Optical field microimaging-based micro-scale three dimensional industrial detection system

Abstract

An optical field microimaging-based micro-scale three dimensional industrial detection system belonging to the machine vision technology field disclosed by the present invention comprises an optical field microcamera system and a data processing system, the optical field microcamera system is composed of an optical field microcamera, an annular light source and a camera calibration plate, and thedata processing system comprises a GPU high-speed image parallel processing unit, an optical field camera-based depth estimation algorithm and an optical filed microscope-based three-dimensional reconstruction algorithm. An optical field imaging technology of the present invention can measure the three-dimensional configurations of the complex objects via a single device and the individual shooting, is very suitable for substituting for a conventional industrial detection camera in the micro-scale measurement, and measures the three-dimensional sizes of the micro-scale objects while simplifying a hardware system and reducing the cost.

Description

technical field [0001] The invention relates to the fields of microscopic imaging and machine vision, in particular to a microscale three-dimensional industrial detection system with a microlens array based on light field microscopic imaging. Background technique [0002] In the field of industrial inspection in industrial manufacturing, machine vision technology is often used to solve problems. In industrial inspection, for micro-scale objects, various types of three-dimensional inspection technologies are usually used to inspect products. Three-dimensional inspection does not rely on a single technology. Various reconstruction techniques have their advantages and disadvantages. Currently, there is no general reconstruction technique, and instruments and methods are often limited by the surface characteristics of objects. For example, optical techniques are not easy to handle shiny (high albedo), mirror or translucent surfaces, while laser techniques are not suitable for f...

AI Technical Summary

Problems solved by technology

3D inspection does not rely on a single technology. Various reconstruction techniques have their advantages and disadvantages. Currently, there is no general reconstruction technique. Instruments and methods are often limited by the surface characteristics of objects.

Although the multi-eye stereo vision system has a relatively low cost, its accuracy and requirements for shooting conditions are high, and its applicability is not strong. It needs a larger shooting window to arrange the camera, and it is more difficult to arrange the measurement window for micro-scale objects.

3D laser scanning technology can quickly and massively collect spatial point information, but there are disadvantages such as generally high cost, contradictions in accuracy, ranging and scanning speed, not suitable for precise surfaces, and unable to meet the needs of small micro-scale objects. Measurement window requirements

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