Calibration method and device for large-field-of-view high-resolution light-field microscopy system

Abstract

This application proposes a correction method and device for a large-field high-resolution light field microscope system, which relates to the technical fields of computer graphics and computer vision, wherein the method includes: collecting light field images at multiple axial positions of the calibration plate ;Collect the white light field image without adding the calibration board; collect the noise image; process the white light field image and the noise image to obtain the light field decoding parameters; use the light field decoding parameters to decode the light field image to obtain 4-dimensional light field data; Imaging system distortion is corrected using 4D light field data corresponding to light field images at multiple axial positions. Using the above scheme, this application utilizes the light field images of calibration plates at different axial positions to realize large field of view light field correction, which alleviates the influence of imaging distortion in the large field of view light field, and improves the results of microscopic three-dimensional reconstruction of large field of view and high resolution light field .

Description

technical field [0001] The present application relates to the technical fields of computer graphics and computer vision, and in particular to a correction method and device for a large-field-of-view high-resolution light-field microsystem. Background technique [0002] Light field microscopy is an important tool for three-dimensional observation of cells. There is a compromise between spatial resolution and field of view in traditional light field microscopy systems, and the field of view of light field microscopy systems with micron-level resolution is generally 1 mm or hundreds of microns. However, many biological activities, such as brain nerve activity and tumor cell migration, have a relatively wide range of activities, generally at the millimeter level or larger. In order to realize the three-dimensional observation of cell activity process with micron-scale resolution within a large field of view, a high-resolution light field microscope system with a large field of ...

AI Technical Summary

Problems solved by technology

[0004] For this reason, the first purpose of this application is to propose a large-field-of-view high-resolution light-field microscopy system correction method, which solves the technical problem of image distortion at various viewing angles caused by field curvature in the large-field light-field microscopy system. By collecting the light field images of the calibration plate at different axial positions, estimating the optical path difference of each viewing angle, using the estimated optical path difference data to correct the images of each viewing angle, and then reconstructing the spatial structure of the sample with the three-dimensional deconvolution method, the large viewing angle is realized. Field light field correction, which alleviates the influence of imaging distortion in the large field of view light field, and improves the results of large field of view high-resolution light field microscopic 3D reconstruction

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