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Method for automatically testing machine platform

A technology for automated testing and the machine to be tested, applied in the testing field, can solve problems such as disadvantage, long log, confusion of testers, etc., and achieve the effect of easy maintenance

Inactive Publication Date: 2009-09-09
MITAC COMP (SHUN DE) LTD
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  • Abstract
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  • Claims
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AI Technical Summary

Problems solved by technology

[0002] The original test program of the Dot hill machine to be tested requires the tester to manually input complex and difficult-to-remember commands during the test to complete the test content step by step, and there are many types of machines to be tested. The test methods and test commands are basically different, which is easy to confuse the testers, and after the test is completed, the generated log is too long, which is not conducive to the testers to record the reasons for the test failure

Method used

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  • Method for automatically testing machine platform

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Embodiment Construction

[0016] Please refer to figure 1 Shown is the flow chart of the method of the present invention. The automatic testing machine method described in the present invention is mainly applicable to various models of the Dot hill system, for testing various models of the Dot hill system, and to the test procedures of the various models of the original Dot hill system Optimized integration, so that testers can easily and quickly complete the test content.

[0017] Wherein, described automated testing machine method mainly comprises the following steps:

[0018] Step 101: start;

[0019] Step 102: Scan and input the material number (hereinafter referred to as PN) and its serial number (hereinafter referred to as SN) of a machine to be tested;

[0020] Step 103: According to the PN of the machine to be tested input by scanning, it is judged which model of the Dot hill system the machine to be tested belongs to, and the corresponding items to be tested are called out according to the ...

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Abstract

The invention provides a method for automatically testing a machine platform, which is used for testing various machine types of a Dot hill system. The method mainly comprises the following steps: a, beginning testing; b, scanning a part number and a serial number input to the machine platform to be tested; c, judging the machine type according to the part number and calling out corresponding items to be tested; d, inquiring whether each item to be tested has record according to the serial number, and judging the tested items and the non-tested items of the machine platform to be tested; e, if each test item has record, ending the test, and preparing the test for a next machine platform to be tested; and f, if the current test item has no record, testing the non-tested items, judging whether the test is successful, and returning to step a till the test of all non-tested items is ended. The method is not only convenient and quick to test, but also is convenient for a tester to acquire the reason causing test failure.

Description

technical field [0001] The invention relates to a testing method, in particular to an automatic testing machine method for testing the machine. Background technique [0002] The original test program of the Dot hill machine to be tested requires the tester to manually input complex and difficult-to-remember commands during the test to complete the test content step by step, and there are many types of machines to be tested. The test methods and test commands are basically different, which is easy to confuse the testers, and after the test is completed, the generated log is too long, which is not conducive to the testers to record the reasons for the test failure. Contents of the invention [0003] In view of the above problems, the present invention provides an automatic testing machine method. [0004] In order to achieve the above object, the present invention adopts following technical scheme: a kind of automatic testing machine method, it is mainly used in testing the...

Claims

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Application Information

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IPC IPC(8): G01R31/00
Inventor 黎钦妮
Owner MITAC COMP (SHUN DE) LTD
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