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226results about How to "Improved energy resolution" patented technology

Device and method for measuring multi-wavelength characteristic X ray diffraction

InactiveCN104634799AHigh diffraction intensityEliminate attenuationMaterial analysis using radiation diffractionX-rayHigh pressure
The invention relates to a device and a method for measuring multi-wavelength characteristic X ray diffraction of an X ray diffraction spectrum of a measured crystal material sample by selecting a certain characteristic X ray of an X ray tube anode target within a relatively wide wavelength range. The device comprises an X ray tube, a high-pressure generator, a silt, an angle measurer, a detector, a multi-path analyzer, and the like. According to the device and the method disclosed by the invention, large-scale attenuation of the characteristic X ray diffraction due to use of a filter sheet or a crystal monochromator and the like is avoided; required characteristic X rays for measuring needed wavelength can be selected by regulating the tube voltage of the X ray tube and upper and lower thresholds of the multi-path analyzer, so that diffraction rays (characteristic X rays with relatively large wavelengths) on the surface of a sample can be measured in a nondestructive manner, and the diffraction rays (characteristic X rays with relatively small wavelengths) inside the sample can be measured in the nondestructive manner. Moreover, the device is simple and convenient to operate, relatively short in detection time; the characteristic X ray diffraction spectrums obtained by scanning are real and reliable.
Owner:郑琪

Apparatus and method for detection, location, and identification of gamma sources

InactiveUS20100168947A1High light yieldPrecise energy resolutionMaterial analysis by optical meansHandling using diaphragms/collimetersPhysicsElectric signal
An apparatus for detecting and determining a source azimuth for gamma radiation includes at least two scintillation crystals at angular offsets and directed toward a common plane of detection, photodetectors adjacent to each of the scintillation crystals for converting the light response of the scintillation crystals into distinct electrical signals, and a digital processing system configured to analyze spectral data from each electrical signal produced for each crystal. The digital processing system monitors a finite number of spectral windows corresponding to a selected set of radioisotopes, and uses one or more of the electrical signals to determine a signal intensity and a likely source azimuth for a detected radioisotope in the plane of detection. Another scintillation crystal directed outside of the common plane of detection may be used for three-dimensional detection. Related methods for detection and location of gamma ray sources are discussed.
Owner:SPACE MICRO A CORP OF DELAWARE

Quasi-continuous or continuous laser spinning resolving photoelectron energy spectrum analysis device

ActiveCN101038330AAchieving a comprehensive descriptionImproved energy resolutionMagnetic property measurementsLaser lightVolt
The invention discloses a quasi-continuous or continuous laser spin photoelectron spectroscopy analyzer, consists of vacuum chamber, specimen stand in the vacuum chamber for fixing and manipulating the specimen, and the electron energy analyzer and spin detector at the side of specimen stand; characterized in that still includes a laser at the laser light inlet of the vacuum chamber, the laser light sent by laser shall be injected into the vacuum chamber from its inlet and injected to the specimen on the specimen stand, the laser photon energy on the specimen is higher than 5 electron-volt; the laser light from the laser is a quasi-continuous laser or continuous laser. The advantage of the invention is improving the energy resolution, and momentum resolution, it is a high efficient, easy to operate, and low cost device for measuring the accurate electron spinning state of materials and even fully describe the electron state of materials.
Owner:INST OF PHYSICS - CHINESE ACAD OF SCI +1

Ultra high-resolution radiation detector (UHRD) and method for fabrication thereof

An ultra high-resolution radiation detector and method for fabrication thereof, has a detector chip, comprising the so-called drift rings and an amplifier integrated with the diode component, centrally located n-type anode on one surface, the depletion region. The detector chip has a circular field of view, the depletion region which also has a circular field of view by ion implanting symmetrical p-n junctions on the surface of the radiation entrance side of the detector chip, said centrally n-type anode located on the opposite surface of the depletion region, and its position is in the region which outer of the depletion region, said centrally n-type anode was surrounded by a plurality of p-type drift electrode rings, which have an gibbous circularity topology; wherein the focus of said p-type drift electrode rings is the position of the anode, said FET (Field-Effect Transistor) was integrated in the position of the detector's anode and directly coupled to the detector's anode. The p-type drift electrode rings is a plurality of drift rings which have gibbous circularity topology, wherein the gibbous circularity topology is encircled by a majority of a large circularity and a small circularity, wherein the maximum of the depletion region is the opposite surface of the region encircled by the outermost p-type drift electrode ring.
Owner:SHENZHEN SKYRAY INSTR

Gamma-ray camera system

A scintillator crystal (26) based gamma-ray camera system is described. The gamma-ray camera system includes a spectra processing component for (34) providing improved energy resolution over that seen in conventional gamma-ray camera systems. The spectra processing component operates to deconvolve detector response functions from observed energy spectra on a pixel by pixel basis. The pixel dependent to detector response functions are obtained by a combination of theoretical simulation, and empirical calibration. By deconvolving pixel specific detector response functions, variations in response of a gamma-ray camera system across its image plane can be accounted for. This offers significant improvements in energy resolution and many of the problems associated with conventional gamma-ray camera systems are reduced. For example, the improved energy resolution allows better rejection of photons associated with Compton scattering events occurring in a source being imaged. This is because a narrower energy window filter can be used without rejecting a significant fraction of non-Compton scattered photons. The spectra processing component can be easily implemented with different types of gamma-ray imagers, for example Anger-type cameras, and may also be retroactively fitted to existing gamma-ray camera systems.
Owner:SYMETRICA
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