope and a scanning microscope. The thickness of the nickel foil mesh is from 0.01 mm to 0.05 mm and the number of mesh holes is from 1 mesh to 600 meshes. A production method of the nickel foil mesh comprises drawing, nickel foil processing, performing photoresist, pre-baking, performing exposure, developing, rinsing, post-baking, etching and removing of photoresist. The production method of the nickel foil mesh for the transmission microscope and the scanning microscope has the advantage of enabling obtained mesh holes of electron microscope nickel foil meshes to be clear and hole walls of the electron microscope nickel foil meshes to be smooth.

The invention provides a method for accurately positioning the repair position of the focused ion beam. The target area is mainly positioned through an optical transmission microscope and a laser mark. The optical transmission microscope can directly display the underlying circuit structure through the passivation layer, while the traditional method The focused ion beam imaging used in the present invention can only display the outermost layer of the sample, so the method of the present invention can more accurately locate the focused ion beam repair position. In addition, the laser energy used for marking on the paint is relatively low in the present invention, and the sample material will not be damaged. Moreover, the paint used can be easily washed off with chemical reagents, such as acetone, and can be applied repeatedly without affecting the subsequent steps.

The invention discloses a fixing device for a transmission microscope sample, which comprises a metal sheet, an elastic piece and a fastening piece. The metal piece is composed of connected sheet parts and a hollow ring-shaped fixing part; the end of the sheet is used to fix the metal mesh, and the inner wall of the ring-shaped fixing part has a ring-shaped step; the elastic part is arranged on the ring-shaped step; the fastener includes the first A fixing element and a second fixing element, the first fixing element fixes the annular fixing component on the second fixing element through an elastic piece. The invention avoids the direct contact between the first fixing element of the fastener and the metal sheet, and improves the problem of deformation of the metal sheet under force.

The invention discloses a method for preparing a planar sample for a transmission electron microscope at a specific failure point. The method comprises the following steps: intercepting a piece of the sample close to the failure point on the sample by a focused ion beam, sucking the intercepted sample by a Pick-Up system and vertically placing the intercepted sample on the surface of a silicon slice, and fixing the sample on the surface of the silicon slice by means of focused ion beam gold-plating to prepare the planar sample for the transmission electron microscope. According to the method disclosed by the invention, by accurately intercepting the sample by the focused ion beam, a process of manually grinding is omitted, the success rate of sample preparation and the quality of the sample are greatly improved, and great assistance is provided for the subsequent failure analysis and structure analysis.

The invention provides a tungsten foil mesh for a transmission microscope and a scanning microscope. The thickness of the tungsten foil mesh is from 0.01 mm to 0.05 mm and the number of mesh holes is from 1 mesh to 600 meshes. A production method of the tungsten foil mesh comprises drawing, tungsten foil processing, performing photoresist, pre-baking, performing exposure, developing, rinsing, post-baking, etching and removing of photoresist. The production method of the tungsten foil mesh for the transmission microscope and the scanning microscope has the advantage of enabling obtained mesh holes of electron microscope tungsten foil meshes to be clear and hole walls of the electron microscope tungsten foil meshes to be smooth.

The present invention concerns a system and method for calibration and adjustment of the pixel color values represented within a digital image of a sample by a transmission microscope. Furthermore the present invention is directed to providing sufficient color information in order to generate a color mapping matrix that allows for the creation of a synthetic image to depict the sample under a desired illumination. The system and method provides a solution that generates a destination-device independent image that is configurable to any calibrated display device.

The invention discloses a proton microscope, a wavelength dispersive spectrometer, an energy dispersive spectrometer and a micro-nano processing platform. A proton transmission microscopy function, a proton scanning microscopy function, a proton energy spectrum analysis function, a proton diffraction spectrum function, and a proton-to-atomic nucleus impact energy spectrum analysis function are achieved; a sample atomic nucleus is bombarded by a proton beam to enable the atomic nucleus to generate a mossbauer spectral line; the wavelength of the mossbauer spectral line and energy of reflective and transmission protons are measured, and ingredients and contents of the atomic nucleus and ingredients and contents of an isotopic element are analyzed; the proton is combined with a sample molecule in a directional manner, and one or more hydrogen atoms can be added in the epitaxy or interior of the sample molecule; an electron is obtained by the proton and then is converted into the hydrogen atom, and one or more hydrogen atoms can be added in the epitaxy or interior of the sample molecule to generate a new material; the proton beam has a micro-nano processing function on the sample: the proton has high mass, and the sample is bombarded continuously by the proton beam under the control of a proton beam focusing system to perform micro-nano processing on the sample; and a proton beam photoetching function is performed.