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A device and method for on-orbit monitoring of space single event burnout effect

A single particle burning and monitoring device technology, which is applied in the direction of measuring devices, single semiconductor device testing, and measuring electrical variables, can solve the problems of pulse signal detection and analysis during single particle burning

Active Publication Date: 2016-02-17
LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH
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Problems solved by technology

Existing single event burnout monitoring has carried out a lot of research work mainly on the monitoring and protection of single event burnout, and has not conducted a comprehensive detection and analysis of the pulse signal when single event burnout occurs. Therefore, in order to meet the needs of the development of existing spacecraft , it is necessary to design a single particle burning monitoring method, which not only needs to realize pulse signal counting and record single particle burning times during high current, but also realizes pulse width and amplitude detection of pulse signals. For this reason, the present invention designs An on-orbit monitoring method suitable for space single event burnout effect, through logarithmic converter and pulse height analyzer, it realizes wide dynamic range measurement and pulse width and amplitude measurement of pulse signal, which can fully characterize single event burnout effect feature information

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  • A device and method for on-orbit monitoring of space single event burnout effect

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Embodiment Construction

[0015] The specific implementation of the present invention will be further described below in conjunction with the accompanying drawings and examples. The following examples are only used to illustrate the technical solutions of the present invention more clearly, but not to limit the protection scope of the present invention.

[0016] Such as figure 1 As shown, the technical solution implemented in the present invention is: an on-orbit monitoring device for space single event burnout effect, including a high-voltage DC programmable power supply, a current-limiting protection resistor R B , power MOSFET, charge sensitive amplifier, logarithmic converter, pulse height analyzer;

[0017] The charge-sensing amplifier includes a current-limiting resistor R L , Feedback resistor R F , decoupling capacitor C D , decoupling capacitor C F , voltage holding capacitor C H and operational amplifiers;

[0018] Its connection relationship is: the current limiting protection resistor...

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Abstract

The invention belongs to the technical field of space radiation effect and strengthening, and particularly relates to an on-track monitoring device and method for space single event burnout effect. The monitoring device comprises a high-voltage direct current programmable power supply, a current-limiting protection resistor RB, a power MOSFET, a charge sensitive amplifier, a logarithmic converter and a pulse height analyzer, wherein the charge sensitive amplifier comprises a current-limiting resistor RL, a feedback resistor RF, a decoupling capacitor CD, a decoupling capacitor CF, a voltage holding capacitor CH and an operational amplifier. The monitoring method can realize the non-destructive testing of space single event burnout, provides a feasible non-destructive monitoring method for further obtaining single event burnout characteristic parameters in a simulated source condition, can comprehensively present characteristic information of single event burnout effect, and provides a reference for space radiation effect protection design.

Description

technical field [0001] The invention belongs to the technical field of space radiation effect and reinforcement, and in particular relates to an on-orbit monitoring device and method for space single particle burnout effect. Background technique [0002] The single event effect caused by the interaction between a single high-energy particle in space and a microelectronic device or circuit is one of the important factors that induce on-orbit failure and abnormal operation of spacecraft. A single high-energy particle penetrates a power MOSFET device and generates a large current at a sensitive node inside the device, thereby inducing a single event burnout effect that is a catastrophic failure that will cause serious damage to the spacecraft, especially for satellites that use a large number of power MOSFET devices. The secondary power supply system will pose a fatal threat and seriously affect the long life and high reliability flight of the spacecraft in orbit. [0003] Wit...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26G01R19/00G01R29/02
Inventor 薛玉雄安恒杨生胜把得东汤道坦马亚莉柳青曹洲
Owner LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH
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