129 results about "Echelle grating" patented technology

Echelle gratings and microelectromechanical system (MEMS) digital micromirror device (DMD) detectors are used to provide rapid, small, and highly sensitive spectrometers. The new spectrometers are particularly useful for laser induced breakdown and Raman spectroscopy, but could generally be used with any form of emission spectroscopy. The new spectrometers have particular applicability in the detection of improvised explosive devices.

An optical equalizer / dispersion compensator (E / CDC) comprises an input / output for receiving a multiplexed channel signal comprising a plurality of channel signals of different wavelengths. An optical amplifier may be coupled to receive, as an input / output, the multiplexed channel signals which amplifier may be a semiconductor optical amplifier (SOA) or a gain clamped-semiconductor optical amplifier (GC-SOA). A variable optical attenuator (VOA) is coupled to the optical amplifier and a chromatic dispersion compensator (CDC) is coupled to the variable optical attenuator. A mirror or Faraday rotator mirror (FRM) is coupled to the chromatic dispersion compensator to reflect the multiplexed channel signal back through optical components comprising the chromatic dispersion compensator, the variable optical attenuator and the optical amplifier so that the multiplexed channel signal is corrected partially for equalization and chromatic dispersion compensation with respect to each pass through these optical components. The E / CDC components may be integrated in a photonic integrated circuit (PIC) chip. In several embodiments, a photonic integrated circuit (PIC) chip comprises an input into the chip that receives at least one channel signal having experienced chromatic dispersion, a chromatic dispersion compensator (CDC) that separates the at least one channel signal into separate wavelength components over a free spectral range (FSR) spanning only a signal channel width and subjects the wavelength components to a phase shift to change the wavelength group delay in the wavelength components and that recombines the wavelength components to reconstitute the at least one channel signal, and an output from the chip for the recombined at least one channel signal having reduced chromatic dispersion compared to the same channel signal received at the chip input. The CDC device may include a tuning section to vary the phase shift of wavelength components as they propagate through the device. Such a CDC device may include a Mach-Zehnder interferometer (MZI) or a cascaded group of Mach-Zehnder interferometers, or at least one arrayed waveguide grating (AWG) or at least one Echelle grating.

The invention provides a method for manufacturing triangular groove echelon gratings with 90-degree vertex angles. Each triangular groove echelon grating is composed of a silicon grating structure (1), photoresist (3) and a metal film (4). A manufactured grating groove is a triangle with the vertex angle being 90 degrees, so that the diffraction efficiency higher than that of an echelon grating with the vertex angle being not 90 degrees can be achieved. Each grating structure is produced in an obliquely-cut monocrystalline wafer, the shining angles of the gratings are determined by an obliquely-cut angle for cutting each silicon wafer, and gratings with any blazing angles can be manufactured; according to the 90-degree vertex angles, grooves of silicon gratings with the vertex angles being not 90 degrees are filled with photoresist, then photoetching is conducted again, and the original silicon gratings with the vertex angles being not 90 degrees are converted into the triangular groove gratings with the vertex angles being 90 degrees. According to the manufactured grating structure, the shining face of each grating is a smooth monocrystal silicon <111> grate plane, scattering can be effectively lowered, and the diffraction efficiency of each grating is improved. The purpose that all the gratings have high diffraction efficiency on a broadband is achieved according to the fact that using wave bands can choose to be coated with various different reflecting film layers on the surfaces of the gratings.

A novel endoscope, which can be a spectrally encoded endoscope (SEE) probe having forward-view, side-view, or a combination of forward and side views is provided herein. The SEE probe includes a light guiding component, a light focusing component, and a grating component. The probe is configured to forward a light such as a spectrally dispersed light from the grating component to a sample with no intermediate reflections between light guiding component and the grating component. A triangular grating, such as a staircase grating or an overhang grating may be used as the grating component.

The invention discloses a light path structure of an echelle grating spectrometer, which belongs to the technical field of light spectrum. The invention aims to provide a light path structure applied to high-resolution wide-spectral-range and full-spectrum direct-reading spectrum analysis. According to the technical solution of the invention, the light path structure comprises a condensing mirror, an incident pinhole, a parabolic collimating lens, an echelle grating, a cross dispersion prism set, a parabolic focusing mirror and a detector; light to be measured is collected by the condensing mirror and enters the light path of a spectrometer through the incident pinhole; an incident light beam is collimated into parallel light beams by the parabolic collimating lens, then after the parallel light beams are processed by the echelle grating and the cross dispersion prism set to generate two-dimensional cross dispersion, then the two-dimensional cross dispersion is imaged to a target surface of the detector by the parabolic focusing mirror, thereby obtaining a two-dimensional dispersing spectral image. The light path structure of an echelle grating spectrometer disclosed by the invention is simple and reliable in structure, has no movable parts, and does not need to carry out multiple scanning.

A silicon photonics device and system therefor. The silicon photonics device can include a 300 nm SOI (silicon-on-insulator with 300 nm top Si) overlying a substrate member. A waveguide structure can be configured from a portion of the SOI layer and disposed overlying the substrate member. This waveguide structure can include an AWG (Arrayed Waveguide Gratings) structure with 300 nm×300 nm symmetric grating waveguides or an Echelle grating structure characterized by a top silicon thickness of 300 nm. The waveguide structure can also include an index compensator material configured to provide at least two material index ratings in the waveguide structure.

A monolithic transmitter photonic integrated circuit (TxPIC) chip and a monolithic receiver photonic integrated circuit (RxPIC) chip include a plurality of optical signal channels together with other active elements integrated on a semiconductor chip, which chips further include an optical combiner or decombiner that is a wavelength selective comprising a supergrating or an Echelle grating which provides for a more compact chip compared to an integrated on-chip arrayed waveguide grating functioning as a wavelength selective combiner or decombiner.

A tunable optical filter includes a demultiplexing device, such as an arrayed waveguide grating (AWG) or echelle grating, for separating a multiplexed optical signal into a plurality of demultiplexed optical signals. An imaging lens converges the plurality of demultiplexed optical signals to a common point on a tiltable reflector, which for example is a microelectromechanical system (MEMS) mirror. The tiltable reflector is rotated about a first axis to select which one of the demultiplexed optical signals in the plurality the tunable optical filter is tuned to. More specifically, the tiltable reflector is rotated about the first axis to select which one of the demultiplexed optical signals will be reflected with an angle that allows it to repass through the demultiplexing device and be output from an output port of the tunable optical filter.

A spectrometer assembly (10), comprising an Echelle grating (18; 46) for dispersing radiation entering the spectrometer assembly (10) in a main dispersion direction, and a dispersion assembly (16; 40) for dispersing a parallel radiation bundle generated from the radiation entering the spectrometer assembly in a lateral dispersion direction, is characterized in that the dispersion assembly (16; 40) is reflective, and the dispersion assembly (16; 40) is arranged relative to the Echelle grating (18; 46) in such a way that the parallel radiation bundle is reflected in the direction of the Echelle grating. The Echelle grating (18; 46) may be arranged in such a way that the dispersed radiation is reflected back to the dispersion assembly (16; 40).

The invention discloses a wide-spectrum spatial heterodyne spectrometer, which overcomes the defect that the conventional spatial heterodyne spectrometer has a narrow spectrum in the prior art. A blazed grating component consists of a first echelle grating and a second echelle grating which are respectively positioned on a reflection light path and a transmission light path formed by a beam splitting element for the first time; an angle relationship and a position relationship between the two echelle gratings are that: (1) a reflection beam and a transmission beam which are split by the beam splitting element for the first time are transmitted to the two echelle gratings at a Littrow angle; and (2) by taking the conventional position relationship between the blazed grating component and the beam splitting element as the standard, the first echelle grating rotates alpha / 4 degrees around a first rotating shaft, and the second echelle grating rotates -alpha / 4 degrees around a second rotating shaft; and a controllable optical shutter serving as a hierarchy selection mask is arranged at a superposed position of focal planes of a fringe imaging system. The wide-spectrum spatial heterodyne spectrometer has the advantages of high stability, high spectral resolution and wide-spectrum coverage, and is very suitable for satellite-borne spatial environment remote sensing and atmospheric sounding.

An optical de-MUX includes a sub-wavelength grating that magnifies an input optical signal. In particular, along a direction perpendicular to a propagation direction of the optical signal, the sub-wavelength grating has a spatially varying effective index of refraction that is larger at a center of the sub-wavelength grating than at an edge of the sub-wavelength grating. Moreover, the optical de-MUX includes an optical device that images and diffracts the optical signal using a reflective geometry, and which provides different diffraction orders to output ports. For example, the optical device may include an echelle grating.

Using silicon photonic components that support a single polarization, the output of an optical receiver is independent of the polarization of an optical signal. In particular, using a polarization-diversity technique, the two orthogonal polarizations in a single-mode optical fiber are split in two and processed independently. For example, the two optical signals are provided by a polarizing splitting grating coupler. Subsequently, a wavelength channel in the two optical signals is selected using a wavelength-selective filter (for example, using a ring resonator or an echelle grating) and combined at an optical detector (such as a photo-detector) to achieve polarization-independent operation.

The invention provides a high resolution spectrometer and an optical calibrating method thereof. The high resolution spectrometer is a hadamard transform spectrometer and comprises a light entrance port, a collimating lens, a grating, a first focusing lens, a digital micromirror, a second focusing lens and a detector according to the incident light sequence. A prism is arranged between the first focusing lens and the second focusing lens. The grating is an echelle grating. The digital micromirror is a two-dimensional digital micromirror. The spectrometer can be applied to spectral analysis.

A monolithic receiver photonic integrated circuit (RxPIC) chip includes a plurality of optical signal channels together with other active elements integrated on a semiconductor chip, which chips further include a wavelength selective decombiner comprising a supergrating or an Echelle grating which provides for a more compact chip compared to an integrated on-chip arrayed waveguide grating (AWG) functioning as a wavelength selective decombiner.

The invention relates to a method for adjusting a small echelle grating spectrometer. The method comprises the following steps of: fixedly arranging a first incidence pinhole and enabling laser light of a first visible laser device to be incident into the first incidence pinhole; adjusting the position and the angle of a collimating lens so that the collimating lens works in the optimum state; eliminating rolling errors and pitching errors of a crossed dispersion prism; adjusting the position and the angle of a focus lens so that the focus lens works in the optimum state; arranging and adjusting echelle grating and preliminarily adjusting the incidence angle of the echelle grating; adjusting the position of an image plane of an area-array detector and rolling errors of the image plane; and precisely adjusting the incidence angle of the echelle grating and the incidence angle of the crossed dispersion prism. Required professional auxiliary devices are few, the method is an accurate adjusting method which is simple and convenient to operate and easy to apply, and is beneficial for realizing spectrum analysis, with high resolution, wide spectrum range and a transient full-spectrum direct-reading function, of the echelle grating spectrometer.

An optical source uses feedback to maintain a substantially fixed spacing between adjacent wavelengths in a set of wavelengths in a wavelength comb output by the optical source. In particular, a set of light sources in the optical source provide optical signals having the set of wavelengths. Moreover, the optical signals are output at diffraction angles of an optical device in the optical source (such as an echelle grating), and optical detectors in the optical source determine optical metrics associated with the optical signals. Furthermore, control logic in the optical source provides control signals to the set of light sources based on the determined optical metrics.

The invention provides a debugging method of an echelle grating spectrograph, belonging to the technical field of spectrums. The method comprises the following steps: allocating a laser, a standard light source and a plane mirror for debugging; installing an optical system and detector assemblies of the spectrograph by taking the laser light as reference beam, and replacing the echelle grating by the plane mirror; replacing the standard light source, adjusting the position of the detector according to a spectrum image obtained on the detector to optimize the whole image quality; according to the deviation between an X-directional position of light spots on the spectrum and a spectral line position of an ideal spectrum model, adjusting the placing angle of a reflecting prism unit; replacing the plane mirror by the echelle grating, and adjusting a pitch angle of the echelle grating according to an Y-directional position of the light spots in the spectrum; and comparing the spectrum images of the adjusted detector with the ideal spectrum models, when the spectrum images are similar to the ideal spectrum models, reversely calculating accurate state parameters according to the practical spectrum and adjusting the spectrum models to adapt to the practical images. The method has the advantages that less tools are need and the operation is simple; and furthermore, the debugging operation of the echelle grating spectrograph can be effectively simplified.

A silicon photonics device and system therefor. The silicon photonics device can include a 300 nm SOI (silicon-on-insulator with 300 nm top Si) overlying a substrate member. A waveguide structure can be configured from a portion of the SOI layer and disposed overlying the substrate member. This waveguide structure can include an AWG (Arrayed Waveguide Gratings) structure with 300 nm×300 nm symmetric grating waveguides or an Echelle grating structure characterized by a top silicon thickness of 300 nm. The waveguide structure can also include an index compensator material configured to provide at least two material index ratings in the waveguide structure.

The invention relates to a spectrometer arrangement (10) comprising a spectrometer (14) for producing a spectrum of a first wavelength range of radiation from a radiation source on a detector (42). Said arrangement also comprises: an Echelle grating (36) for the spectral decomposition of the radiation penetrating the spectrometer arrangement (10) in a main dispersion direction (46); a dispersing element (34) for separating the degrees by means of spectral decomposition of the radiation in a transversal dispersion direction (48) which forms an angle with the main dispersion direction of the Echelle grating (36), in such a way that a two-dimensional spectrum (50) can be produced with a plurality of separated degrees (52); an imaging optical element (24, 38) for imaging the radiation penetrating through an inlet gap (20) into the spectrometer arrangement (10), in an image plane (40); and a surface detector (42) comprising a two dimensional arrangement of a plurality of detector elements in the image plane (40). The inventive arrangement is characterised in that another spectrometer (12) comprising at least one other dispersing element (64) and another imaging optical element (60,66) is provided in order to produce a spectrum (68) of a second wavelength range of radiation, which is different from the first wavelength range, from a radiation source on the same detector (42). The spectra can be spatially or temporally separated on the detector.

The invention discloses a method for quantitatively detecting multiple heavy metals in leather at the same time based on an LIBS (Laser-Induced Breakdown Spectroscopy) technology. The method adopts an LIBS detecting system which is formed by a Q-switched pulse Nd:YAG (Yttrium Aluminum Garnet) laser, an echelle grating spectrometer, an ICCD (Intensified Charge-Coupled Device) detector, a rotating platform and the like. The method comprises the following steps: firstly, regulating laser energy by an energy attenuation system consisting of a half-wave plate and a laser Glan prism, gathering the laser energy on the surface of a sample which is fixed to the rotating platform through a focusing lens, and ablating, gasifying and ionizing substances on the surface of the detected sample, thus forming laser plasma; secondly, obtaining a spectral signal of the laser plasma through a spectrum collection system, analyzing and converting element types corresponding to a spectral line, and obtaining content information of characteristic elements through conversion; thirdly, obtaining concentrations of heavy metal elements by combining a CF (Calibration-free)-LIBS method according to the obtained information of the elements.

An Echelle grating has alternate first (1a) and second (1b) sets of facets (1). The first set of facets (1a) is operative to reflect incident light (4) for diffraction and the second set of facets (1b) extends between adjacent facets of the first set (1a). Only the first set of facets (1a) is metallized to enhance reflection. The second set of facets (1b) is left unmetallized. This configuration reduces polarization dependent loss (PDL).

An optical receiver is described. Using silicon-photonic components that support a single polarization, the output of an optical receiver is independent of the polarization of an optical signal. In particular, using a polarization-diversity technique, the two orthogonal polarizations in a single-mode optical fiber are split in two and processed independently. For example, the two optical signals may be provided by a polarization-splitting grating coupler. Subsequently, a redistribution element provides mixtures of the two optical signals. Next, a wavelength channel in the two mixed optical signals is selected using a wavelength-selective filter (for example, using ring-resonator drop filters or an echelle grating) and converted into an electrical signal at an optical detector (such as a photodetector) to achieve polarization-independent operation.

The invention discloses a quick detecting device and method of toxic and harmful organic chemical pollutants in a water body. The quick detecting device and method are used for meeting the demands of safety precaution of drinking water of our country and quick online detection of the toxic and harmful organic chemical pollutants in the water body and overcoming the defects of the existing detecting measures. A narrow-band LED (Light Emitting Diode) servers as an excitation light source, an echelle grating serves as a fluorescence optical splitter, and a gating ICCD (Intensified Charge Coupled Device) serves as a fluorescence detector for researching the quick detecting method and system of the toxic and harmful organic chemical pollutants in the environmental water body of our country and developing a quick online detecting model machine with high sensitivity on the toxic and harmful organic chemical pollutants in the water body, the toxic and harmful organic chemical pollutants in the water body are quickly and effectively measured in a laboratory, the manual sampling is avoided, the structure of an instrument is simple, and the utilization rate of the excitation light source is high and the detecting speed is high, so that the quick detecting device and method are suitable for online detecting and early-warning on the trace toxic and harmful organic chemical pollutants in the natural water body and online emission reduction monitoring on industrial waste water so as to reflect the pollution condition of the water body in real time.

An apparatus for use in optical communication systems to multiplex / demultiplex an optical signal consisting of an optical channel(s) of distinct wavelength(s) having a select channel spacing within a select wavelength range. The apparatus includes a plurality of optical waveguides aligned generally along the same optical axis with each having a propagating end. At least two of the optical waveguides each propagate a distinct multiplexed optical signal comprising a plurality of channels, with the multiplexed optical waveguides being arranged in a multiplexed linear array. The others of the optical waveguides are single channel waveguides arranged in a two dimensional array with linear rows perpendicular to the multiplex linear array and with each linear row corresponding to a multiplex optical waveguide. A reflective echelle grating is optically coupled to the plurality of optical waveguides along the optical axis and receives an optical signal emitted from at least one of the optical waveguides and detracts the optical signal(s) to at least one other of the optical waveguide(s).

An Echelle spectrometer arrangement (10) with internal order separation contains an Echelle grating (34) and a dispersing element (38) for order separation so that a two-dimensional spectrum having a plurality of separate orders (56) can be generated, an imagine optical system (18, 22, 28, 46), a flat-panel detector (16), and predispersion means (20) for predispersing the radiation into the direction of traverse dispersion of the dispersion element (38). The arrangement is characterized in that the predispersion means (20) comprise a predispersion element which is arranged along the optical path behind the inlet spacing (12) inside the spectrometer arrangement. The imaging optical system is designed in such a manner that the predispersed radiation can be imaged onto an additional image plane (24) which does not have any boundaries in the predispersion direction and which is arranged along the optical path between the predispersion element (20) and the echelle grating (34). Optical means (20, 68) in the area of the predispersed spectrum are arranged to influence the spatial and / or the spectral beam density distribution on the detector (16).

The invention provides a dayglow temperature photometer and a method thereof for detecting airglow spectrum intensity and temperature. An echelon grating and a narrow-band interference filter equipped with a micro-angle stepping motor are organically combined to serve as a core device of the dayglow temperature photometer, the high spectral resolution is obtained, the range of spectrum detection is broaden by rotating narrow-band filter, and luminous intensity and temperature of dayglows in an upper atmosphere are detected simultaneously by utilizing a high-resolution spectroscopic method and a rotational spectral-line temperature-measuring method. The dayglow temperature photometer comprises four portions including a light guide system, a telescopic system, a light splitting system and an imaging system which are sequentially arranged.

The invention relates to the field of raman spectrometer, in particular to a medium-stepped grating type spatial heterodyne raman spectrometer optical path structure. Two middle-step gratings (or onemiddle-step grating and one plane reflector) are adopted, and a spatial heterodyne interference effect is generated to realize spatial heterodyne raman spectrum measurement, so that the problems of low measuring efficiency, low resolution and small visual field broadening angle due to the fact that a moving part is generally arranged in a traditional fourier transform raman spectrometer are solved. The use level N of the middle-step grating is larger than 1. Under the condition that the range of the total measuring wave band of the raman spectrum of an optical path remains unchanged, the morethe use level N of the middle-step grating is, the higher the raman spectrum resolution of the optical path structure is. The back scattering raman spectrum of a sample can be measured, and the transmission raman spectrum of the sample can also be measured.

A bidirectional multiplexer and demultiplexer based on a single waveguide grating is presented. In one embodiment of the invention, the device contains a multi / demultiplexer having an echelle grating disposed between a plurality of input channels and a plurality of output channel arrays. The input and output channels are assigned in a particular order, such that the multiplex and demultiplex functions have the same wavelength channels and such that the blaze angle of the grating facets are optimized simultaneously for both the multiplex and demultiplex function. Because the optical signals are multiplexed and demultiplexed by the same dispersive element, problems of mismatching performance introduced by using different optical components are obviated. The input / output waveguides of the dual-function device can be coupled to a single fiber array, thus reducing the packaging cost.

The invention belongs to the field of optical splitting systems of spectrometers, and relates to an echelle grating posture adjustment method and a calibration device of a spectrometer. According to the adjustment method, an echelle grating diffraction theory is employed; relative positions of light spot images of a plurality of orders of diffraction of an echelle grating on the echelle grating posture adjustment calibration device are precisely calculated according to particular parameters of an optical splitting module system; corresponding marks are made; accordingly, a three-dimensional posture of the echelle grating is adjusted via a fixing structure of the echelle grating. The calibration device is designed on a basis of the particular parameters of the echelle grating diffraction theory and the optical system, is precise in calculation, easy to realize and high in operability and can precisely achieve posture adjustment of the echelle grating in the spectrometer; in addition, the echelle grating posture adjustment calibration device is high in applicability; when the relevant optical parameters of the optical system are changed, the corresponding positions of light spots ofthe orders of diffraction of the echelle grating are required to be recalculated and redesigned.

An MCM may include a single optical routing layer that provides point-to-point connectivity among N chips in the MCM, such as all-to-all connectivity or full-mesh point-to-point connectivity. Moreover, the optical routing layer may include: N optical waveguides optically coupled to the N chips and a cyclic de-multiplexer, optically coupled to the N optical waveguides, that routes optical signals among the N optical waveguides without optical-waveguide crossing in the optical routing layer. For example, the cyclic de-multiplexer may include: an array-waveguide-grating (AWG) wavelength router and / or an echelle-grating wavelength router.