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178 results about "Transistor count" patented technology

The transistor count is the number of transistors on an integrated circuit (IC). It typically refers to the number of MOSFETs (metal-oxide-semiconductor field-effect transistors, or MOS transistors) on an IC chip, as all modern ICs use MOSFETs. It is the most common measure of IC complexity (although the majority of transistors in modern microprocessors are contained in the cache memories, which consist mostly of the same memory cell circuits replicated many times). The rate at which MOS transistor counts have increased generally follows Moore's law, which observed that the transistor count doubles approximately every two years.

Simplified wiring schemes for vertical color filter pixel sensors

Vertical-color-filter pixel sensors having simplified wiring and reduced transistor counts are disclosed. In an embodiment, a single line is used for reference voltage, pixel reset voltage, and column-output signals in a VCF pixel sensor. In another embodiment, row-reset signals and row-enable signals are sent across a line that is shared between adjacent rows in an array of VCF pixel sensors. The present invention also provides an optimized layout for a VCF pixel sensor with shared row-reset, row-enable, reference voltage and column-output lines as well as a VCF pixel sensor in which source-follower voltage, source-follower amplifier voltage and row-enable signals all share a common line. These combined line embodiments can be used with a single column-output line as well as two row-enable lines. The embodiments can also be implemented in a VCF pixel sensor without a row-enable transistor.
Owner:FOVEON

High-density low-power data retention power gating with double-gate devices

A new power gating structure with robust data retention capability using only one single double-gate device to provide both power gating switch and virtual supply / ground diode clamp functions. The scheme reduces the transistor count, area, and capacitance of the power gating structure, thus improving circuit performance, power, and leakage. The scheme is compared with the conventional power gating structure via mixed-mode physics-based two-dimensional numerical simulations. Analysis of virtual supply / ground bounce for the proposed scheme is also presented.
Owner:GLOBALFOUNDRIES US INC

Semiconductor device

Provided is a semiconductor device exemplified by an inverter circuit and a shift register circuit, which is characterized by a reduced number of transistors. The semiconductor device includes a first transistor, a second transistor, and a capacitor.One of a source and a drain of the first transistor is electrically connected to a first wiring, and the other thereof is electrically connected to a second wiring. One of a source and a drain of the second transistor is electrically connected to the first wiring, a gate of the second transistor is electrically connected to a gate of the first transistor, and the other of the source and the drain of the second transistor is electrically connected to one electrode of the capacitor, while the other electrode of the capacitor is electrically connected to a third wiring. The first and second transistors have the same conductivity type.
Owner:SEMICON ENERGY LAB CO LTD

Subunit, MAC array and bit width reconfigurable analog-digital hybrid in-memory calculation module

The invention relates to a subunit for analog-digital hybrid in-memory calculation for 1-bit multiplication, where only nine transistors are required. On this basis, it is provided that a plurality ofsubunits share a calculation capacitor and the transistors to form one calculation unit, so that the number of the transistors averaged from the subunits is close to eight. Then an MAC array is provided for multiply-add calculation, and comprises a plurality of calculation units, and the subunits in each unit are activated in a time division multiplexing mode. Furthermore, a differential system of the MAC array is provided, and the fault-tolerant capability of calculation is improved. Furthermore, the invention provides an analog-digital hybrid operation module used in the memory, which digitalizes the parallel analog output of the MAC array and performs the operation in other digital domains. The analog-to-digital conversion module in the operation module makes full use of the capacitorof the MAC array, so that the area of the operation module can be reduced, and the operation error can also be reduced. Furthermore, the invention provides a method for saving the energy consumption of the analog-to-digital conversion module by fully utilizing the data sparsity.
Owner:REEXEN TECH CO LTD

Versatile gate-array cell with interstitial transistors for compact flip-flops with set or clear

A gate-array cell uses smaller and larger transistors. Four larger transistors are provided: two n-channel and two p-channel. A small p-channel transistor is placed between the contact tabs of the polysilicon lines of the two larger p-channel transistors, and between the p-channel transistors and a N-well tap. A small n-channel transistor is similarly placed between the contact tabs of polysilicon lines of the two larger n-channel transistors, and between the n-channel transistors and a P-well tap. The cell is slightly expanded in height to accommodate the two smaller transistors. The smaller transistors enable a reduction in the number of transistors required for latches and flip-flops. The smaller transistors allow a feedback inverter to directly connect to an input, since the input can easily over-power the feedback current. This is not possible for standard gate array cells having only one transistor size. Transmission gates are eliminated when direct feedback is feasible. Thus, the smaller transistors enable a reduction in transistor count as well as being smaller in size. Clear and set are provided by larger pull-down or pull-up transistors rather than NAND gates, since the larger pull-down and pull-up transistors can easily over-power the feedback inverters.
Owner:DIODES INC

Method for designing semiconductor integrated circuit and automatic designing device

A program for automatically designing a logic circuit used for a method of designing a pass transistor circuit, by which the number of required transistors, delay time, power consumption and chip area of the pass transistor circuit is reduced. The program executes the following steps: a) receiving inputted logic functions which define the logical relationship between the inputs and the outputs, and an inputted target specification, b) generating a binary decision diagram from part of the logic functions received at (a), c) replacing the diagram nodes formed at (b) with pass transistor circuit, d) judging whether or not the simulation characteristics of the pass transistor circuit described in (c) meets the target specification described in (a), and executing the following steps when the judgment is "no", e) replacing part of the diagram generated by the procedure described in (b) with another diagram, f) allocating a new binary decision diagram to the control inputs of the nodes of the replaced diagram prepared at (e), and g) repeating the steps (c) and (d) for the diagram prepared at (f).
Owner:HITACHI LTD

High density test structure array to support addressable high accuracy 4-terminal measurements

Circuits for performing four terminal measurement point (TMP) testing of devices under test (DUT) is provided. The DUT and the circuit is to be defined on a semiconductor chip. The circuit includes a DUT having a first terminal and a second terminal, where the first terminal of the DUT is connectable to a first terminal measurement point and a third terminal measurement point, and the second terminal of the DUT is connectable to a second terminal measurement point and a fourth terminal measurement point. A first transistor is provided to select access to the first terminal measurement point, a second transistor is provided to select access to the third terminal measurement point, a third transistor is provided to select access to the second terminal measurement point; and a fourth transistor is provided to select access to the fourth terminal measurement point. In one example, the DUT is linked to neighboring DUTs, and selected ones of the first through fourth transistors are shared, thus reducing the number of transistors per DUT in a DUT bank, and reducing the area needed to implement DUT bank testing for addressable 4-TMP testing. The compact circuitry further enables DUT bank stacking in rows, addressing of columns of DUTs for conditional testing, and three dimensional stacking of DUT banks on different levels.
Owner:PDF SOLUTIONS INC

Non-volatile latch circuit that has minimal control circuitry

A non-volatile latch circuit that has minimal control circuitry is disclosed. The non-volatile latch circuit is typically used in applications where only several bits of data need to be stored in non-volatile memory. The non-volatile latch circuit can be programmed and read using three control signals: a programming voltage / supply voltage signal, a data in signal, and a read / {overscore (write signal. By using fewer control signals, the number of transistors used to implement the control circuitry within the non-volatile latch circuit is reduced and thus the non-volatile latch circuit consumes less chip area / volume on an integrated circuit device.
Owner:FAIRCHILD SEMICON CORP
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