The invention discloses an automatic
photoresistor testing and sorting
machine. The automatic
photoresistor testing and sorting
machine is provided with a
machine frame, a feeding mechanism and an upright conveying mechanism, wherein the feeding mechanism and the upright conveying mechanism are located on the machine frame. An annular chain is arranged on the machine frame. Clamps used for clamping photoresistors are fixed to the circumferential outer side of the annular chain in sequence. A cylinder is arranged in the position, corresponding to a
discharge port of the upright conveying mechanism, of the machine frame. The head of a
piston of the cylinder stretches out of a collision part making contact with movable chucks, the movable chucks are shifted to be opened, and thus the photoresistors are clamped. A detection control box is arranged on an advancing passageway of the annular chain. An illuminating
system and a testing
assembly are arranged in the detection control box. A fetching
assembly is arranged on the machine frame and located on the portion, behind the detection control box, of the passageway. Receiving boxes used for receiving photoresistors with different grading parameters are arranged on the outer side of a feeding cylinder. According to the automatic
photoresistor testing and sorting machine, a feeding
system with an automatic feeding function, an automatic clamping function, an automatic detecting function and an automatic sorting function is adopted, intelligent detection for photoresistor testing and grading is achieved, and the problem of manual grading is solved fundamentally.