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140results about How to "Possible to obtain" patented technology

Vehicle control device

In a vehicle control device, a basic steering amount calculation section calculates a basic steering amount to drive an own vehicle on a basic route along a driving lave. A posture detection section detects a vehicle posture state indicated by a lateral position and an angle of yaw. An offset distance detection section detects an offset distance between the basis route and the lateral position. A correction steering amount calculation section calculates a correction steering amount as a steering control amount to drive the own vehicle along a virtual correction route. The posture of the own vehicle is alien with a predetermined target posture at a predetermined virtual target point by using the virtual correction route. An instruction steering amount calculation section calculates an instruction steering amount on the basis of the basic steering amount and the correction steering amount.
Owner:DENSO CORP

Video Quality Estimation Apparatus, Method, and Program

In estimating subjective video quality corresponding to main parameters (121 / 221) which are input as an input coding bit rate (121B / 221B) representing the number of coding bit rates per unit time and an input frame rate (121A / 221A) representing the number of frames per unit time of an audiovisual medium, an estimation model specifying unit specifies, on the basis of the input coding bit rate (121B / input frame rate (221A)), an estimation model (122 / 222) representing the relationship between subjective video quality and the frame rate ( / coding bit rate) of the audiovisual medium. Subjective video quality corresponding to the input frame rate (121A / input coding bit rate 221B) is estimated by using the specified estimation model (122 / 222) and output as an estimation value (123 / 223).
Owner:NIPPON TELEGRAPH & TELEPHONE CORP

Remote monitoring of factory automation users

A method and system for monitoring a factory automation product via a communications network. The factory automation product is installed at an installation site having an installation site address and includes identifiable information such as a product number, a version number, a serial number and a MAC address. By obtaining the installation site address and the identifiable information, it is possible to associate the installation site address to the factory automation product based on the identifiable information. Based on the installation site address, it is possible to determine whether the factory automation product is used in violation of licenses.
Owner:SCHNEIDER AUTOMATION INC

Optical information recording medium, optical information recording apparatus, information processing apparatus, optical information recording method, program and recording medium

An optical disk 101 includes a plurality of recording layers 102 and 103 and allows recording of information on each of the recording layers 102 and 103. A spiral guide groove having wobbles meandering in radial directions of the optical disk 101 is formed on each of the recording layers 102 and 103. Recording data can be recorded on or between the guide grooves. ADIP, which is address information embedded by wobble modulation of the guide groove, is recorded. The address information indicates positional information with respect to a radial direction of the recording layer 102 or 103 of the optical disk 101 on which the wobbles of the guide groove are formed.
Owner:RICOH KK

Device for measuring metal/semiconductor contact resistivity

A device for measuring the resistivity ρc of an interface between a semiconductor and a metal, comprising at least:one dielectric layer,at least one semiconductor-based element of a substantially rectangular shape, which is arranged on the dielectric layer, having a lengthwise L and widthwise W face in contact with the dielectric layer and having a thickness t,at least two interface portions containing the metal or an alloy of said semiconductor and said metal,each of the two opposing faces of the semiconductor element, having a surface equal to t×W and being perpendicular to the face in contact with the dielectric layer, being completely covered by one of the interface portions.
Owner:COMMISSARIAT A LENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES

Loop-back method for measuring the interface timing of semiconductor memory devices using the normal mode memory

The invention relates to a method for testing a semiconductor memory device, the semiconductor memory device being able to be operated in a normal operating mode and a test mode. The method for testing includes communicating test input data to be used for a test to the semiconductor memory device; storing the test input data in memory cells of a memory area of the semiconductor memory device; and reading out the stored test input data from the memory cells for carrying out a test in order to obtain test output data, the memory area in which the test input data are stored in the test mode being used for storing data in the normal operating mode. In addition, the invention relates to a semiconductor memory device and a system for testing a semiconductor memory device.
Owner:INFINEON TECH AG
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