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502 results about "Test failure" patented technology

Fault tolerance software system with periodic external self-test failure detection

ActiveUS7096388B2Simple and rapid developmentImproved failure detectionSoftware testing/debuggingClient-sideMonitoring program
Fault tolerance is improved in a computing system which includes one or more computing machines by (i) executing a control thread or other control program in conjunction with a fault tolerance software system running on at least one of the machines, and (ii) initiating via the control program a test script program which sends one or more requests to a monitored program. The test script program also processes corresponding responses to the one or more requests, and generates a return value utilizable by the control program to indicate a failure condition in the monitored program. The computing system may be configured in accordance with a client-server architecture, with the fault tolerance software system and the monitored program both running on a server of the system. The test script program is preferably implemented in an object-oriented programming language such as Java, such that one or more components of the test script program comprise a base class from which one or more other components of the test script program are generatable for use with the monitored program.
Owner:AVAYA INC

Protective device for an electrical supply facility

The present invention is directed to a protective device configured to be coupled between an AC power source and an electrical load. A ground continuity monitor is coupled to the ground conductor, the ground continuity monitor being configured to detect a ground discontinuity condition in the ground conductor. A circuit interrupter mechanism is configured to interrupt electrical continuity in a tripped state and establish electrical continuity in a reset state. A self-test circuit is coupled to the ground continuity monitor and configured to perform a simulated ground continuity test that simulates the ground discontinuity condition. The self-test circuit provides a test failure signal when the ground continuity monitor fails to provide an output signal in response to the simulated ground continuity test. The test failure signal is configured to trip the circuit interrupter mechanism.
Owner:PASS SEYMOUR

Method and system for test failure analysis prioritization for software code testing in automated test execution

A method and system for software code testing for an automated test execution environment is provided. Testing involves importing test case information into a tooling environment based on code coverage and targeted testing, the test information including test name and code coverage data including classes and methods exercised by the code; generating a test hierarchy by analyzing the individual test case information; selecting tests including one or more of: all tests for a full regression run, a subset of tests for basic quality assurance or testing a particular area of functionality, and tests that exercise a recently changed class; executing selected tests to generate a pass / fail result for each test and correlating the test results; performing test failure analysis prioritization to prioritize any failures.
Owner:IBM CORP

Analysis method for automatic test log and device

InactiveCN101556550ASolve the problem of inaccurate judgment of the type of test failure reasonSolve the problem of inaccurate judgmentHardware monitoringSoftware testing/debuggingReference testAnalysis method
The invention provides an analysis method for automatic test log and a device. The method comprises the following steps of: step S1, acquiring automatic test result as the current test log with test failure, comparing the current test log with a reference test log in a test log database and judging the reason types of test failure according to compared results; and step S2, updating the reference test log in the test log database according to the current test log which is judged to be qualified after the automatic test is executed. The method and the device can automatically recognize the test log with various reason types of test failures, solve the problem that the manual analysis for test log has inaccuracy judgment for the reason types of test failure, and lead the tester to be capable of analyzing test log pointedly.
Owner:BEIJING XINWANG RUIJIE NETWORK TECH CO LTD

Method and terminal for controlling connection reconstruction in long-term evolution system

This invention discloses a method for controlling re-setting up connections in a long-term evolution system including: a terminal tests failure of a radio link and begins initial access operation on an initial access channel in the delay time of re-set up. This invention also discloses a terminal including a unit for setting delay time of re-setting up connection used in determining delay time according to the kind of target local area searched, a test unit connected with the set unit and used in testing if the executing time of the re-set up of the terminal exceeds the confirmed time.
Owner:HUAWEI TECH CO LTD

Rock structural surface shear test method and implementation apparatus thereof

ActiveCN102735555ASolve the problem of not being damagedResolve Shear DeformationMaterial strength using steady shearing forcesFilling materialsRock sample
The invention discloses a rock structural surface shear test method and an implementation apparatus thereof. The method mainly comprises the steps that: an upper part and a lower part of a rock sample are respectively fixed in an upper opened shearing box and a lower opened shearing box with opposite opening surfaces through filling, wherein a certain distance is kept between the opening surfaces of the upper and lower shearing boxes, such that the rock sample block shear test structural surface is exposed between the opening surfaces of the upper and lower shearing boxes; a pair of shear loads with opposite directions are implemented on the upper and lower shearing boxes, and the loads act upon the rock sample block through the filling materials in the shearing boxes; the loads further act upon the rock sample block structural surface, such that the shear strength parameter of the rock sample block structural surface is obtained. According to the invention, the rock structural surface is subjected to a shear test, such that structural surface damage of the rock sample block during a moving process is effectively avoided, and test failure caused by damaged structural surface is prevented. The influence of cement upon sample block tests in prior arts is completely eliminated, and the true shear strength parameter of the rock structural surface can be obtained.
Owner:SICHUAN UNIV

Optimal test flow scheduling within automated test equipment for minimized mean time to detect failure

The present invention describes a method and system for optimizing a test flow within each ATE (Automated Test Equipment) station. The test flow includes a plurality of test blocks. A test block includes a plurality of individual tests. A computing system schedule the test flow based one or more of: a test failure model, test block duration and a yield model. The failure model determines an order or sequence of the test blocks. There are at least two failure models: independent failure model and dependant failure model. The yield model describes whether a semiconductor chip is defective or not. Upon completing the scheduling, the ATE station conducts tests according to the scheduled test flow. The present invention can also be applied to software testing.
Owner:IBM CORP

Gate oxide failure point positioning method

The invention discloses a gate oxide failure point positioning method. after removal of a metal layer, a semiconductor structure to be measured obtained after removal of the metal layer is scanned by the use of an electron beam formed by medium and high accelerating voltage so as to obtain an electron microscope with a failure point pattern; and according to the electron microscope, the position of the failure point in a gate oxide is determined so as to more precisely position a breakdown point of the gate oxide. Furthermore, success rate of gate oxide breakdown voltage test failure analysis is raised effectively; preparation time of a follow-up transmission electron microscope sample is further shortened; efficiency of gate oxide breakdown voltage test failure analysis is raised; and necessary conditions are provided for the preparation of the transmission electron microscope sample which requires precise positioning. In addition, the breakdown point of the gate oxide and failure analysis of the gate oxide can still be positioned precisely when an optical positioning machine cannot be used.
Owner:WUHAN XINXIN SEMICON MFG CO LTD
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