The invention discloses an intermittent seal
failure analysis method for a sealed circuit module in a high temperature environment. A circuit module and a
rare gas are encapsulated into a cavity tool, a heating storage or power
ageing experiment is performed on the encapsulated cavity tool,
water vapor detection is performed on the circuit module after the experiment, whether the circuit module has high temperature intermittent seal failure is judged,
qualitative analysis can be performed on a fact that whether the sealed circuit module has sealing failure and internal and external
gas exchange is caused, location analysis is performed on an unqualified circuit module, a shell of the circuit module with the high temperature intermittent seal failure is
cut into two parts, one part is subjected to heating storage in an
air atmosphere, the other part is not treated, a pin and an insulator on the shell of the circuit module are taken out, a part, contacted with the insulator, on the shell of the circuit module is analyzed, a specific poorly-sealed failure part is found, so as to conveniently analyze a specific reason of the failure part, and a result is fed back to a manufacturer.