2990 results about "Charged particle" patented technology

In a particle-optical projection system a pattern is imaged onto a target by means of energetic electrically charged particles. The pattern is represented in a patterned beam of said charged particles emerging from the object plane through at least one cross-over; it is imaged into an image with a given size and distortion. To compensate for the Z-deviation of the image position from the actual positioning of the target (Z denotes an axial coordinate substantially parallel to the optical axis), without changing the size of the image, the system includes a position detector for measuring the Z-position of several locations of the target, and a controller for calculating modifications of selected lens parameters of the final particle-optical lens and controlling said lens parameters according to said modifications.

An encapsulated electrophoretic medium comprises a plurality of capsules dispersed in a polymeric binder, each of the capsules comprising a capsule wall, a suspending fluid contained within the capsule wall, and a plurality of electrically charged particles suspended in the suspending fluid and capable of moving therethrough upon application of an electric field to the medium, the polymeric binder having a shear modulus of at least about 10 mPa at 20° C., and preferably over the range of 10-50° C.

An electrophoretic display comprises an electrophoretic medium having a plurality of charged particles suspended in a suspending fluid, and two electrodes disposed on opposed sides of the electrophoretic medium. At least one of the electrodes is light-transmissive and forming a viewing surface. The display has a closed optical state in which the charged particles are spread over substantially the entire viewing surface so that light cannot pass through the medium, and an open optical state in which the electrophoretic particles form chains extending between the electrodes so that light can pass through the electrophoretic medium. Insulating layers are disposed between the electrodes and the electrophoretic medium. Similarly electrophoretic displays are provided equipped with color filter arrays or reflectors.

A first electrophoretic medium comprises an electrically charged particle suspended in a suspending fluid, the particle having a polymeric shell having repeating units derived from at least one monomer the homopolymer of which is incompatible with the suspending fluid. A second, similar electrophoretic medium comprises a suspending fluid, and first and second types of electrically charged particle suspended in the suspending fluid, the two types of particle having differing optical characteristics but both having polymeric shells. The polymeric shells are arranged such that homoaggregation of the two types of particles is thermodynamically favored over heteroaggregation.

The present invention provides novel compositions, methods and apparatus for DNA sequencing that can be performed, e.g., in a two-electrode chamber. The present invention also provides a method for sequencing a nucleic acid comprising immobilizing a plurality of complexes comprising a target nucleic acid, a primer nucleic acid, and a polymerase onto a surface, contacting the surface with a plurality of charged particles comprising a nucleotide phosphate by applying an electric field, reversing the electric field to transport unbound charged particles away from the surface, and detecting the incorporation of a nucleotide phosphate into a single molecule of the primer nucleic acid.

The present invention provides a charged particle accelerator comprising a charged particle generating apparatus, a bending magnet, accelerating means and a vacuum duct, wherein first and second acceleration periods (22), (23) are provided, accelerating electric field of the accelerating means is applied from the start time (25) of the first acceleration period (22) until the end time of the second acceleration period (23), and bending magnetic field is applied at a fixed value during the first accelerating period while, during the second acceleration period, it is applied so as to increase until the end time of the second acceleration period. Accordingly, there is provided a compact and high power charged particle accelerator which can perform large-current acceleration.

A system for further enhancing speed, i.e. improving throughput in a SEM-type inspection apparatus is provided. An inspection apparatus for inspecting a surface of a substrate produces a crossover from electrons emitted from an electron beam source 25•1, then forms an image under a desired magnification in the direction of a sample W to produce a crossover. When the crossover is passed, electrons as noises are removed from the crossover with an aperture, an adjustment is made so that the crossover becomes a parallel electron beam to irradiate the substrate in a desired sectional form. The electron beam is produced such that the unevenness of illuminance is 10% or less. Electrons emitted from the sample W are detected by a detector 25•11.

An irradiation apparatus for irradiating by scanning a target volume according to a predetermined dose profile with a scanning beam of charged particles forming an irradiation spot on said target volume, said apparatus comprising:a beam generating device,a reference generator for computing, from said predetermined dose profile, through a dynamic inverse control strategy, the time evolution of commanded variables, these variables being the beam current I(t), the spot position settings x(t),y(t) and the scanning speed settings vx(t), vy(t),a monitor device having means for detecting at each time (t), the actual spot position as a measured position defined by the values xm(t),ym(t) on the target volume,characterised in that said irradiation apparatus further comprises means for determining the differences ex(t), ey(t) between the measured values xm(t), ym(t) and the spot position settings x(t) and y(t), and means for applying a correction to the scanning speed settings vx(t) and vy(t) depending on said differences ex(t), ey(t). The present invention is also related to a monitor for determining beam position in real-time.

The invention relates to a cyclotron which can produce a beam of accelerated charged particles that are intended for the irradiation of at least one target (200). The inventive cyclotron consists of a magnetic circuit which essentially comprises: an electromagnet with at least two poles (1, 1′), namely an upper pole (1) and a lower pole (1′), which are disposed symmetrically in relation to a mid-plane (110) which is perpendicular to the central axis (100) of the cyclotron and which are separated by a gap (120) containing the circulating charged particles and return flux (2) in order to close the aforementioned magnetic circuit; and a pair of main induction coils (5, 5′) which are used to create an essentially-constant main induction field in the gap between poles 1 and 1′. The invention is characterised in that it comprises means of centring the above-mentioned beam, consisting of at least one pair of bucking coils (6, 7) which are supplied by an electrical source (8) and which can modulate the intensity of the main induction field produced by the main coils (5, 5′), in order to increase the intensity of the induction field in a first area of the cyclotron and to reduce the intensity of the induction field in a second area of the cyclotron, which is diametrically opposed to the central axis (100) of the cyclotron.