31 results about "Light field microscopy" patented technology

Methods and systems are provided for enhancing the imaging resolution of three dimensional imaging using light field microscopy. A first approach enhances the imaging resolution by modeling the scattering of light that occurs in an imaging target, and using the model to account for the effects of light scattering when de-convolving the light field information to retrieve the 3-dimensional (3D) volumetric information of the imaging target. A second approach enhances the imaging resolution by using a second imaging modality such as two-photon, multi-photon, or confocal excitation microscopy to determine the locations of individual neurons, and using the known neuron locations to enhance the extraction of time series signals from the light field microscopy data.

The invention discloses a light-field microscope three-dimensional reconstruction method and device based on a deep learning algorithm, wherein the method comprises: building a light-field microscope imaging system; obtaining the point diffusion of the imaging system by simulating the light-field microscope imaging system function; generate a simulated sample volume distribution data set; generate a simulated light field data set through the point spread function and the corresponding sample data, and correct the possible noise and background model; build a deep convolutional neural network to simulate the light field data As the input of the network, the simulated sample body distribution data is used as the output of the network, and the network is trained according to the microscopic sample design loss function; after the model training is completed, the light field microscopic data to be reconstructed is input into the model for testing. Obtain the predicted value of the corresponding sample body distribution data. The method can achieve fast, high-resolution, and less artifact three-dimensional reconstruction of light field data while maintaining the advantage of the light field for fast collection of three-dimensional information.

This application proposes a correction method and device for a large-field high-resolution light field microscope system, which relates to the technical fields of computer graphics and computer vision, wherein the method includes: collecting light field images at multiple axial positions of the calibration plate ;Collect the white light field image without adding the calibration board; collect the noise image; process the white light field image and the noise image to obtain the light field decoding parameters; use the light field decoding parameters to decode the light field image to obtain 4-dimensional light field data; Imaging system distortion is corrected using 4D light field data corresponding to light field images at multiple axial positions. Using the above scheme, this application utilizes the light field images of calibration plates at different axial positions to realize large field of view light field correction, which alleviates the influence of imaging distortion in the large field of view light field, and improves the results of microscopic three-dimensional reconstruction of large field of view and high resolution light field .

A light field microscopy method based on FPM, comprising the steps of: building a light field microscopy platform based on FPM; collecting images with high resolution and wide field of view with the light field microscopy platform based on FPM; The field of view image is separated from the view angle; the result of the view separation is used to refocus to obtain the desired result. The present invention uses a light field microscope based on the FPM algorithm to collect light field information, improves the imaging resolution of each microlens in the light field microscope, improves the angular resolution, thereby enriches the collected light field information, and enables objects to Rebuild better 3D structures.