33 results about "Pulse height analyzer" patented technology

An inspection system according to various embodiments can include a stationary mono-energetic gamma source and a detector-spectrometer. The detector-spectrometer is configured to employ a modulation of energy bin boundaries within a multi-channel pulse height analyzer to encode voxels within the inspected object, and apply an analysis to determine the three-dimensional density image of the inspected object.

A method of managing data obtained by measurements. The method permits EDS (energy dispersive spectroscopy) spectra to be collected in one operation. Energies detected by an EDS detector are converted by a pulse height analyzer into pulses of heights corresponding to the energies. The heights of the pulses in a distribution are assigned to multiple channels. The number of pulses in each channel is counted. A data processing circuit sends data blocks to a CPU. In each data block, a tag indicative of being X-ray energy data and the value of energy are combined. The CPU sequentially stores incoming data blocks into a hard disk.

A neutron detector comprises a gas-filled dielectric shell, preferably a glass balloon, having opposite electrodes. An electric field is established whereby ionizing particles may be detected via ionization and current flow in the gas, using a pulse height analyzer or other conventional means. The dielectric shell preferably has low gas permeability and a bulk resistivity in the range of 108 to 1017 Ω-m, and is preferably in the millimeter to centimeter size range. Multiple balloons may be arranged in parallel or may be individually addressable by the detector electronics.

A major object is to provide a technique of measuring the thickness of a 10 to 100 nm-thick oxide film formed on the surface of a zinc-based plated steel sheet in a quick and highly precise manner. Another major object is to evaluate the press formability of a plated steel sheet having an oxide film on the basis of the measured oxide film thickness. A method of measuring the film thickness of an oxide film formed on the surface of a zinc-based plated steel sheet is characterized by applying an electron beam accelerated to 3 to 6 kV using a scanning electron microscope having an electron probemicro-analyzer or wavelength dispersive X-ray detector and measuring the intensity of the oxygen Ka-line generated by the application through the detector and a pulse height analyzer at the succeeding stage to exclude the influence of the secondary line of the zinc L-line.

The invention belongs to the technical field of space radiation effect and strengthening, and particularly relates to an on-track monitoring device and method for space single event burnout effect. The monitoring device comprises a high-voltage direct current programmable power supply, a current-limiting protection resistor RB, a power MOSFET, a charge sensitive amplifier, a logarithmic converter and a pulse height analyzer, wherein the charge sensitive amplifier comprises a current-limiting resistor RL, a feedback resistor RF, a decoupling capacitor CD, a decoupling capacitor CF, a voltage holding capacitor CH and an operational amplifier. The monitoring method can realize the non-destructive testing of space single event burnout, provides a feasible non-destructive monitoring method for further obtaining single event burnout characteristic parameters in a simulated source condition, can comprehensively present characteristic information of single event burnout effect, and provides a reference for space radiation effect protection design.

The invention discloses an energy spectrum measuring system based on a software multichannel pulse-height analyzer. The energy spectrum measuring system comprises a radiation probe, a high-speed acquisition card and a computer, wherein the radiation probe is connected with the computer through the high-speed acquisition card, the radiation probe outputs radiation analog pulse signals to the high-speed acquisition card, the high-speed acquisition card converts the radiation analog pulse signals into radiation digital pulse signals and sends the radiation digital pulse signals to the computer, an energy spectrum acquisition control module, the software multichannel pulse-height analyzer and an energy spectrum display and analyzing module, which are realized based on software, are built in the computer, and the energy spectrum acquisition control module is connected with the high-speed acquisition card and conducts acquisition control and communication management for the high-speed acquisition card. The software multichannel pulse-height analyzer conduct smooth processing for the radiation digital pulse signals based on the three-point smoothing algorithm, analyzes the amplitude of the radiation digital pulse signals by using the five-point peak searching algorithm, and outputs analysis result data to the energy spectrum display and analyzing module for displaying and storing, thereby realizing the purpose of measuring radiation spectrum.

A X-ray fluorescence spectrometer of the present invention simultaneously generates an analytical pulse-height width profile and a narrow pulse-height width profile that are distributions of intensities of secondary X-rays (7) against scan angles (2θ) set by an interlocking unit (10) on the basis of a differential curve which is output by a multichannel pulse-height analyzer (13), as well as a predetermined analytical pulse-height width for an analytical line that is a primary reflection line and a predetermined narrow pulse-height width that is narrower than the analytical pulse-height width. Identification of the analytical lines is performed for the analytical pulse-height width profile and the narrow pulse-height width profile, and any analytical line identified only in the narrow pulse-height width profile is added to the analytical lines identified in the analytical pulse-height width profile to obtain an identification result of the analytical lines.

With a pulse-height analyzer, a reference-pulse generator generates a reference pulse of a given pulse height for a given period of time when an analog radiation pulse inputted to a comparator is higher than an initial threshold. A capacitor and a resistor receive the reference pulse, and then increase an increment threshold for the given period of time from the initial threshold to the given pulse height. Then the increment threshold is set as a reference voltage of the comparator. A pulse time width of the analog radiation pulse is determined through measuring a period of time from timing where the analog radiation pulse exceeds the initial threshold to timing where the analog radiation pulse being attenuated falls below the increment threshold.

The detecting instrument includes a detector with its DC high voltage being supplied by high voltage circuit. The detector is setup inside a shield. There is a slit on base of the shield for ray to enter into. The detector is connected to amplifying and shaping circuit composed of linear pulse amplifier and CR-RC shaping circuit. The amplifying and shaping circuit is connected to pulse height analyzer, which is connected to integrating amplifier controlled by single chip. The integrating amplifier carries out integral amplification for pulse outputted from the pulse height analyzer so as to output proportioned linear signal of voltage to implement conversion between frequency-voltage. The detecting instrument can be connected to workstation of liquid chromatography. Using different adapters of shield, the disclosed instrument can be in use for detection of thin layer chromatography or detection of high performance liquid chromatography. Features are: easy of operation, high sensitivity and resolution.

The invention discloses a device and a method for controlling the residual stress on the surface of a metal microstructure. A laser micro shot blasting generation system and a measuring feedback system are respectively connected with a control system; a pulse laser beam is focused on an area to be subjected to shot blasting on the surface of a workpiece; incident X rays emitted by a synchronous accelerating irradiation light source enter a measurement box, are diffracted by the surface of the workpiece and then are received by a detector; electric pulse is amplified by an amplifier and enters a pulse height analyzer; signal pulse is transmitted to a counter, processed by a microcomputer and fed back to a computer control system by the microcomputer for error analysis and parameter correction; and a charge Coupled device (CCD) optical camera is used for positioning and monitoring a processing area on the surface of the workpiece. The invention effectively controls the residual stress on the surface of the metal microstructure, improves the mechanical properties of the metal micro component, prolongs the service life of the metal micro component, and enables the surface of the metalmicro component to generate the residual pressure stress with the depth up to over 20mu m and the pressure ranging from -120 to -100Mpa.

The invention provides a solar X-ray detector with a wide field angle and high energy spectrum resolution. According to the detector, a sun sensor senses that the sun enters a detection field, operation timing sequences of a peak protection circuit and a pulse height analyzer are started, solar X-rays enter a silicon drifting sensor through the detection field formed by a collimator and a diaphragm, and a high-energy electron enters the collimator and deviates from the incident direction under the action of a deflection magnet; electric charge pulses of solar X-ray photons in the silicon drifting sensor are converted, shaped and amplified to form voltage pulse signals through a pre-amplifier, a pulse shaping unit and a main amplifier, amplitude analysis is carried out on the voltage pulse signals through the peak protection circuit and the pulse height analyzer, the voltage pulse signals are sent to a computer A or a computer B of an FPGA master control circuit, the computer A or the computer B of the FPGA master control circuit receives detection data from the high-energy electron and a high-energy proton heavy ion interface circuit at the same time, energy spectrum data of the solar X-rays are processed, stored and coded, and the energy spectrum data are transmitted to a satellite platform through a computer A or a computer B of a coding telemetering interface circuit and a satellite electrical interface.