Debugging method of echelle grating spectrograph

Abstract

The invention provides a debugging method of an echelle grating spectrograph, belonging to the technical field of spectrums. The method comprises the following steps: allocating a laser, a standard light source and a plane mirror for debugging; installing an optical system and detector assemblies of the spectrograph by taking the laser light as reference beam, and replacing the echelle grating by the plane mirror; replacing the standard light source, adjusting the position of the detector according to a spectrum image obtained on the detector to optimize the whole image quality; according to the deviation between an X-directional position of light spots on the spectrum and a spectral line position of an ideal spectrum model, adjusting the placing angle of a reflecting prism unit; replacing the plane mirror by the echelle grating, and adjusting a pitch angle of the echelle grating according to an Y-directional position of the light spots in the spectrum; and comparing the spectrum images of the adjusted detector with the ideal spectrum models, when the spectrum images are similar to the ideal spectrum models, reversely calculating accurate state parameters according to the practical spectrum and adjusting the spectrum models to adapt to the practical images. The method has the advantages that less tools are need and the operation is simple; and furthermore, the debugging operation of the echelle grating spectrograph can be effectively simplified.

Description

technical field [0001] The invention belongs to the field of spectrum technology, and relates to a method for installing and adjusting an echelle grating spectrometer. Background technique [0002] Spectroscopic instruments are important analytical and testing instruments widely used in scientific research, industrial production and other fields. Adapting to the application requirements of higher resolution, wider spectral range, and full-spectrum direct reading is the development direction of spectral analysis instruments. The echelle grating spectrometer uses a high dispersion, high resolution, full-wave blazed echelle grating as the main spectroscopic element, and its resolution is more than 20 times higher than that of conventional spectrometers, and it has the advantages of small size and full-spectrum transient direct reading. High-end spectroscopic analysis instrument. The installation and adjustment of such instruments are usually more complicated: because the eche...

AI Technical Summary

Problems solved by technology

The installation and adjustment of such instruments are usually more complicated: because the echelle spectrometer uses a small and medium-sized optical system, the cross-dispersion optical path structure makes the chief rays of the system not in the same plane; the radius of curvature of the concave optical element is small, and the surface The surface shape is relatively curved, and the size of the planar optical elements is small, which limits the accuracy of the reference, and most of the edges of these optical elements are not placed along the horizontal or vertical direction. Requires benchmarking; smaller instrument size increases susceptibility to optic placement errors

Based on the above reasons, it is more complicated to install and adjust the échelle grating spectrometer using the general method, and it is not easy to guarantee the accuracy

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